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Award Data
The Award database is continually updated throughout the year. As a result, data for FY24 is not expected to be complete until March, 2025.
Download all SBIR.gov award data either with award abstracts (290MB)
or without award abstracts (65MB).
A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.
The SBIR.gov award data files now contain the required fields to calculate award timeliness for individual awards or for an agency or branch. Additional information on calculating award timeliness is available on the Data Resource Page.
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Gap-Free Model-Based Engineering for Manufacturing and Analysis: Digital Thread without Translation
SBC: Nvariate, Inc. Topic: NoneModern Model-Based Enterprise / Engineering (MBE) systems rely on freeform surfaces built as complex combinations of geometric primitives to define engineered objects. Unfortunately, the intersection of freeform surfaces in MBE applications results in highly approximated solutions, degrading models that cost billions annually by US industry to fix. Current technology limits the abilities of users ...
SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology -
Easy-to-use, Autonomous Bin-picking and Assembly Operations for the Manufacturing Industry
SBC: Robotic Materials Inc. Topic: NoneWe will develop a series of object manipulation primitives to pick up and assemble standard mechanical parts such as screws, gears and pulleys that can be configured without any programming skills. Building up on a smart robotic gripper, 3D perception and machine learning algorithms, we will design a graphical user interface for the Universal Robot E-Series that allows an user to label arbitrary 3 ...
SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology -
Advanced Manufacturing and Material Measurements Software Tool Weave ™ for the Acceleration and Automation of SEM Image Analysis in the Semiconductor Industry
SBC: Sandbox Semiconductor Incorporated Topic: NoneIn this Phase I SBIR proposal, SandBox Semiconductor™ proposes to develop an Advanced Manufacturing and Material Measurements software tool called Weave ™ for accelerating and automating SEM image analysis for the semiconductor industry. During the development of a new manufacturing process line for a semiconductor device, tens of thousands of scanning electron microscopy (SEM) images are take ...
SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology -
Predictive Modeling Tools for Metal-Based Additive Manufacturing
SBC: 3DSIM LLC Topic: 9010673R3DSIM will provide a solution to additive manufacturing’s lack of efficient, composable physics-based computational frameworks to predict quality and performance for arbitrary geometry, orientation, location and process parameter combinations. A new set of composable computational tools capable of accurately predicting the geometrical accuracy, residual stress and microstructure of the parts mad ...
SBIR Phase I 2015 Department of CommerceNational Institute of Standards and Technology -
High-Throughput Manufacturing Methods for Engineered MRI Contrast Agents
SBC: ADVANCED RESEARCH CORPORATION Topic: 9010368RThis project focuses on developing a magnetic resonance imaging (MRI) contrast agent that may increase the detection of tagged cells by a factor of 10-100. The ability to noninvasively track specifically labeled (tagged) cells, enables a researcher or medical treatment professional to dynamically monitor the delivery and targeted application of medicinal and bio-reactive agents.
SBIR Phase I 2015 Department of CommerceNational Institute of Standards and Technology -
Large-Area, High-Uniformity Photodiodes for Infrared Trap Detectors
SBC: AMETHYST RESEARCH INC Topic: 9020168Rmethyst Research Inc. will design, fabricate and test a high uniformity, large area, low noise infrared trap-detector detector for the 1- 4.5 μm wavelength range. This state of the art detector will have a large area (e.g., 1-1.8 cm diameter active area) with a spatial variability of internal quantum efficiency of less than 0.1 % between 1 μm and 4.5 μm. In addition, the internal quantum effici ...
SBIR Phase I 2015 Department of CommerceNational Institute of Standards and Technology