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Award Data

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The Award database is continually updated throughout the year. As a result, data for FY24 is not expected to be complete until March, 2025.

Download all SBIR.gov award data either with award abstracts (290MB) or without award abstracts (65MB). A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.

The SBIR.gov award data files now contain the required fields to calculate award timeliness for individual awards or for an agency or branch. Additional information on calculating award timeliness is available on the Data Resource Page.

  1. Gap-Free Model-Based Engineering for Manufacturing and Analysis: Digital Thread without Translation

    SBC: Nvariate, Inc.            Topic: None

    Modern Model-Based Enterprise / Engineering (MBE) systems rely on freeform surfaces built as complex combinations of geometric primitives to define engineered objects. Unfortunately, the intersection of freeform surfaces in MBE applications results in highly approximated solutions, degrading models that cost billions annually by US industry to fix. Current technology limits the abilities of users ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
  2. Easy-to-use, Autonomous Bin-picking and Assembly Operations for the Manufacturing Industry

    SBC: Robotic Materials Inc.            Topic: None

    We will develop a series of object manipulation primitives to pick up and assemble standard mechanical parts such as screws, gears and pulleys that can be configured without any programming skills. Building up on a smart robotic gripper, 3D perception and machine learning algorithms, we will design a graphical user interface for the Universal Robot E-Series that allows an user to label arbitrary 3 ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
  3. Advanced Manufacturing and Material Measurements Software Tool Weave ™ for the Acceleration and Automation of SEM Image Analysis in the Semiconductor Industry

    SBC: Sandbox Semiconductor Incorporated            Topic: None

    In this Phase I SBIR proposal, SandBox Semiconductor™ proposes to develop an Advanced Manufacturing and Material Measurements software tool called Weave ™ for accelerating and automating SEM image analysis for the semiconductor industry. During the development of a new manufacturing process line for a semiconductor device, tens of thousands of scanning electron microscopy (SEM) images are take ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
  4. Large-Area, High-Uniformity Photodiodes for Infrared Trap Detectors

    SBC: AMETHYST RESEARCH INC            Topic: 9020168R

    methyst Research Inc. will design, fabricate and test a high uniformity, large area, low noise infrared trap-detector detector for the 1- 4.5 μm wavelength range. This state of the art detector will have a large area (e.g., 1-1.8 cm diameter active area) with a spatial variability of internal quantum efficiency of less than 0.1 % between 1 μm and 4.5 μm. In addition, the internal quantum effici ...

    SBIR Phase I 2015 Department of CommerceNational Institute of Standards and Technology
  5. Programmable Fingerprint Emulator

    SBC: PHT AEROSPACE LLC            Topic: N/A

    This proposal is for the development of a technology apparatus which can dynamically synthesize a mechanical fingerprint pattern, from an electronic image or from a computer-generated artificial pattern, onto a 2-dimensional pliable surface whose surface height is modulated by protrusions in the z-axis direction. When mechanically applied to a fingerprint sensor-under-test, the synthesized modulat ...

    SBIR Phase I 2009 Department of CommerceNational Institute of Standards and Technology
  6. V-PSL and VISI_PSL: A Visual Language and Interactive Tool for PSL Generation

    SBC: Computer Aided Process Improvement, Inc.            Topic: N/A

    We propose developing a prototype of a GUI-based wizard that: ¿ Guides users through the steps that are needed to define their processes using PSL in a visual/textual manner. ¿ Checks for consistency/correctness according to PSL ontology. ¿ Generates the PSL description. We believe that VISI-PSL will facilitate the generation of PSL descriptions to the extent that it will be used by process ...

    SBIR Phase I 2003 Department of CommerceNational Institute of Standards and Technology
  7. Liquid Phase Epitaxial Garnet Films for Magneto-Optic Indicators

    SBC: Integrated Photonics, Inc.            Topic: N/A

    Magnetooptic Indicator (MOI) garnet films are an important non-destructive tool for imaging magnetic domains in a wide variety of applications from basic research to quality control. To be effectively used they must be 1) optimized for individual applications using interactive feedback from users, 2) standardized to allow comparison of data, 3) improved in quality and process control and 4) made g ...

    SBIR Phase I 2003 Department of CommerceNational Institute of Standards and Technology
  8. Development of UltrastableTi:sapphire Lasers for Optical Clock and Spectroscopy Applications

    SBC: Kapteyn-Murnane Laboratories, Inc.            Topic: N/A

    This Small Business Innovation Research Phase 1 project proposes to develop a femtosecond laser system optimized for optical clocks and other precision metrology applications. In principle, atomic optical transitions have the potential to provide radically higher-accuracy timekeeping, because of the very high frequency of an optical transition. The problem of counting, or down-counting, the oscill ...

    SBIR Phase I 2003 Department of CommerceNational Institute of Standards and Technology
  9. PSL-based Process Knowledge Integration and Management Framework

    SBC: KNOWLEDGE BASED SYSTEMS INC            Topic: N/A

    We propose to develop a robust framework, called the Process Knowledge Integration and Management Framework (PKIMF), to support the complete lifecycle of enterprise process knowledge that natively use the Process Specification Language (PSL). PKIMF uses a dashboard approach to design, analyze, integrate, exchange, and manage process knowledge. Its features and capabilities include the use of a pro ...

    SBIR Phase I 2003 Department of CommerceNational Institute of Standards and Technology
  10. High Sensitivity Directional Hand Held Portable Microelectronics Neutron Detector

    SBC: STRUCTURED MATERIALS INDUSTRIES, INC.            Topic: N/A

    The United States faces a broad range of nuclear threats and technologies are needed to prevent or mitigate nuclear incidents. SMI has invented (patent pending) a near 100 volume percent efficient, real-time, microelectronic self calibrating and directional radiation detector. We can increase detector area to increase broad sensitivity and the number of layers to increase directionality. We herein ...

    SBIR Phase I 2003 Department of CommerceNational Institute of Standards and Technology
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