You are here
Award Data
The Award database is continually updated throughout the year. As a result, data for FY24 is not expected to be complete until March, 2025.
Download all SBIR.gov award data either with award abstracts (290MB)
or without award abstracts (65MB).
A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.
The SBIR.gov award data files now contain the required fields to calculate award timeliness for individual awards or for an agency or branch. Additional information on calculating award timeliness is available on the Data Resource Page.
-
Gap-Free Model-Based Engineering for Manufacturing and Analysis: Digital Thread without Translation
SBC: Nvariate, Inc. Topic: NoneModern Model-Based Enterprise / Engineering (MBE) systems rely on freeform surfaces built as complex combinations of geometric primitives to define engineered objects. Unfortunately, the intersection of freeform surfaces in MBE applications results in highly approximated solutions, degrading models that cost billions annually by US industry to fix. Current technology limits the abilities of users ...
SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology -
Easy-to-use, Autonomous Bin-picking and Assembly Operations for the Manufacturing Industry
SBC: Robotic Materials Inc. Topic: NoneWe will develop a series of object manipulation primitives to pick up and assemble standard mechanical parts such as screws, gears and pulleys that can be configured without any programming skills. Building up on a smart robotic gripper, 3D perception and machine learning algorithms, we will design a graphical user interface for the Universal Robot E-Series that allows an user to label arbitrary 3 ...
SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology -
Advanced Manufacturing and Material Measurements Software Tool Weave ™ for the Acceleration and Automation of SEM Image Analysis in the Semiconductor Industry
SBC: Sandbox Semiconductor Incorporated Topic: NoneIn this Phase I SBIR proposal, SandBox Semiconductor™ proposes to develop an Advanced Manufacturing and Material Measurements software tool called Weave ™ for accelerating and automating SEM image analysis for the semiconductor industry. During the development of a new manufacturing process line for a semiconductor device, tens of thousands of scanning electron microscopy (SEM) images are take ...
SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology -
Multimode Chiroptical Spectrometer for Nanoparticle Characterization
SBC: APPLIED NANOFLUORESCENCE, LLC Topic: NAThis project will develop a new scientific instrument optimized for the advanced characterization of near-infrared fluorescent nanoparticles that can exist as left- or right-handed structures (enantiomers). Single-walled carbon nanotubes (SWCNTs) are currently the leading example of such nanomaterials. Applied NanoFluorescence, LLC (ANF) proposes a novel multi-mode chiroptical spectrometer that ca ...
SBIR Phase I 2018 Department of CommerceNational Institute of Standards and Technology -
Leveraging Cyber Security Framework to Identify the SP 800 53 Security and Privacy Controls for Cloud‐based Information Systems
SBC: INFOBEYOND TECHNOLOGY LLC Topic: NANIST developed information system risk management and guidelines that assist agencies in implementing integrated, organization‐wide programs to manage information security risk, and further developed Cloud Security Assessment Tool (CSAT) to facilitate in this matter. However, NIST’s CSAT needs further improvement and implementation of new functions such that it can be commercialized as an ente ...
SBIR Phase I 2018 Department of CommerceNational Institute of Standards and Technology -
Large-Area, High-Uniformity Photodiodes for Infrared Trap Detectors
SBC: AMETHYST RESEARCH INC Topic: 9020168Rmethyst Research Inc. will design, fabricate and test a high uniformity, large area, low noise infrared trap-detector detector for the 1- 4.5 μm wavelength range. This state of the art detector will have a large area (e.g., 1-1.8 cm diameter active area) with a spatial variability of internal quantum efficiency of less than 0.1 % between 1 μm and 4.5 μm. In addition, the internal quantum effici ...
SBIR Phase I 2015 Department of CommerceNational Institute of Standards and Technology -
ACPT: A User-friendly, Efficient, Reliable, and Generic Access Control Policy Modeling, Verification, and Testing Tool
SBC: INFOBEYOND TECHNOLOGY LLC Topic: 9030277RInfoBeyond Technology advocates the development of a user-friendly, efficient, reliable, and generic Access Control Policy modeling, verification, and Testing (ACPT) Tool. InfoBeyond Technology’s ACPT enhances NIST’s ACPT design and adds several advanced features for achieving high security confidence AC levels such that it can be commercialized. It provides user-friendly GUI templates for use ...
SBIR Phase I 2015 Department of CommerceNational Institute of Standards and Technology