Award Data

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The Award database is continually updated throughout the year. As a result, data for FY19 is not expected to be complete until June, 2020.

  1. Advanced Manufacturing and Material Measurements Software Tool Weave ™ for the Acceleration and Automation of SEM Image Analysis in the Semiconductor Industry

    SBC: Sandbox Semiconductor Incorporated            Topic: None

    In this Phase I SBIR proposal, SandBox Semiconductor™ proposes to develop an Advanced Manufacturing and Material Measurements software tool called Weave ™ for accelerating and automating SEM image analysis for the semiconductor industry. During the development of a new manufacturing process line for a semiconductor device, tens of thousands of scanning electron microscopy (SEM) images are take ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
  2. Gap-Free Model-Based Engineering for Manufacturing and Analysis: Digital Thread without Translation

    SBC: Nvariate, Inc.            Topic: None

    Modern Model-Based Enterprise / Engineering (MBE) systems rely on freeform surfaces built as complex combinations of geometric primitives to define engineered objects. Unfortunately, the intersection of freeform surfaces in MBE applications results in highly approximated solutions, degrading models that cost billions annually by US industry to fix. Current technology limits the abilities of users ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
  3. Large-Area, High-Uniformity Photodiodes for Infrared Trap Detectors

    SBC: Amethyst Research Incorporated            Topic: 9020168R

    methyst Research Inc. will design, fabricate and test a high uniformity, large area, low noise infrared trap-detector detector for the 1- 4.5 μm wavelength range. This state of the art detector will have a large area (e.g., 1-1.8 cm diameter active area) with a spatial variability of internal quantum efficiency of less than 0.1 % between 1 μm and 4.5 μm. In addition, the internal quantum effici ...

    SBIR Phase I 2015 Department of CommerceNational Institute of Standards and Technology
  4. V-PSL and VISI_PSL: A Visual Language and Interactive Tool for PSL Generation

    SBC: Computer Aided Process Improvement, Inc.            Topic: N/A

    We propose developing a prototype of a GUI-based wizard that: ¿ Guides users through the steps that are needed to define their processes using PSL in a visual/textual manner. ¿ Checks for consistency/correctness according to PSL ontology. ¿ Generates the PSL description. We believe that VISI-PSL will facilitate the generation of PSL descriptions to the extent that it will be used by process ...

    SBIR Phase I 2003 Department of CommerceNational Institute of Standards and Technology
  5. Liquid Phase Epitaxial Garnet Films for Magneto-Optic Indicators

    SBC: Integrated Photonics, Inc.            Topic: N/A

    Magnetooptic Indicator (MOI) garnet films are an important non-destructive tool for imaging magnetic domains in a wide variety of applications from basic research to quality control. To be effectively used they must be 1) optimized for individual applications using interactive feedback from users, 2) standardized to allow comparison of data, 3) improved in quality and process control and 4) made g ...

    SBIR Phase I 2003 Department of CommerceNational Institute of Standards and Technology
  6. PSL-based Process Knowledge Integration and Management Framework

    SBC: KNOWLEDGE BASED SYSTEMS, INC.            Topic: N/A

    We propose to develop a robust framework, called the Process Knowledge Integration and Management Framework (PKIMF), to support the complete lifecycle of enterprise process knowledge that natively use the Process Specification Language (PSL). PKIMF uses a dashboard approach to design, analyze, integrate, exchange, and manage process knowledge. Its features and capabilities include the use of a pro ...

    SBIR Phase I 2003 Department of CommerceNational Institute of Standards and Technology
  7. High Sensitivity Directional Hand Held Portable Microelectronics Neutron Detector

    SBC: STRUCTURED MATERIALS INDUSTRIES, INC.            Topic: N/A

    The United States faces a broad range of nuclear threats and technologies are needed to prevent or mitigate nuclear incidents. SMI has invented (patent pending) a near 100 volume percent efficient, real-time, microelectronic self calibrating and directional radiation detector. We can increase detector area to increase broad sensitivity and the number of layers to increase directionality. We herein ...

    SBIR Phase I 2003 Department of CommerceNational Institute of Standards and Technology
  8. Development of Multifunctional Open-system Sensor Integration Tool (MOSIT)

    SBC: WILLIAMSRDM, INC.            Topic: N/A

    Williams-Pyro, Inc. proposes to model and develop software to provide an interface allowing a common method of incorporating sensing components within different systems. The proposed software package, called the Multifunctional Open-system Sensor Integration Tool (MOSIT), will provide the circuit designer with a complete sensor interface solution. MOSIT will provide not only the Network Capable Ap ...

    SBIR Phase I 2003 Department of CommerceNational Institute of Standards and Technology
  9. Automated Reconfiguable Intelligent Radio (ARIR)

    SBC: WILLIAMSRDM, INC.            Topic: N/A

    Williams-Pyro, Inc. proposes to develop an Automated Reconfigurable Intelligent Radio (ARIR), which consists of a series of distributed nodes that will relay voice and data to Intelligent Access Points (IAP) located within the building. This system will allow faster, more accurate information transmission, resulting in timely fire detection and safer firefighting. The main goal of ARIR is to ident ...

    SBIR Phase I 2003 Department of CommerceNational Institute of Standards and Technology
  10. Dual-Probe CD-AFM Calibration

    SBC: XIDEX CORPORATION            Topic: N/A

    Xidex proposes to demonstrate the feasibility of calibrating a critical-dimension atomic force microscope (CD-AFM) without the use of a reference artifact in such a way that high-precision critical dimensions can be generated independently of changes in probe tip shape (including the effects of tip wear), presence of the surface force uncertainties, and the stage uncertainties. The proposed calibr ...

    SBIR Phase I 2003 Department of CommerceNational Institute of Standards and Technology
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