Award Data

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The Award database is continually updated throughout the year. As a result, data for FY19 is not expected to be complete until June, 2020.

  1. Multimode Chiroptical Spectrometer for Nanoparticle Characterization

    SBC: Applied Nanofluorescence LLC            Topic: None

    This project will develop a new scientific instrument optimized for the advanced characterization of near-infrared fluorescent nanoparticles that can exist as left- or right-handed structures (enantiomers). Single-walled carbon nanotubes (SWCNTs) are the leading current example of such nanomaterials. Applied NanoFluorescence, LLC (ANF) proposes a novel multi-mode chiroptical spectrometer that can ...

    SBIR Phase II 2019 Department of CommerceNational Institute of Standards and Technology
  2. Advanced Manufacturing and Material Measurements Software Tool Weave ™ for the Acceleration and Automation of SEM Image Analysis in the Semiconductor Industry

    SBC: Sandbox Semiconductor Incorporated            Topic: None

    In this Phase I SBIR proposal, SandBox Semiconductor™ proposes to develop an Advanced Manufacturing and Material Measurements software tool called Weave ™ for accelerating and automating SEM image analysis for the semiconductor industry. During the development of a new manufacturing process line for a semiconductor device, tens of thousands of scanning electron microscopy (SEM) images are take ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
  3. Nanomachine Device for Semiconductor Process Control Monitoring

    SBC: Xallent LLC            Topic: None

    Conventional characterization and test methods are increasingly ineffective when applied to structures less than 100 nanometers, causing challenges across R&D, process control and failure analysis. An increasing number of subtle defects become prominent drivers of failure as device size and operating margins decrease, e.g., processing anomalies in thin gate oxides, substrate problems related to do ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
  4. Gap-Free Model-Based Engineering for Manufacturing and Analysis: Digital Thread without Translation

    SBC: Nvariate, Inc.            Topic: None

    Modern Model-Based Enterprise / Engineering (MBE) systems rely on freeform surfaces built as complex combinations of geometric primitives to define engineered objects. Unfortunately, the intersection of freeform surfaces in MBE applications results in highly approximated solutions, degrading models that cost billions annually by US industry to fix. Current technology limits the abilities of users ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
  5. Direct Performance Evaluation of Additive Manufacturing Process Plans

    SBC: INTACT SOLUTIONS INC.            Topic: None

    Additive manufacturing is steadily advancing towards fulfilling its promise of customized and on-demand production of functional parts. However, performance of as-manufactured parts can differ significantly from the as-designed parts because the as-manufactured geometry differs from the as-designed geometry and the asmanufactured material properties are not known. Attempts to predict performance o ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
  6. A Tool for Building Semantically Interoperable Specification and Standards

    SBC: XSB INC.            Topic: 9010273R

    Standards and specifications are widely used in government and industry to define requirements for products and processes and insure interoperability, safety, and quality of industrial and domestic products. Specifications and standards documents almost always cross-reference other standards and specification. Taken together, the web of interdependent standards forms an immensely important knowled ...

    SBIR Phase I 2015 Department of CommerceNational Institute of Standards and Technology
  7. Large-Area, High-Uniformity Photodiodes for Infrared Trap Detectors

    SBC: AMETHYST RESEARCH INCORPORATED            Topic: 9020168R

    methyst Research Inc. will design, fabricate and test a high uniformity, large area, low noise infrared trap-detector detector for the 1- 4.5 μm wavelength range. This state of the art detector will have a large area (e.g., 1-1.8 cm diameter active area) with a spatial variability of internal quantum efficiency of less than 0.1 % between 1 μm and 4.5 μm. In addition, the internal quantum effici ...

    SBIR Phase I 2015 Department of CommerceNational Institute of Standards and Technology
  8. Secure Email Agent Using the Domain Name System (DNS) as a Trust Infrastructure

    SBC: GRIER FORENSICS, LLC            Topic: 9020377R

    Although protocols for securing email have been available for over twenty years, these protocols, by nature of their use of asymmetric cryptography, require users to have the public key or certificate of the correspondents. Grier Forensics will develop technology to use the Domain Name System (DNS) to distribute certificates and keys, making email secure, authenticated, and confidential, curbing t ...

    SBIR Phase II 2015 Department of CommerceNational Institute of Standards and Technology
  9. Active Mixing of Polymers in a Dispensing Head

    SBC: nScrypt, Inc.            Topic: N/A

    A method to take three polymers with varying viscosities and mixing those polymers together at the point of interest or more specifically through a micro dispensing nozzle, is being proposed. An active mixing scheme to ensure proper mixing at the pen tip is a feasible approach to this problem. The materials being mixed will not only range in viscosity but also in particle loading, which will be ha ...

    SBIR Phase I 2005 Department of CommerceNational Institute of Standards and Technology
  10. Ultra-High Vacuum Compatible Wavelength Dispersive X-ray Spectrometer

    SBC: PARALLAX RESEARCH INC            Topic: N/A

    Parallax Research, Inc. proposes to build an Ultra-High Vacuum compatible Wavelength Dispersive X-ray Spectrometer (WDS) that can be used on small spot Auger, XPS, TEM and FESEM analytical instruments for elemental analysis. The effort draws upon Parallax's experience in designing WDS systems for Scanning Electron Microscopes (SEM) and for XRF. This new type of x-ray spectrometer will eliminate th ...

    SBIR Phase II 2005 Department of CommerceNational Institute of Standards and Technology
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