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Award Data
The Award database is continually updated throughout the year. As a result, data for FY24 is not expected to be complete until March, 2025.
Download all SBIR.gov award data either with award abstracts (290MB)
or without award abstracts (65MB).
A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.
The SBIR.gov award data files now contain the required fields to calculate award timeliness for individual awards or for an agency or branch. Additional information on calculating award timeliness is available on the Data Resource Page.
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Multimode Chiroptical Spectrometer for Nanoparticle Characterization
SBC: APPLIED NANOFLUORESCENCE, LLC Topic: NoneThis project will develop a new scientific instrument optimized for the advanced characterization of near-infrared fluorescent nanoparticles that can exist as left- or right-handed structures (enantiomers). Single-walled carbon nanotubes (SWCNTs) are the leading current example of such nanomaterials. Applied NanoFluorescence, LLC (ANF) proposes a novel multi-mode chiroptical spectrometer that can ...
SBIR Phase II 2019 Department of CommerceNational Institute of Standards and Technology -
Gap-Free Model-Based Engineering for Manufacturing and Analysis: Digital Thread without Translation
SBC: Nvariate, Inc. Topic: NoneModern Model-Based Enterprise / Engineering (MBE) systems rely on freeform surfaces built as complex combinations of geometric primitives to define engineered objects. Unfortunately, the intersection of freeform surfaces in MBE applications results in highly approximated solutions, degrading models that cost billions annually by US industry to fix. Current technology limits the abilities of users ...
SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology -
Advanced Manufacturing and Material Measurements Software Tool Weave ™ for the Acceleration and Automation of SEM Image Analysis in the Semiconductor Industry
SBC: Sandbox Semiconductor Incorporated Topic: NoneIn this Phase I SBIR proposal, SandBox Semiconductor™ proposes to develop an Advanced Manufacturing and Material Measurements software tool called Weave ™ for accelerating and automating SEM image analysis for the semiconductor industry. During the development of a new manufacturing process line for a semiconductor device, tens of thousands of scanning electron microscopy (SEM) images are take ...
SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology -
Secure Email Agent Using the Domain Name System (DNS) as a Trust Infrastructure
SBC: Grier Forensics, LLC Topic: 9020377RAlthough protocols for securing email have been available for over twenty years, these protocols, by nature of their use of asymmetric cryptography, require users to have the public key or certificate of the correspondents. Grier Forensics will develop technology to use the Domain Name System (DNS) to distribute certificates and keys, making email secure, authenticated, and confidential, curbing t ...
SBIR Phase II 2015 Department of CommerceNational Institute of Standards and Technology -
Large-Area, High-Uniformity Photodiodes for Infrared Trap Detectors
SBC: AMETHYST RESEARCH INC Topic: 9020168Rmethyst Research Inc. will design, fabricate and test a high uniformity, large area, low noise infrared trap-detector detector for the 1- 4.5 μm wavelength range. This state of the art detector will have a large area (e.g., 1-1.8 cm diameter active area) with a spatial variability of internal quantum efficiency of less than 0.1 % between 1 μm and 4.5 μm. In addition, the internal quantum effici ...
SBIR Phase I 2015 Department of CommerceNational Institute of Standards and Technology -
V-PSL and VISI_PSL: A Visual Language and Interactive Tool for PSL Generation
SBC: Computer Aided Process Improvement, Inc. Topic: N/AWe propose developing a prototype of a GUI-based wizard that: ¿ Guides users through the steps that are needed to define their processes using PSL in a visual/textual manner. ¿ Checks for consistency/correctness according to PSL ontology. ¿ Generates the PSL description. We believe that VISI-PSL will facilitate the generation of PSL descriptions to the extent that it will be used by process ...
SBIR Phase I 2003 Department of CommerceNational Institute of Standards and Technology -
Liquid Phase Epitaxial Garnet Films for Magneto-Optic Indicators
SBC: Integrated Photonics, Inc. Topic: N/AMagnetooptic Indicator (MOI) garnet films are an important non-destructive tool for imaging magnetic domains in a wide variety of applications from basic research to quality control. To be effectively used they must be 1) optimized for individual applications using interactive feedback from users, 2) standardized to allow comparison of data, 3) improved in quality and process control and 4) made g ...
SBIR Phase I 2003 Department of CommerceNational Institute of Standards and Technology -
Advanced Tools for Process Specification Language
SBC: KNOWLEDGE BASED SYSTEMS INC Topic: N/AThis project will (i) extend and harden the PSL Editor and the Ontology-Driven XSLT Generator (ODXG) tools and (ii) extend the process description syntax (PDS) derived from the PSL for both KIF and XML/RDF formats. In addition, we will extend the PSL metatheoretical framework to support the PDS and the PSL tools by providing PSL extensions to support calendars and activity specialization, and by d ...
SBIR Phase II 2003 Department of CommerceNational Institute of Standards and Technology -
PSL-based Process Knowledge Integration and Management Framework
SBC: KNOWLEDGE BASED SYSTEMS INC Topic: N/AWe propose to develop a robust framework, called the Process Knowledge Integration and Management Framework (PKIMF), to support the complete lifecycle of enterprise process knowledge that natively use the Process Specification Language (PSL). PKIMF uses a dashboard approach to design, analyze, integrate, exchange, and manage process knowledge. Its features and capabilities include the use of a pro ...
SBIR Phase I 2003 Department of CommerceNational Institute of Standards and Technology -
High Sensitivity Directional Hand Held Portable Microelectronics Neutron Detector
SBC: STRUCTURED MATERIALS INDUSTRIES, INC. Topic: N/AThe United States faces a broad range of nuclear threats and technologies are needed to prevent or mitigate nuclear incidents. SMI has invented (patent pending) a near 100 volume percent efficient, real-time, microelectronic self calibrating and directional radiation detector. We can increase detector area to increase broad sensitivity and the number of layers to increase directionality. We herein ...
SBIR Phase I 2003 Department of CommerceNational Institute of Standards and Technology