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Award Data
The Award database is continually updated throughout the year. As a result, data for FY24 is not expected to be complete until March, 2025.
Download all SBIR.gov award data either with award abstracts (290MB)
or without award abstracts (65MB).
A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.
The SBIR.gov award data files now contain the required fields to calculate award timeliness for individual awards or for an agency or branch. Additional information on calculating award timeliness is available on the Data Resource Page.
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Gap-Free Model-Based Engineering for Manufacturing and Analysis: Digital Thread without Translation
SBC: Nvariate, Inc. Topic: NoneModern Model-Based Enterprise / Engineering (MBE) systems rely on freeform surfaces built as complex combinations of geometric primitives to define engineered objects. Unfortunately, the intersection of freeform surfaces in MBE applications results in highly approximated solutions, degrading models that cost billions annually by US industry to fix. Current technology limits the abilities of users ...
SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology -
Advanced Manufacturing and Material Measurements Software Tool Weave ™ for the Acceleration and Automation of SEM Image Analysis in the Semiconductor Industry
SBC: Sandbox Semiconductor Incorporated Topic: NoneIn this Phase I SBIR proposal, SandBox Semiconductor™ proposes to develop an Advanced Manufacturing and Material Measurements software tool called Weave ™ for accelerating and automating SEM image analysis for the semiconductor industry. During the development of a new manufacturing process line for a semiconductor device, tens of thousands of scanning electron microscopy (SEM) images are take ...
SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology -
Nanomachine Device for Semiconductor Process Control Monitoring
SBC: XALLENT INC. Topic: NoneConventional characterization and test methods are increasingly ineffective when applied to structures less than 100 nanometers, causing challenges across R&D, process control and failure analysis. An increasing number of subtle defects become prominent drivers of failure as device size and operating margins decrease, e.g., processing anomalies in thin gate oxides, substrate problems related to do ...
SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology -
Multimode Chiroptical Spectrometer for Nanoparticle Characterization
SBC: APPLIED NANOFLUORESCENCE, LLC Topic: NoneThis project will develop a new scientific instrument optimized for the advanced characterization of near-infrared fluorescent nanoparticles that can exist as left- or right-handed structures (enantiomers). Single-walled carbon nanotubes (SWCNTs) are the leading current example of such nanomaterials. Applied NanoFluorescence, LLC (ANF) proposes a novel multi-mode chiroptical spectrometer that can ...
SBIR Phase II 2019 Department of CommerceNational Institute of Standards and Technology -
Large-Area, High-Uniformity Photodiodes for Infrared Trap Detectors
SBC: AMETHYST RESEARCH INC Topic: 9020168Rmethyst Research Inc. will design, fabricate and test a high uniformity, large area, low noise infrared trap-detector detector for the 1- 4.5 μm wavelength range. This state of the art detector will have a large area (e.g., 1-1.8 cm diameter active area) with a spatial variability of internal quantum efficiency of less than 0.1 % between 1 μm and 4.5 μm. In addition, the internal quantum effici ...
SBIR Phase I 2015 Department of CommerceNational Institute of Standards and Technology -
A Tool for Building Semantically Interoperable Specification and Standards
SBC: XSB INC Topic: 9010273RStandards and specifications are widely used in government and industry to define requirements for products and processes and insure interoperability, safety, and quality of industrial and domestic products. Specifications and standards documents almost always cross-reference other standards and specification. Taken together, the web of interdependent standards forms an immensely important knowled ...
SBIR Phase I 2015 Department of CommerceNational Institute of Standards and Technology -
Cognitive Residential Heat Pumps Fault Detection and Diagnostic Datalogger
SBC: MANAGEMENT SCIENCES INC Topic: 9010173RDuring Phase I, Management Sciences, Inc. (MSI) proved feasibility of adapting their current technology into a product capable of improving performance resulting in increased efficiency and extended life cycles of heat pumps. The resultant product is a tool named the Heat Pump Sentient (HP-Sentient). The HP-Sentient will improve performance and reduce maintenance costs through aggressive goal-seek ...
SBIR Phase II 2015 Department of CommerceNational Institute of Standards and Technology -
Secure Email Agent Using the Domain Name System (DNS) as a Trust Infrastructure
SBC: Grier Forensics, LLC Topic: 9020377RAlthough protocols for securing email have been available for over twenty years, these protocols, by nature of their use of asymmetric cryptography, require users to have the public key or certificate of the correspondents. Grier Forensics will develop technology to use the Domain Name System (DNS) to distribute certificates and keys, making email secure, authenticated, and confidential, curbing t ...
SBIR Phase II 2015 Department of CommerceNational Institute of Standards and Technology -
Fulcrum Biometrics' Plan for Research and Development of WS-BD Conformant Handheld Fingerprint Sensor
SBC: Fulcrum Biometrics, LLC Topic: N/ATrusted biometric validation of individual identities has never been more important. Several contributing factors are the increase in global terrorism, identity theft and the increase in legislation which are driving the accelerated adoption of biometric technology. Unfortunately, the biometrics industry has not actively responded to the changing market conditions being driven by the explosion in ...
SBIR Phase I 2012 Department of CommerceNational Institute of Standards and Technology -
Improved Microcalorimeter Detectors for X-Ray Chemical Shift Mapping
SBC: STAR CRYOELECTRONICS, LLC Topic: N/AX-ray fluorescence spectroscopy is a widely used and extremely sensitive analytical technique for qualitative as well as quantitative chemical analysis. Superconducting Transition Edge Sensor (TES) microcalorimeter detectors have now been developed that achieve an energy resolution of 2 eV (full width at half maximum) for 1.5 keV X-rays, which is sufficient to enable the measurement of the small s ...
SBIR Phase I 2012 Department of CommerceNational Institute of Standards and Technology