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Award Data
The Award database is continually updated throughout the year. As a result, data for FY24 is not expected to be complete until March, 2025.
Download all SBIR.gov award data either with award abstracts (290MB)
or without award abstracts (65MB).
A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.
The SBIR.gov award data files now contain the required fields to calculate award timeliness for individual awards or for an agency or branch. Additional information on calculating award timeliness is available on the Data Resource Page.
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Advanced Manufacturing and Material Measurements Software Tool Weave ™ for the Acceleration and Automation of SEM Image Analysis in the Semiconductor Industry
SBC: Sandbox Semiconductor Incorporated Topic: NoneIn this Phase I SBIR proposal, SandBox Semiconductor™ proposes to develop an Advanced Manufacturing and Material Measurements software tool called Weave ™ for accelerating and automating SEM image analysis for the semiconductor industry. During the development of a new manufacturing process line for a semiconductor device, tens of thousands of scanning electron microscopy (SEM) images are take ...
SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology -
Development of a Laboratory Scale CD-SAXS Device for Semiconductor Metrology Applications
SBC: Jordan Valley Semiconductors, Inc. Topic: N/AA semiconductor metrology tool will be developed employing the technique of small-angle x-ray scattering (SAXS) to measure the critical dimension (CD) of patterned device structures. The feasibility of the SAXS technique to measure CD has been shown using high-power synchrotron radiation facilities which are not of practical use to the semiconductor industry. The ultimate project goal is to produc ...
SBIR Phase I 2004 Department of CommerceNational Institute of Standards and Technology -
Dual-Probe CD-AFM Calibration
SBC: XIDEX CORPORATION Topic: N/AXidex proposes to demonstrate the feasibility of calibrating a critical-dimension atomic force microscope (CD-AFM) without the use of a reference artifact in such a way that high-precision critical dimensions can be generated independently of changes in probe tip shape. We plan to demonstrate sub-nanometer repeatability for tip-to-tip calibration, and demonstrate single-point critical-dimension me ...
SBIR Phase II 2004 Department of CommerceNational Institute of Standards and Technology -
Gap-Free Model-Based Engineering for Manufacturing and Analysis: Digital Thread without Translation
SBC: Nvariate, Inc. Topic: NoneModern Model-Based Enterprise / Engineering (MBE) systems rely on freeform surfaces built as complex combinations of geometric primitives to define engineered objects. Unfortunately, the intersection of freeform surfaces in MBE applications results in highly approximated solutions, degrading models that cost billions annually by US industry to fix. Current technology limits the abilities of users ...
SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology -
Large-Area, High-Uniformity Photodiodes for Infrared Trap Detectors
SBC: AMETHYST RESEARCH INC Topic: 9020168Rmethyst Research Inc. will design, fabricate and test a high uniformity, large area, low noise infrared trap-detector detector for the 1- 4.5 μm wavelength range. This state of the art detector will have a large area (e.g., 1-1.8 cm diameter active area) with a spatial variability of internal quantum efficiency of less than 0.1 % between 1 μm and 4.5 μm. In addition, the internal quantum effici ...
SBIR Phase I 2015 Department of CommerceNational Institute of Standards and Technology -
Microcapillary Quartz Sensors for Screening Injectability of High Concentration Protein Formulations
SBC: QATCH TECHNOLOGIES LLC Topic: NoneThe objective of this SBIR Phase I proposal is to determine the feasibility of viscosity characterization of high concentration protein formulations (HCF) by QATCH’s microcapillary quartz technology. HCFs are non-Newtonian fluids with shear-thinning behavior and they are administered to patients by subcutaneous or muscular injections. The injectability of HCFs depends on the viscosity at high-sh ...
SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology -
Microresonator-based High-performance High-pressure Sensor
SBC: Nomadics, Inc. Topic: N/AIn this Phase I SBIR, Nomadics will build on our past experience with micro-structure resonators and quartz-based sensors to develop a pressure sensor suitable for high pressure applications such as oil and gas industry applications. In the Phase I work, the outstanding measurement resolution of our sensing technology will be demonstrated and the feasibility of this technology for pressure sensing ...
SBIR Phase I 2004 Department of CommerceNational Institute of Standards and Technology -
Multimode Chiroptical Spectrometer for Nanoparticle Characterization
SBC: APPLIED NANOFLUORESCENCE, LLC Topic: NoneThis project will develop a new scientific instrument optimized for the advanced characterization of near-infrared fluorescent nanoparticles that can exist as left- or right-handed structures (enantiomers). Single-walled carbon nanotubes (SWCNTs) are the leading current example of such nanomaterials. Applied NanoFluorescence, LLC (ANF) proposes a novel multi-mode chiroptical spectrometer that can ...
SBIR Phase II 2019 Department of CommerceNational Institute of Standards and Technology -
Standard Robot Platform Designed for Unstructured Environment Research
SBC: TARGAZYME, INC. Topic: N/ARobotic researchers currently are using insufficient and varying robot platforms to investigate issues crucial to the successful development of a remote reconnaissance tool for the urban search and rescue (USAR) community. USAR robotic researchers need a standard robot platform designed for research in unstructured environments. This platform would accelerate the research essential to advancing re ...
SBIR Phase I 2004 Department of CommerceNational Institute of Standards and Technology -
Ultra-High Vacuum Compatible Wavelength Dispersive X-ray Spectrometer
SBC: PARALLAX RESEARCH INC Topic: N/AParallax Research, Inc. proposes to develop an Ultra-High Vacuum Compatible Wavelength Dispersive X-ray Spectrometer for use on Field Emission Scanning Electron Microscopes, Transmission Electron Microscopes, Auger Spectroscopy Systems, and X-ray Photo-electron Spectroscopy Systems. We propose to build on Parallax's designs of innovative parallel beam x-ray spectrometers and incorporate new types ...
SBIR Phase I 2004 Department of CommerceNational Institute of Standards and Technology