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Award Data
The Award database is continually updated throughout the year. As a result, data for FY24 is not expected to be complete until March, 2025.
Download all SBIR.gov award data either with award abstracts (290MB)
or without award abstracts (65MB).
A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.
The SBIR.gov award data files now contain the required fields to calculate award timeliness for individual awards or for an agency or branch. Additional information on calculating award timeliness is available on the Data Resource Page.
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Anion Exchange Resin for Chirality-based Separation of Single-wall Carbon Nanotubes
SBC: Sepax Technologies, Inc. Topic: N/ASepax Technologies, Inc. has identified a new type of anoin-exchange resin which separates single-wall carbon nanotubes (SWCNTs) with >80% recovery yield and resolves in a single pass the chiral tubes of (6,5) well from commercial SWCNT starting materials by Chromatography. Improvement and scale up of the targeted resin production will facilitate the separation of chiral nanotubes for the academic ...
SBIR Phase II 2012 Department of CommerceNational Institute of Standards and Technology -
Fulcrum Biometrics' Plan for Research and Development of WS-BD Conformant Handheld Fingerprint Sensor
SBC: Fulcrum Biometrics, LLC Topic: N/ATrusted biometric validation of individual identities has never been more important. Several contributing factors are the increase in global terrorism, identity theft and the increase in legislation which are driving the accelerated adoption of biometric technology. Unfortunately, the biometrics industry has not actively responded to the changing market conditions being driven by the explosion in ...
SBIR Phase I 2012 Department of CommerceNational Institute of Standards and Technology -
Large-Area, High-Uniformity Photodiodes for Infrared Trap Detectors
SBC: AMETHYST RESEARCH INC Topic: 9020168Rmethyst Research Inc. will design, fabricate and test a high uniformity, large area, low noise infrared trap-detector detector for the 1- 4.5 μm wavelength range. This state of the art detector will have a large area (e.g., 1-1.8 cm diameter active area) with a spatial variability of internal quantum efficiency of less than 0.1 % between 1 μm and 4.5 μm. In addition, the internal quantum effici ...
SBIR Phase I 2015 Department of CommerceNational Institute of Standards and Technology -
Precision 10 kV Programmable Voltage Source
SBC: Low Thermal Electronics, Inc. Topic: NALow Thermal Electronics, Inc. proposes to design a stand-alone, programmable voltage source capable of supplying precision voltages in the range of zero to 1,000 volts direct current (DC), with options for scaling up to 10,000 volts, and with a total expanded uncertainty (k=2) of less than 10uV/V for the 10,000 volt version. This instrument will improve state-of-the-art measurements in high resist ...
SBIR Phase I 2017 Department of CommerceNational Institute of Standards and Technology -
Horizon: Validation of an improved method for rapid characterization of protein aggregates in biologic drugs for increased quality and safety
SBC: OPTOFLUIDICS, INC. Topic: NAOptofluidics and the University of Delaware propose to complete the development of the Horizon technology and carry out validation via a comprehensive multi-site study. The technology is a subvisible particle analyzer pioneered during Phase I. The technology is designed to fill two critical gaps in biopharmaceutical product development: (1) Scientists can count and image particles with current too ...
SBIR Phase II 2017 Department of CommerceNational Institute of Standards and Technology -
Fiber Pigtailed On-Chip Mid-infrared Difference Frequency Generation in Silicon
SBC: OMEGA OPTICS, INC. Topic: NAWe propose a fiber-pigtailed strained silicon platform for tunable difference frequency generation (DFG) in mid-infrared (MIR) with tunable continuous wave near-infrared (NIR) sources. Stress exerted by silicon nitride induces second-order nonlinear susceptibility c(2) on underlying centro-symmetric silicon. NIR light is coupled into silicon and MIR light is coupled out of silicon using sub-wavele ...
SBIR Phase II 2017 Department of CommerceNational Institute of Standards and Technology -
Multimode Chiroptical Spectrometer for Nanoparticle Characterization
SBC: APPLIED NANOFLUORESCENCE, LLC Topic: NAThis project will develop a new scientific instrument optimized for the advanced characterization of near-infrared fluorescent nanoparticles that can exist as left- or right-handed structures (enantiomers). Single-walled carbon nanotubes (SWCNTs) are currently the leading example of such nanomaterials. Applied NanoFluorescence, LLC (ANF) proposes a novel multi-mode chiroptical spectrometer that ca ...
SBIR Phase I 2018 Department of CommerceNational Institute of Standards and Technology -
Precision 10 kV Programmable Voltage Source
SBC: Low Thermal Electronics, Inc. Topic: NALow Thermal Electronics, Inc. proposes to design a stand-alone, programmable voltage source capable of supplying precision voltages in the range of zero to 1,000 volts direct current (DC), with options for scaling up to 10,000 volts, and with a total expanded uncertainty (k=2) of less than 10uV/V for the 10,000 volts version. This instrument will improve state-of-the-art measurements in high resis ...
SBIR Phase II 2018 Department of CommerceNational Institute of Standards and Technology -
Gap-Free Model-Based Engineering for Manufacturing and Analysis: Digital Thread without Translation
SBC: Nvariate, Inc. Topic: NoneModern Model-Based Enterprise / Engineering (MBE) systems rely on freeform surfaces built as complex combinations of geometric primitives to define engineered objects. Unfortunately, the intersection of freeform surfaces in MBE applications results in highly approximated solutions, degrading models that cost billions annually by US industry to fix. Current technology limits the abilities of users ...
SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology -
Advanced Manufacturing and Material Measurements Software Tool Weave ™ for the Acceleration and Automation of SEM Image Analysis in the Semiconductor Industry
SBC: Sandbox Semiconductor Incorporated Topic: NoneIn this Phase I SBIR proposal, SandBox Semiconductor™ proposes to develop an Advanced Manufacturing and Material Measurements software tool called Weave ™ for accelerating and automating SEM image analysis for the semiconductor industry. During the development of a new manufacturing process line for a semiconductor device, tens of thousands of scanning electron microscopy (SEM) images are take ...
SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology