Award Data

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The Award database is continually updated throughout the year. As a result, data for FY19 is not expected to be complete until June, 2020.

  1. SCAP Content Editor

    SBC: G2, INC.            Topic: N/A

    NIST and G2 have been on the forefront of security automation with the development of the Security Content Automation Protocol (SCAP). However, the barrier to entry for SCAP content creation is the requirement to have in depth knowledge of the underlying specifications. This project aims to allow security experts to create SCAP content without the need to be an expert in the specification. By leve ...

    SBIR Phase II 2012 Department of CommerceNational Institute of Standards and Technology
  2. Fulcrum Biometrics' Plan for Research and Development of WS-BD Conformant Handheld Fingerprint Sensor

    SBC: Fulcrum Biometrics, LLC            Topic: N/A

    Trusted biometric validation of individual identities has never been more important. Several contributing factors are the increase in global terrorism, identity theft and the increase in legislation which are driving the accelerated adoption of biometric technology. Unfortunately, the biometrics industry has not actively responded to the changing market conditions being driven by the explosion in ...

    SBIR Phase I 2012 Department of CommerceNational Institute of Standards and Technology
  3. An Automated Lapping Apparatus and Process for High- Process for High-Precision Random Profile Roughness Specimen Fabrication

    SBC: X-Wave Innovations, Inc.            Topic: N/A

    The measurement and quality control for smooth engineering surfaces are becoming more and more important in modern science and technology due to their important engineering functions and high production costs. NIST has frequently received requests for U.S. industry to provide Standard Reference Material (SRM) high-precision, random profile roughness specimens to support smooth surface measurements ...

    SBIR Phase I 2012 Department of CommerceNational Institute of Standards and Technology
  4. Large-Area, High-Uniformity Photodiodes for Infrared Trap Detectors

    SBC: AMETHYST RESEARCH INCORPORATED            Topic: 9020168R

    methyst Research Inc. will design, fabricate and test a high uniformity, large area, low noise infrared trap-detector detector for the 1- 4.5 μm wavelength range. This state of the art detector will have a large area (e.g., 1-1.8 cm diameter active area) with a spatial variability of internal quantum efficiency of less than 0.1 % between 1 μm and 4.5 μm. In addition, the internal quantum effici ...

    SBIR Phase I 2015 Department of CommerceNational Institute of Standards and Technology
  5. High-Throughput Low-Cost Manufacturing of Engineered MRI Contrast Agents

    SBC: Weinberg Medical Physics, Inc.            Topic: 9010368R

    Scalable manufacturing of micro-engineered MRI contrast agents has the potential to increase the specificity and resolution of imaging techniques, while reducing morbidity. Currently, techniques used for making such particles are expensive and labor intensive. In Phase I, Weinberg Medical Physics will validate techniques for rapid, massively parallel fabrication of microscale contrast agents (incl ...

    SBIR Phase I 2015 Department of CommerceNational Institute of Standards and Technology
  6. High Performance Beam Scanning Using a Resonant Scan Lens

    SBC: XSB INC.            Topic: 9050140TT

    The objective of this project is to demonstrate a resonant scan lens (RSL) that increases the uniformity of beam scans projected from resonant optomechanical systems. While resonant optomechanical systems generate high-speed beam scans, large mechanical displacements, and robust operation from miniature form factors, scans projected from such systems lack uniformity across the field-of-view (FOV). ...

    SBIR Phase I 2015 Department of CommerceNational Institute of Standards and Technology
  7. Precision 10 kV Programmable Voltage Source

    SBC: Low Thermal Electronics, Inc.            Topic: NA

    Low Thermal Electronics, Inc. proposes to design a stand-alone, programmable voltage source capable of supplying precision voltages in the range of zero to 1,000 volts direct current (DC), with options for scaling up to 10,000 volts, and with a total expanded uncertainty (k=2) of less than 10uV/V for the 10,000 volt version. This instrument will improve state-of-the-art measurements in high resist ...

    SBIR Phase I 2017 Department of CommerceNational Institute of Standards and Technology
  8. A Model-Based Solution to Improve the Accessibility and Affordability of Manufacturing System Simulations

    SBC: MBSE Tools, Inc.            Topic: NA

    The vision is to provide decision-makers with effective, fast, and inexpensive analysis tools to answer "What-If" and "What-Should" questions about manufacturing systems. Value Stream Mapping (VSM) is a modeling methodology with widespread contemporary use in manufacturing, and our strategy is to start with VSM as a deployment beachhead for the eventual deployment of a more generic manufacturing s ...

    SBIR Phase I 2017 Department of CommerceNational Institute of Standards and Technology
  9. 3-D Digital Image Correlation Based Non-Destructive Testing System for Qualification of Additive Manufacturing Parts

    SBC: X-Wave Innovations, Inc.            Topic: NA

    NIST's seeks a high resolution DIC technology for qualification of complex AM parts. To meet this critical need, X-wave Innovations Inc. proposes to develop a 3-Dimentional Digital Image Correlation (3-D DIC) based NDT system. The proposed effort builds upon the success of XII in developing a variety of NDT technologies (including DIC system) for advanced materials evaluation. The success of the p ...

    SBIR Phase I 2017 Department of CommerceNational Institute of Standards and Technology
  10. Advanced Manufacturing and Material Measurements Software Tool Weave ™ for the Acceleration and Automation of SEM Image Analysis in the Semiconductor Industry

    SBC: Sandbox Semiconductor Incorporated            Topic: None

    In this Phase I SBIR proposal, SandBox Semiconductor™ proposes to develop an Advanced Manufacturing and Material Measurements software tool called Weave ™ for accelerating and automating SEM image analysis for the semiconductor industry. During the development of a new manufacturing process line for a semiconductor device, tens of thousands of scanning electron microscopy (SEM) images are take ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
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