Award Data

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The Award database is continually updated throughout the year. As a result, data for FY19 is not expected to be complete until June, 2020.

  1. Fulcrum Biometrics' Plan for Research and Development of WS-BD Conformant Handheld Fingerprint Sensor

    SBC: Fulcrum Biometrics, LLC            Topic: N/A

    Trusted biometric validation of individual identities has never been more important. Several contributing factors are the increase in global terrorism, identity theft and the increase in legislation which are driving the accelerated adoption of biometric technology. Unfortunately, the biometrics industry has not actively responded to the changing market conditions being driven by the explosion in ...

    SBIR Phase I 2012 Department of CommerceNational Institute of Standards and Technology
  2. High-Throughput Manufacturing Methods for Engineered MRI Contrast Agents

    SBC: ADVANCED RESEARCH CORPORATION            Topic: 9010368R

    This project focuses on developing a magnetic resonance imaging (MRI) contrast agent that may increase the detection of tagged cells by a factor of 10-100. The ability to noninvasively track specifically labeled (tagged) cells, enables a researcher or medical treatment professional to dynamically monitor the delivery and targeted application of medicinal and bio-reactive agents.

    SBIR Phase I 2015 Department of CommerceNational Institute of Standards and Technology
  3. Large-Area, High-Uniformity Photodiodes for Infrared Trap Detectors

    SBC: AMETHYST RESEARCH INCORPORATED            Topic: 9020168R

    methyst Research Inc. will design, fabricate and test a high uniformity, large area, low noise infrared trap-detector detector for the 1- 4.5 μm wavelength range. This state of the art detector will have a large area (e.g., 1-1.8 cm diameter active area) with a spatial variability of internal quantum efficiency of less than 0.1 % between 1 μm and 4.5 μm. In addition, the internal quantum effici ...

    SBIR Phase I 2015 Department of CommerceNational Institute of Standards and Technology
  4. Precision 10 kV Programmable Voltage Source

    SBC: Low Thermal Electronics, Inc.            Topic: NA

    Low Thermal Electronics, Inc. proposes to design a stand-alone, programmable voltage source capable of supplying precision voltages in the range of zero to 1,000 volts direct current (DC), with options for scaling up to 10,000 volts, and with a total expanded uncertainty (k=2) of less than 10uV/V for the 10,000 volt version. This instrument will improve state-of-the-art measurements in high resist ...

    SBIR Phase I 2017 Department of CommerceNational Institute of Standards and Technology
  5. ISABEL- Integrated Secure Automated Bug Extraction List

    SBC: Smart Information Flow Technologies, LLC            Topic: NA

    The ISABEL program will create symbolic execution signatures to classify bugs in the NIST Bugs Framework. Using the symbolic execution signature ISABEL will find a program input to trigger the bug using fuzz testing. ISABEL will integrate its bug categorization and bug triggering capability with a software development environment using a flexible framework that will allow both open source and comm ...

    SBIR Phase I 2017 Department of CommerceNational Institute of Standards and Technology
  6. A Model-Based Solution to Improve the Accessibility and Affordability of Manufacturing System Simulations

    SBC: MBSE Tools, Inc.            Topic: NA

    The vision is to provide decision-makers with effective, fast, and inexpensive analysis tools to answer "What-If" and "What-Should" questions about manufacturing systems. Value Stream Mapping (VSM) is a modeling methodology with widespread contemporary use in manufacturing, and our strategy is to start with VSM as a deployment beachhead for the eventual deployment of a more generic manufacturing s ...

    SBIR Phase I 2017 Department of CommerceNational Institute of Standards and Technology
  7. Advanced Manufacturing and Material Measurements Software Tool Weave ™ for the Acceleration and Automation of SEM Image Analysis in the Semiconductor Industry

    SBC: Sandbox Semiconductor Incorporated            Topic: None

    In this Phase I SBIR proposal, SandBox Semiconductor™ proposes to develop an Advanced Manufacturing and Material Measurements software tool called Weave ™ for accelerating and automating SEM image analysis for the semiconductor industry. During the development of a new manufacturing process line for a semiconductor device, tens of thousands of scanning electron microscopy (SEM) images are take ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
  8. Gap-Free Model-Based Engineering for Manufacturing and Analysis: Digital Thread without Translation

    SBC: Nvariate, Inc.            Topic: None

    Modern Model-Based Enterprise / Engineering (MBE) systems rely on freeform surfaces built as complex combinations of geometric primitives to define engineered objects. Unfortunately, the intersection of freeform surfaces in MBE applications results in highly approximated solutions, degrading models that cost billions annually by US industry to fix. Current technology limits the abilities of users ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
  9. Multimode Chiroptical Spectrometer for Nanoparticle Characterization

    SBC: Applied Nanofluorescence LLC            Topic: None

    This project will develop a new scientific instrument optimized for the advanced characterization of near-infrared fluorescent nanoparticles that can exist as left- or right-handed structures (enantiomers). Single-walled carbon nanotubes (SWCNTs) are the leading current example of such nanomaterials. Applied NanoFluorescence, LLC (ANF) proposes a novel multi-mode chiroptical spectrometer that can ...

    SBIR Phase II 2019 Department of CommerceNational Institute of Standards and Technology
  10. Fiber Pigtailed On-Chip Mid-infrared Difference Frequency Generation in Silicon

    SBC: Omega Optics, Inc.            Topic: NA

    We propose a fiber-pigtailed strained silicon platform for tunable difference frequency generation (DFG) in mid-infrared (MIR) with tunable continuous wave near-infrared (NIR) sources. Stress exerted by silicon nitride induces second-order nonlinear susceptibility c(2) on underlying centro-symmetric silicon. NIR light is coupled into silicon and MIR light is coupled out of silicon using sub-wavele ...

    SBIR Phase II 2017 Department of CommerceNational Institute of Standards and Technology
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