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The Award database is continually updated throughout the year. As a result, data for FY24 is not expected to be complete until March, 2025.

Download all SBIR.gov award data either with award abstracts (290MB) or without award abstracts (65MB). A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.

The SBIR.gov award data files now contain the required fields to calculate award timeliness for individual awards or for an agency or branch. Additional information on calculating award timeliness is available on the Data Resource Page.

  1. Fulcrum Biometrics' Plan for Research and Development of WS-BD Conformant Handheld Fingerprint Sensor

    SBC: Fulcrum Biometrics, LLC            Topic: N/A

    Trusted biometric validation of individual identities has never been more important. Several contributing factors are the increase in global terrorism, identity theft and the increase in legislation which are driving the accelerated adoption of biometric technology. Unfortunately, the biometrics industry has not actively responded to the changing market conditions being driven by the explosion in ...

    SBIR Phase I 2012 Department of CommerceNational Institute of Standards and Technology
  2. WS-BD Conformant Handheld Multi-biometric Acquisition System

    SBC: Fulcrum Biometrics, LLC            Topic: 9010477TT

    Secure trusted biometric validation of identity has never been more important. The increase in global terrorism, unfettered identity theft and new legislation requiring multi-factor authentication are a few of the driving factors. The biometrics industry has not actively responded to the changing market conditions being driven by the explosion in mobile computing. Millions of new mobile devices ar ...

    SBIR Phase II 2013 Department of CommerceNational Institute of Standards and Technology
  3. Large-Area, High-Uniformity Photodiodes for Infrared Trap Detectors

    SBC: AMETHYST RESEARCH INC            Topic: 9020168R

    methyst Research Inc. will design, fabricate and test a high uniformity, large area, low noise infrared trap-detector detector for the 1- 4.5 μm wavelength range. This state of the art detector will have a large area (e.g., 1-1.8 cm diameter active area) with a spatial variability of internal quantum efficiency of less than 0.1 % between 1 μm and 4.5 μm. In addition, the internal quantum effici ...

    SBIR Phase I 2015 Department of CommerceNational Institute of Standards and Technology
  4. Fiber Pigtailed On-Chip Mid-infrared Difference Frequency Generation in Silicon

    SBC: OMEGA OPTICS, INC.            Topic: 90102

    Omega Optics will develop a fiber-coupled platform in strained silicon-on-sapphire (SoS) for tunable difference frequency generation in midwave infrared (MIR) with tunable continuous wave sources in the near-infrared (NIR). Stress exerted by silicon nitride on underlying silicon induces second-order nonlinear susceptibility. NIR light is coupled into silicon and MWIR light is coupled out of silico ...

    SBIR Phase I 2016 Department of CommerceNational Institute of Standards and Technology
  5. Pre-concentrator for Capture of Trace Fluorocarbons

    SBC: XPLOSAFE LLC            Topic: 90108

    While fluorocarbons are released in relatively small amounts, they can have half-lives in the atmosphere as long as 50,000 years. However, they have extremely high global warming potential relative to other greenhouse gases, so that even small atmospheric concentrations can have large effect on global temperatures. For this reason, monitoring atmospheric concentrations of these compounds, identify ...

    SBIR Phase I 2016 Department of CommerceNational Institute of Standards and Technology
  6. Precision 10 kV Programmable Voltage Source

    SBC: Low Thermal Electronics, Inc.            Topic: NA

    Low Thermal Electronics, Inc. proposes to design a stand-alone, programmable voltage source capable of supplying precision voltages in the range of zero to 1,000 volts direct current (DC), with options for scaling up to 10,000 volts, and with a total expanded uncertainty (k=2) of less than 10uV/V for the 10,000 volt version. This instrument will improve state-of-the-art measurements in high resist ...

    SBIR Phase I 2017 Department of CommerceNational Institute of Standards and Technology
  7. A Model-Based Solution to Improve the Accessibility and Affordability of Manufacturing System Simulations

    SBC: MBSE Tools, Inc.            Topic: NA

    The vision is to provide decision-makers with effective, fast, and inexpensive analysis tools to answer "What-If" and "What-Should" questions about manufacturing systems. Value Stream Mapping (VSM) is a modeling methodology with widespread contemporary use in manufacturing, and our strategy is to start with VSM as a deployment beachhead for the eventual deployment of a more generic manufacturing s ...

    SBIR Phase I 2017 Department of CommerceNational Institute of Standards and Technology
  8. Fiber Pigtailed On-Chip Mid-infrared Difference Frequency Generation in Silicon

    SBC: OMEGA OPTICS, INC.            Topic: NA

    We propose a fiber-pigtailed strained silicon platform for tunable difference frequency generation (DFG) in mid-infrared (MIR) with tunable continuous wave near-infrared (NIR) sources. Stress exerted by silicon nitride induces second-order nonlinear susceptibility c(2) on underlying centro-symmetric silicon. NIR light is coupled into silicon and MIR light is coupled out of silicon using sub-wavele ...

    SBIR Phase II 2017 Department of CommerceNational Institute of Standards and Technology
  9. Gap-Free Model-Based Engineering for Manufacturing and Analysis: Digital Thread without Translation

    SBC: Nvariate, Inc.            Topic: None

    Modern Model-Based Enterprise / Engineering (MBE) systems rely on freeform surfaces built as complex combinations of geometric primitives to define engineered objects. Unfortunately, the intersection of freeform surfaces in MBE applications results in highly approximated solutions, degrading models that cost billions annually by US industry to fix. Current technology limits the abilities of users ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
  10. Advanced Manufacturing and Material Measurements Software Tool Weave ™ for the Acceleration and Automation of SEM Image Analysis in the Semiconductor Industry

    SBC: Sandbox Semiconductor Incorporated            Topic: None

    In this Phase I SBIR proposal, SandBox Semiconductor™ proposes to develop an Advanced Manufacturing and Material Measurements software tool called Weave ™ for accelerating and automating SEM image analysis for the semiconductor industry. During the development of a new manufacturing process line for a semiconductor device, tens of thousands of scanning electron microscopy (SEM) images are take ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
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