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Award Data

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The Award database is continually updated throughout the year. As a result, data for FY20 is not expected to be complete until September, 2021.

  1. 3D Tip Characterization and Surface Reconstruction

    SBC: Nanometrology International, Inc.            Topic: 9070168TT

    Nanometrology International, Inc. (NMI) proposes to demonstrate the feasibility of 3-dimensional (3D) characterization of nanoscale objects using scanning probe microscopy (SPM) with a measurement uncertainty of less than 0.7 nm. To accomplish this task, we propose a novel method of 3D tip characterization and use of an innovative surface reconstruction algorithm recently introduced by NIST and th ...

    SBIR Phase I 2011 Department of CommerceNational Institute of Standards and Technology
  2. Massively Parallel High Temperature Probe System for Wafer-level Reliability Testing

    SBC: Celadon Systems Inc.            Topic: 910021R

    Historical methods of reliability assessment are less and less effective as device sizes shrink. Larger sample sizes and longer duration tests are increasingly needed. At the same time, efforts to continue scaling semiconductors to ever smaller geometries is leading to an explosion of new device structures, materials and processes. The cost of testing these innovations is becoming a major barrier ...

    SBIR Phase II 2011 Department of CommerceNational Institute of Standards and Technology
  3. Analysis of New WWVB Modulation Schemes for Future Broadcast

    SBC: XW, LLC dba Xtendwave            Topic: N/A

    This Phase 2 project targets the completion of the development of an improved system for the broadcasting of the WWVB signal, as a direct continuation of the Phase 1 project, which successfully validated the proposed approach through a feasibility study and analyses. Objectives of this project include the design of the new modulation scheme and protocol, the development of a new time-code generato ...

    SBIR Phase II 2011 Department of CommerceNational Institute of Standards and Technology
  4. Fulcrum Biometrics' Plan for Research and Development of WS-BD Conformant Handheld Fingerprint Sensor

    SBC: Fulcrum Biometrics, LLC            Topic: N/A

    Trusted biometric validation of individual identities has never been more important. Several contributing factors are the increase in global terrorism, identity theft and the increase in legislation which are driving the accelerated adoption of biometric technology. Unfortunately, the biometrics industry has not actively responded to the changing market conditions being driven by the explosion in ...

    SBIR Phase I 2012 Department of CommerceNational Institute of Standards and Technology
  5. High-Throughput Manufacturing Methods for Engineered MRI Contrast Agents

    SBC: ADVANCED RESEARCH CORPORATION            Topic: 9010368R

    This project focuses on developing a magnetic resonance imaging (MRI) contrast agent that may increase the detection of tagged cells by a factor of 10-100. The ability to noninvasively track specifically labeled (tagged) cells, enables a researcher or medical treatment professional to dynamically monitor the delivery and targeted application of medicinal and bio-reactive agents.

    SBIR Phase I 2015 Department of CommerceNational Institute of Standards and Technology
  6. Large-Area, High-Uniformity Photodiodes for Infrared Trap Detectors

    SBC: Amethyst Research Incorporated            Topic: 9020168R

    methyst Research Inc. will design, fabricate and test a high uniformity, large area, low noise infrared trap-detector detector for the 1- 4.5 μm wavelength range. This state of the art detector will have a large area (e.g., 1-1.8 cm diameter active area) with a spatial variability of internal quantum efficiency of less than 0.1 % between 1 μm and 4.5 μm. In addition, the internal quantum effici ...

    SBIR Phase I 2015 Department of CommerceNational Institute of Standards and Technology
  7. Precision 10 kV Programmable Voltage Source

    SBC: Low Thermal Electronics, Inc.            Topic: NA

    Low Thermal Electronics, Inc. proposes to design a stand-alone, programmable voltage source capable of supplying precision voltages in the range of zero to 1,000 volts direct current (DC), with options for scaling up to 10,000 volts, and with a total expanded uncertainty (k=2) of less than 10uV/V for the 10,000 volt version. This instrument will improve state-of-the-art measurements in high resist ...

    SBIR Phase I 2017 Department of CommerceNational Institute of Standards and Technology
  8. ISABEL- Integrated Secure Automated Bug Extraction List

    SBC: Smart Information Flow Technologies, LLC            Topic: NA

    The ISABEL program will create symbolic execution signatures to classify bugs in the NIST Bugs Framework. Using the symbolic execution signature ISABEL will find a program input to trigger the bug using fuzz testing. ISABEL will integrate its bug categorization and bug triggering capability with a software development environment using a flexible framework that will allow both open source and comm ...

    SBIR Phase I 2017 Department of CommerceNational Institute of Standards and Technology
  9. Fiber Pigtailed On-Chip Mid-infrared Difference Frequency Generation in Silicon

    SBC: Omega Optics, Inc.            Topic: NA

    We propose a fiber-pigtailed strained silicon platform for tunable difference frequency generation (DFG) in mid-infrared (MIR) with tunable continuous wave near-infrared (NIR) sources. Stress exerted by silicon nitride induces second-order nonlinear susceptibility c(2) on underlying centro-symmetric silicon. NIR light is coupled into silicon and MIR light is coupled out of silicon using sub-wavele ...

    SBIR Phase II 2017 Department of CommerceNational Institute of Standards and Technology
  10. Gap-Free Model-Based Engineering for Manufacturing and Analysis: Digital Thread without Translation

    SBC: Nvariate, Inc.            Topic: None

    Modern Model-Based Enterprise / Engineering (MBE) systems rely on freeform surfaces built as complex combinations of geometric primitives to define engineered objects. Unfortunately, the intersection of freeform surfaces in MBE applications results in highly approximated solutions, degrading models that cost billions annually by US industry to fix. Current technology limits the abilities of users ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
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