Award Data

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The Award database is continually updated throughout the year. As a result, data for FY19 is not expected to be complete until June, 2020.

  1. Micro-Positioner Replacement of Piezo Actuators in Long-working Distance Interference Microscopes

    SBC: E. M. Optomechanical, Inc.            Topic: N/A

    The NIST patented six-degree of freedom micropositioner technology associated with this subtopic has been identified by E M Optomechanical, Inc. (EMOM) as a technology that could be incorporated into the company¿s long-working distance interference microscopes. A key element in these microscopes is a piezo-actuator device, installed in a manual pitch/yaw mount, which translates a small flat mirro ...

    SBIR Phase I 2009 Department of CommerceNational Institute of Standards and Technology
  2. High Power, Mid-Infrared Fiber Supercontinuum Light Source

    SBC: MESA PHOTONICS, LLC            Topic: N/A

    Modern supercontinuum (SC) light sources are generated by non-linear interactions between ultrashort laser pulses and optical fibers. These light sources have high brightness and are spatially coherent. Output in near-ultraviolet to near-infrared wavelength ranges has been demonstrated. SC wavelength ranges are constrained by the transmission and dispersion properties of the fibers. Previously, ou ...

    SBIR Phase II 2009 Department of CommerceNational Institute of Standards and Technology
  3. Innovative Residential Fire Detection

    SBC: Southwest Sciences, Inc.            Topic: N/A

    Southwest Sciences¿ Phase 2 SBIR project will lead to development of residential fire sensing systems based on recently developed, low cost temperature and optical imaging sensors combined with newly introduced highly miniaturized, micropower CO sensors. Sensor modules will be part of a low power wireless network. Each module will be about ½ the size of a business card, a few mm thick, and w ...

    SBIR Phase II 2009 Department of CommerceNational Institute of Standards and Technology
  4. Microcalorimeter Alpha Spectrometer for Analysis of Nuclear Material

    SBC: STAR CRYOELECTRONICS LLC            Topic: N/A

    A key factor of international efforts to identify and suppress the supply of and demand for nuclear materials, and thereby to deter potential traffickers, is the ability to accurately identify contradicted material and ultimately to trace it back to its origin. Alpha particle spectroscopy is widely used in nuclear forensics to assay trace quantities of sensitive nuclear materials, but the limited ...

    SBIR Phase II 2009 Department of CommerceNational Institute of Standards and Technology
  5. Fulcrum Biometrics' Plan for Research and Development of WS-BD Conformant Handheld Fingerprint Sensor

    SBC: Fulcrum Biometrics, LLC            Topic: N/A

    Trusted biometric validation of individual identities has never been more important. Several contributing factors are the increase in global terrorism, identity theft and the increase in legislation which are driving the accelerated adoption of biometric technology. Unfortunately, the biometrics industry has not actively responded to the changing market conditions being driven by the explosion in ...

    SBIR Phase I 2012 Department of CommerceNational Institute of Standards and Technology
  6. Improved Microcalorimeter Detectors for X-Ray Chemical Shift Mapping

    SBC: STAR CRYOELECTRONICS LLC            Topic: N/A

    X-ray fluorescence spectroscopy is a widely used and extremely sensitive analytical technique for qualitative as well as quantitative chemical analysis. Superconducting Transition Edge Sensor (TES) microcalorimeter detectors have now been developed that achieve an energy resolution of 2 eV (full width at half maximum) for 1.5 keV X-rays, which is sufficient to enable the measurement of the small s ...

    SBIR Phase I 2012 Department of CommerceNational Institute of Standards and Technology
  7. Large-Area, High-Uniformity Photodiodes for Infrared Trap Detectors

    SBC: AMETHYST RESEARCH INCORPORATED            Topic: 9020168R

    methyst Research Inc. will design, fabricate and test a high uniformity, large area, low noise infrared trap-detector detector for the 1- 4.5 μm wavelength range. This state of the art detector will have a large area (e.g., 1-1.8 cm diameter active area) with a spatial variability of internal quantum efficiency of less than 0.1 % between 1 μm and 4.5 μm. In addition, the internal quantum effici ...

    SBIR Phase I 2015 Department of CommerceNational Institute of Standards and Technology
  8. Cognitive Residential Heat Pumps Fault Detection and Diagnostic Datalogger

    SBC: MANAGEMENT SCIENCES INC            Topic: 9010173R

    During Phase I, Management Sciences, Inc. (MSI) proved feasibility of adapting their current technology into a product capable of improving performance resulting in increased efficiency and extended life cycles of heat pumps. The resultant product is a tool named the Heat Pump Sentient (HP-Sentient). The HP-Sentient will improve performance and reduce maintenance costs through aggressive goal-seek ...

    SBIR Phase II 2015 Department of CommerceNational Institute of Standards and Technology
  9. Precision 10 kV Programmable Voltage Source

    SBC: Low Thermal Electronics, Inc.            Topic: NA

    Low Thermal Electronics, Inc. proposes to design a stand-alone, programmable voltage source capable of supplying precision voltages in the range of zero to 1,000 volts direct current (DC), with options for scaling up to 10,000 volts, and with a total expanded uncertainty (k=2) of less than 10uV/V for the 10,000 volt version. This instrument will improve state-of-the-art measurements in high resist ...

    SBIR Phase I 2017 Department of CommerceNational Institute of Standards and Technology
  10. Advanced Manufacturing and Material Measurements Software Tool Weave ™ for the Acceleration and Automation of SEM Image Analysis in the Semiconductor Industry

    SBC: Sandbox Semiconductor Incorporated            Topic: None

    In this Phase I SBIR proposal, SandBox Semiconductor™ proposes to develop an Advanced Manufacturing and Material Measurements software tool called Weave ™ for accelerating and automating SEM image analysis for the semiconductor industry. During the development of a new manufacturing process line for a semiconductor device, tens of thousands of scanning electron microscopy (SEM) images are take ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
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