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The Award database is continually updated throughout the year. As a result, data for FY24 is not expected to be complete until March, 2025.

Download all SBIR.gov award data either with award abstracts (290MB) or without award abstracts (65MB). A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.

The SBIR.gov award data files now contain the required fields to calculate award timeliness for individual awards or for an agency or branch. Additional information on calculating award timeliness is available on the Data Resource Page.

  1. Large-Area, High-Uniformity Photodiodes for Infrared Trap Detectors

    SBC: AMETHYST RESEARCH INC            Topic: 9020168R

    methyst Research Inc. will design, fabricate and test a high uniformity, large area, low noise infrared trap-detector detector for the 1- 4.5 μm wavelength range. This state of the art detector will have a large area (e.g., 1-1.8 cm diameter active area) with a spatial variability of internal quantum efficiency of less than 0.1 % between 1 μm and 4.5 μm. In addition, the internal quantum effici ...

    SBIR Phase I 2015 Department of CommerceNational Institute of Standards and Technology
  2. Category-Theoretic Tool for Manufacturing-related Information Integration

    SBC: CATEGORICAL INFORMATICS, INC.            Topic: 9010173R

    Categorical theory has recently been successfully applied to translate information from one computer system to another. Researchers at MIT have developed a prototype software tool based on category theory for solving information-integration programs. The tool has successfully solved small-scale information-integration problems including a problem identified by NIST about enriching the manufacturin ...

    SBIR Phase I 2015 Department of CommerceNational Institute of Standards and Technology
  3. Fiber Pigtailed On-Chip Mid-infrared Difference Frequency Generation in Silicon

    SBC: OMEGA OPTICS, INC.            Topic: 90102

    Omega Optics will develop a fiber-coupled platform in strained silicon-on-sapphire (SoS) for tunable difference frequency generation in midwave infrared (MIR) with tunable continuous wave sources in the near-infrared (NIR). Stress exerted by silicon nitride on underlying silicon induces second-order nonlinear susceptibility. NIR light is coupled into silicon and MWIR light is coupled out of silico ...

    SBIR Phase I 2016 Department of CommerceNational Institute of Standards and Technology
  4. High-Throughput Single-Nanoparticle Magnetic Analysis Platform Using Diamond Magnetic Imaging

    SBC: Quantum Diamond Technologies Inc            Topic: 90109

    Magnetic nanoparticles are powerful tools over a wide range of industries, but have particularly powerful biomedical applications for clinical and research diagnostics, clinical therapy, and basic life science research. These applications require consistent sources for magnetic nanoparticles with narrow distributions of magnetic properties, but no technology is now commercially available for manuf ...

    SBIR Phase I 2016 Department of CommerceNational Institute of Standards and Technology
  5. Pre-concentrator for Capture of Trace Fluorocarbons

    SBC: XPLOSAFE LLC            Topic: 90108

    While fluorocarbons are released in relatively small amounts, they can have half-lives in the atmosphere as long as 50,000 years. However, they have extremely high global warming potential relative to other greenhouse gases, so that even small atmospheric concentrations can have large effect on global temperatures. For this reason, monitoring atmospheric concentrations of these compounds, identify ...

    SBIR Phase I 2016 Department of CommerceNational Institute of Standards and Technology
  6. A Category-theoretic Tool for Manufacturing Information Integration

    SBC: CATEGORICAL INFORMATICS, INC.            Topic: 90101

    Category theory has recently been successfully applied to translate information from one computer system to another. Researchers at MIT have developed a prototype software tool based on category theory for solving information-integration programs. The tool has successfully solved small-scale information-integration problems including a problem identified by NIST about enriching the manufacturing s ...

    SBIR Phase II 2016 Department of CommerceNational Institute of Standards and Technology
  7. Gap-Free Model-Based Engineering for Manufacturing and Analysis: Digital Thread without Translation

    SBC: Nvariate, Inc.            Topic: None

    Modern Model-Based Enterprise / Engineering (MBE) systems rely on freeform surfaces built as complex combinations of geometric primitives to define engineered objects. Unfortunately, the intersection of freeform surfaces in MBE applications results in highly approximated solutions, degrading models that cost billions annually by US industry to fix. Current technology limits the abilities of users ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
  8. Developing Silicon Nanowire Sensors to Measuring Host-Cell Proteins at a Biomanufacturing Line

    SBC: ADVANCED SILICON GROUP, INC.            Topic: None

    Our biosensor is made of silicon nanowire arrays functionalized with antibodies to measure the concentration of specific proteins. In this grant we will take a sensor that has been demonstrated for use in measuring a set of generic host cell proteins and we will apply the sensor to measure a set of proteins for a specific cell line. In doing so, we will demonstrate the utility of our sensor to be ...

    SBIR Phase II 2019 Department of CommerceNational Institute of Standards and Technology
  9. Advanced Manufacturing and Material Measurements Software Tool Weave ™ for the Acceleration and Automation of SEM Image Analysis in the Semiconductor Industry

    SBC: Sandbox Semiconductor Incorporated            Topic: None

    In this Phase I SBIR proposal, SandBox Semiconductor™ proposes to develop an Advanced Manufacturing and Material Measurements software tool called Weave ™ for accelerating and automating SEM image analysis for the semiconductor industry. During the development of a new manufacturing process line for a semiconductor device, tens of thousands of scanning electron microscopy (SEM) images are take ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
  10. Multimode Chiroptical Spectrometer for Nanoparticle Characterization

    SBC: APPLIED NANOFLUORESCENCE, LLC            Topic: None

    This project will develop a new scientific instrument optimized for the advanced characterization of near-infrared fluorescent nanoparticles that can exist as left- or right-handed structures (enantiomers). Single-walled carbon nanotubes (SWCNTs) are the leading current example of such nanomaterials. Applied NanoFluorescence, LLC (ANF) proposes a novel multi-mode chiroptical spectrometer that can ...

    SBIR Phase II 2019 Department of CommerceNational Institute of Standards and Technology
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