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Award Data

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The Award database is continually updated throughout the year. As a result, data for FY24 is not expected to be complete until March, 2025.

Download all SBIR.gov award data either with award abstracts (290MB) or without award abstracts (65MB). A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.

The SBIR.gov award data files now contain the required fields to calculate award timeliness for individual awards or for an agency or branch. Additional information on calculating award timeliness is available on the Data Resource Page.

  1. Developing Silicon Nanowire Sensors to Measuring Host-Cell Proteins at a Biomanufacturing Line

    SBC: ADVANCED SILICON GROUP, INC.            Topic: None

    Our biosensor is made of silicon nanowire arrays functionalized with antibodies to measure the concentration of specific proteins. In this grant we will take a sensor that has been demonstrated for use in measuring a set of generic host cell proteins and we will apply the sensor to measure a set of proteins for a specific cell line. In doing so, we will demonstrate the utility of our sensor to be ...

    SBIR Phase II 2019 Department of CommerceNational Institute of Standards and Technology
  2. Dual Plane 3D Compton Scattering Imager with Pixelated CZT Detectors for 1-10MeV Gamma Ray

    SBC: H3D INC            Topic: None

    Phase I has proven that the current setup achieves better than 8mm spatial resolution for 2.2MeV prompt gammas. However, 1mm spatial resolution presents a significant challenge for the current setup due in part to limited timing resolution and count rate. A new analog ASIC will be developed to replace the current analog ASIC that will have better timing resolution and deliver higher count rates. I ...

    SBIR Phase II 2019 Department of CommerceNational Institute of Standards and Technology
  3. Multimode Chiroptical Spectrometer for Nanoparticle Characterization

    SBC: APPLIED NANOFLUORESCENCE, LLC            Topic: None

    This project will develop a new scientific instrument optimized for the advanced characterization of near-infrared fluorescent nanoparticles that can exist as left- or right-handed structures (enantiomers). Single-walled carbon nanotubes (SWCNTs) are the leading current example of such nanomaterials. Applied NanoFluorescence, LLC (ANF) proposes a novel multi-mode chiroptical spectrometer that can ...

    SBIR Phase II 2019 Department of CommerceNational Institute of Standards and Technology
  4. Critical Program Information Assessment Standardization Toolkit (CAST)

    SBC: CHARLES RIVER ANALYTICS, INC.            Topic: SCO183002

    Program protection and security personnel in the DoD are faced with the complex task of identifying and protecting sensitive information about systems, including the nature of mission-critical functions and components, and Critical Program Information (CPI). Successful and efficient identification and protection of CPI is essential to maintaining US Warfighters’ technological advantage. Cur ...

    SBIR Phase I 2019 Department of DefenseOffice of the Secretary of Defense
  5. Gap-Free Model-Based Engineering for Manufacturing and Analysis: Digital Thread without Translation

    SBC: Nvariate, Inc.            Topic: None

    Modern Model-Based Enterprise / Engineering (MBE) systems rely on freeform surfaces built as complex combinations of geometric primitives to define engineered objects. Unfortunately, the intersection of freeform surfaces in MBE applications results in highly approximated solutions, degrading models that cost billions annually by US industry to fix. Current technology limits the abilities of users ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
  6. Advanced Instrumentation for Non-Nulling Stack Velocity Testing

    SBC: AIRFLOW SCIENCES CORP            Topic: None

    Industrial facilities, manufacturing plants, and electric power plants that burn fossil fuels exhaust the combustion products to atmosphere through their smokestacks. Stack pollutant emissions are quantified using manual testing methods developed in the 1960s, which are prone to error if non-axial flow exists in a stack.Recently, NIST has been working on an improved technique of performing 3D flow ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
  7. Advanced Manufacturing and Material Measurements Software Tool Weave ™ for the Acceleration and Automation of SEM Image Analysis in the Semiconductor Industry

    SBC: Sandbox Semiconductor Incorporated            Topic: None

    In this Phase I SBIR proposal, SandBox Semiconductor™ proposes to develop an Advanced Manufacturing and Material Measurements software tool called Weave ™ for accelerating and automating SEM image analysis for the semiconductor industry. During the development of a new manufacturing process line for a semiconductor device, tens of thousands of scanning electron microscopy (SEM) images are take ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
  8. Development of a Neutron-based Nondestructive Test Method for Concrete Petrography and Chemical Analysis

    SBC: TOURNEY CONSULTING GROUP, LLC            Topic: None

    To evaluate the technical feasibility of prompt gamma neutron activation (PGAA) as an alternative to a set of standard destructive tests of concrete petrography including aggregate type, water/cement ratio, aggregate/binder ratio, density, chloride content and chloride bulk diffusion constant; and to determine the specifications for the design of a dedicated commercial laboratory-based PGAA facili ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
  9. Nanomachine Device for Semiconductor Process Control Monitoring

    SBC: XALLENT INC.            Topic: None

    Conventional characterization and test methods are increasingly ineffective when applied to structures less than 100 nanometers, causing challenges across R&D, process control and failure analysis. An increasing number of subtle defects become prominent drivers of failure as device size and operating margins decrease, e.g., processing anomalies in thin gate oxides, substrate problems related to do ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
  10. QUINN (Quantum INspired Neural Networks)

    SBC: SOAR TECHNOLOGY INC            Topic: SCO183001

    Machine learning models are susceptible to adversarial attacks that make modifications to the input data in order to cause misclassifications. The root cause is the linearity of the decision boundaries of machine learning models in relation to their inputs. One promising direction is to represent the input data as a distribution. Quantum information science entails techniques for working with wave ...

    SBIR Phase I 2019 Department of DefenseOffice of the Secretary of Defense
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