Award Data

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The Award database is continually updated throughout the year. As a result, data for FY19 is not expected to be complete until June, 2020.

  1. Dual Plane 3D Compton Scattering Imager with Pixelated CZT Detectors for 1-10MeV Gamma Ray

    SBC: H3D            Topic: None

    Phase I has proven that the current setup achieves better than 8mm spatial resolution for 2.2MeV prompt gammas. However, 1mm spatial resolution presents a significant challenge for the current setup due in part to limited timing resolution and count rate. A new analog ASIC will be developed to replace the current analog ASIC that will have better timing resolution and deliver higher count rates. I ...

    SBIR Phase II 2019 Department of CommerceNational Institute of Standards and Technology
  2. Multimode Chiroptical Spectrometer for Nanoparticle Characterization

    SBC: Applied Nanofluorescence LLC            Topic: None

    This project will develop a new scientific instrument optimized for the advanced characterization of near-infrared fluorescent nanoparticles that can exist as left- or right-handed structures (enantiomers). Single-walled carbon nanotubes (SWCNTs) are the leading current example of such nanomaterials. Applied NanoFluorescence, LLC (ANF) proposes a novel multi-mode chiroptical spectrometer that can ...

    SBIR Phase II 2019 Department of CommerceNational Institute of Standards and Technology
  3. Advanced Instrumentation for Non-Nulling Stack Velocity Testing

    SBC: AIRFLOW SCIENCES CORPORATION            Topic: None

    Industrial facilities, manufacturing plants, and electric power plants that burn fossil fuels exhaust the combustion products to atmosphere through their smokestacks. Stack pollutant emissions are quantified using manual testing methods developed in the 1960s, which are prone to error if non-axial flow exists in a stack.Recently, NIST has been working on an improved technique of performing 3D flow ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
  4. Advanced Manufacturing and Material Measurements Software Tool Weave ™ for the Acceleration and Automation of SEM Image Analysis in the Semiconductor Industry

    SBC: Sandbox Semiconductor Incorporated            Topic: None

    In this Phase I SBIR proposal, SandBox Semiconductor™ proposes to develop an Advanced Manufacturing and Material Measurements software tool called Weave ™ for accelerating and automating SEM image analysis for the semiconductor industry. During the development of a new manufacturing process line for a semiconductor device, tens of thousands of scanning electron microscopy (SEM) images are take ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
  5. Development of a Neutron-based Nondestructive Test Method for Concrete Petrography and Chemical Analysis

    SBC: TOURNEY CONSULTING GROUP, LLC            Topic: None

    To evaluate the technical feasibility of prompt gamma neutron activation (PGAA) as an alternative to a set of standard destructive tests of concrete petrography including aggregate type, water/cement ratio, aggregate/binder ratio, density, chloride content and chloride bulk diffusion constant; and to determine the specifications for the design of a dedicated commercial laboratory-based PGAA facili ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
  6. Nanomachine Device for Semiconductor Process Control Monitoring

    SBC: Xallent LLC            Topic: None

    Conventional characterization and test methods are increasingly ineffective when applied to structures less than 100 nanometers, causing challenges across R&D, process control and failure analysis. An increasing number of subtle defects become prominent drivers of failure as device size and operating margins decrease, e.g., processing anomalies in thin gate oxides, substrate problems related to do ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
  7. Gap-Free Model-Based Engineering for Manufacturing and Analysis: Digital Thread without Translation

    SBC: Nvariate, Inc.            Topic: None

    Modern Model-Based Enterprise / Engineering (MBE) systems rely on freeform surfaces built as complex combinations of geometric primitives to define engineered objects. Unfortunately, the intersection of freeform surfaces in MBE applications results in highly approximated solutions, degrading models that cost billions annually by US industry to fix. Current technology limits the abilities of users ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
  8. ISABEL- Integrated Secure Automated Bug Extraction List

    SBC: Smart Information Flow Technologies, LLC            Topic: NA

    To automatically detect software bugs, understand their characteristics, and categorize them according to the evolving NIST Bugs Framework (BF), SIFT is developing ISABEL: Integrated Secure Automated Bug Extraction List. ISABEL will provide three key functions:- Using symbolic analysis and fuzz-testing tools to find inputs that trigger vulnerabilities (bugs).- Using fuzz-testing, delta-debugging, ...

    SBIR Phase II 2018 Department of CommerceNational Institute of Standards and Technology
  9. Manufacturing Data Compiler for Visualization Based on Engineering-Driven Machine Learning

    SBC: OG Technologies, Inc.            Topic: NA

    There has been substantial development in data analytics. However, the complex mathematical formulation of “big data analytics” is difficult to populate in general manufacturing plants. There is a need for an SPC-like tool to enable the acceptance of the advanced data analytics and its visualization. The MD Compiler, a tool to bridge the gap between data available and the information demanded ...

    SBIR Phase I 2018 Department of CommerceNational Institute of Standards and Technology
  10. Multimode Chiroptical Spectrometer for Nanoparticle Characterization

    SBC: Applied Nanofluorescence LLC            Topic: NA

    This project will develop a new scientific instrument optimized for the advanced characterization of near-infrared fluorescent nanoparticles that can exist as left- or right-handed structures (enantiomers). Single-walled carbon nanotubes (SWCNTs) are currently the leading example of such nanomaterials. Applied NanoFluorescence, LLC (ANF) proposes a novel multi-mode chiroptical spectrometer that ca ...

    SBIR Phase I 2018 Department of CommerceNational Institute of Standards and Technology
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