Award Data

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The Award database is continually updated throughout the year. As a result, data for FY19 is not expected to be complete until June, 2020.

  1. Dual Plane 3D Compton Scattering Imager with Pixelated CZT Detectors for 1-10MeV Gamma Ray

    SBC: H3D            Topic: None

    Phase I has proven that the current setup achieves better than 8mm spatial resolution for 2.2MeV prompt gammas. However, 1mm spatial resolution presents a significant challenge for the current setup due in part to limited timing resolution and count rate. A new analog ASIC will be developed to replace the current analog ASIC that will have better timing resolution and deliver higher count rates. I ...

    SBIR Phase II 2019 Department of CommerceNational Institute of Standards and Technology
  2. Multimode Chiroptical Spectrometer for Nanoparticle Characterization

    SBC: Applied Nanofluorescence LLC            Topic: None

    This project will develop a new scientific instrument optimized for the advanced characterization of near-infrared fluorescent nanoparticles that can exist as left- or right-handed structures (enantiomers). Single-walled carbon nanotubes (SWCNTs) are the leading current example of such nanomaterials. Applied NanoFluorescence, LLC (ANF) proposes a novel multi-mode chiroptical spectrometer that can ...

    SBIR Phase II 2019 Department of CommerceNational Institute of Standards and Technology
  3. Advanced Instrumentation for Non-Nulling Stack Velocity Testing

    SBC: AIRFLOW SCIENCES CORPORATION            Topic: None

    Industrial facilities, manufacturing plants, and electric power plants that burn fossil fuels exhaust the combustion products to atmosphere through their smokestacks. Stack pollutant emissions are quantified using manual testing methods developed in the 1960s, which are prone to error if non-axial flow exists in a stack.Recently, NIST has been working on an improved technique of performing 3D flow ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
  4. Advanced Manufacturing and Material Measurements Software Tool Weave ™ for the Acceleration and Automation of SEM Image Analysis in the Semiconductor Industry

    SBC: Sandbox Semiconductor Incorporated            Topic: None

    In this Phase I SBIR proposal, SandBox Semiconductor™ proposes to develop an Advanced Manufacturing and Material Measurements software tool called Weave ™ for accelerating and automating SEM image analysis for the semiconductor industry. During the development of a new manufacturing process line for a semiconductor device, tens of thousands of scanning electron microscopy (SEM) images are take ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
  5. Development of a Neutron-based Nondestructive Test Method for Concrete Petrography and Chemical Analysis

    SBC: TOURNEY CONSULTING GROUP, LLC            Topic: None

    To evaluate the technical feasibility of prompt gamma neutron activation (PGAA) as an alternative to a set of standard destructive tests of concrete petrography including aggregate type, water/cement ratio, aggregate/binder ratio, density, chloride content and chloride bulk diffusion constant; and to determine the specifications for the design of a dedicated commercial laboratory-based PGAA facili ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
  6. Nanomachine Device for Semiconductor Process Control Monitoring

    SBC: Xallent LLC            Topic: None

    Conventional characterization and test methods are increasingly ineffective when applied to structures less than 100 nanometers, causing challenges across R&D, process control and failure analysis. An increasing number of subtle defects become prominent drivers of failure as device size and operating margins decrease, e.g., processing anomalies in thin gate oxides, substrate problems related to do ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
  7. Gap-Free Model-Based Engineering for Manufacturing and Analysis: Digital Thread without Translation

    SBC: Nvariate, Inc.            Topic: None

    Modern Model-Based Enterprise / Engineering (MBE) systems rely on freeform surfaces built as complex combinations of geometric primitives to define engineered objects. Unfortunately, the intersection of freeform surfaces in MBE applications results in highly approximated solutions, degrading models that cost billions annually by US industry to fix. Current technology limits the abilities of users ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
  8. A Tool for Building Semantically Interoperable Specification and Standards

    SBC: XSB INC.            Topic: 9010273R

    Standards and specifications are widely used in government and industry to define requirements for products and processes and insure interoperability, safety, and quality of industrial and domestic products. Specifications and standards documents almost always cross-reference other standards and specification. Taken together, the web of interdependent standards forms an immensely important knowled ...

    SBIR Phase I 2015 Department of CommerceNational Institute of Standards and Technology
  9. Automated SCAP Tool Validator (ASTV)

    SBC: ATC-NY, Inc.            Topic: 9010377R

    The current testing methods of the NIST Security Content Automation Protocol (SCAP) Validation Program are largely manual and labor-intensive, making comprehensive validation of SCAP-enabled IT security products difficult and time-consuming. ATC-NY will design and develop the Automated SCAP Tool Validator (ASTV) for use with the SCAP Public Validation Test Suite and others. ASTV automates the conf ...

    SBIR Phase I 2013 Department of CommerceNational Institute of Standards and Technology
  10. WS-BD Conformant Handheld Multi-biometric Acquisition System

    SBC: Fulcrum Biometrics, LLC            Topic: 9010477TT

    Secure trusted biometric validation of identity has never been more important. The increase in global terrorism, unfettered identity theft and new legislation requiring multi-factor authentication are a few of the driving factors. The biometrics industry has not actively responded to the changing market conditions being driven by the explosion in mobile computing. Millions of new mobile devices ar ...

    SBIR Phase II 2013 Department of CommerceNational Institute of Standards and Technology
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