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Award Data
The Award database is continually updated throughout the year. As a result, data for FY24 is not expected to be complete until March, 2025.
Download all SBIR.gov award data either with award abstracts (290MB)
or without award abstracts (65MB).
A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.
The SBIR.gov award data files now contain the required fields to calculate award timeliness for individual awards or for an agency or branch. Additional information on calculating award timeliness is available on the Data Resource Page.
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A Multi-Representation Architecture for STEP AP-210-based PCB Stackup Design and Warpage Analysis
SBC: INTERCAX, LLC Topic: N/AThe objective of this Phase 1 effort is to demonstrate the feasibility of printed circuit assembly (PCA) warpage simulation through a novel combination of advanced AP210-based printed circuit board (PCB) simulation methods and cutting-edge general-purpose mesh generation tools. Our proposed solution, the extended multi-representation architecture (MRA), embodies an innovative approach that combine ...
SBIR Phase I 2005 Department of CommerceNational Institute of Standards and Technology -
Active Mixing of Polymers in a Dispensing Head
SBC: nScrypt, Inc. Topic: N/AA method to take three polymers with varying viscosities and mixing those polymers together at the point of interest or more specifically through a micro dispensing nozzle, is being proposed. An active mixing scheme to ensure proper mixing at the pen tip is a feasible approach to this problem. The materials being mixed will not only range in viscosity but also in particle loading, which will be ha ...
SBIR Phase I 2005 Department of CommerceNational Institute of Standards and Technology -
Ultra-High Vacuum Compatible Wavelength Dispersive X-ray Spectrometer
SBC: PARALLAX RESEARCH INC Topic: N/AParallax Research, Inc. proposes to build an Ultra-High Vacuum compatible Wavelength Dispersive X-ray Spectrometer (WDS) that can be used on small spot Auger, XPS, TEM and FESEM analytical instruments for elemental analysis. The effort draws upon Parallax's experience in designing WDS systems for Scanning Electron Microscopes (SEM) and for XRF. This new type of x-ray spectrometer will eliminate th ...
SBIR Phase II 2005 Department of CommerceNational Institute of Standards and Technology -
Distributed Automatic Reconifigurable Transponder (DART)
SBC: WILLIAMSRDM, INC. Topic: N/Ahis proposal focuses on developing Distributed Automatic Reconfigurable Trasponder (DART) system that is capable of achieving distributed multi-nodal voice/data communication for firefighters. Specifically, Williams-Pyro, Inc. proposes to develop an enhanced prototype of distributed Automated Reconfigurable Intelligent Radios, which consists of a series of distributed nodes that will relay voice t ...
SBIR Phase I 2005 Department of CommerceNational Institute of Standards and Technology -
Fulcrum Biometrics' Plan for Research and Development of WS-BD Conformant Handheld Fingerprint Sensor
SBC: Fulcrum Biometrics, LLC Topic: N/ATrusted biometric validation of individual identities has never been more important. Several contributing factors are the increase in global terrorism, identity theft and the increase in legislation which are driving the accelerated adoption of biometric technology. Unfortunately, the biometrics industry has not actively responded to the changing market conditions being driven by the explosion in ...
SBIR Phase I 2012 Department of CommerceNational Institute of Standards and Technology -
Precision 10 kV Programmable Voltage Source
SBC: Low Thermal Electronics, Inc. Topic: NALow Thermal Electronics, Inc. proposes to design a stand-alone, programmable voltage source capable of supplying precision voltages in the range of zero to 1,000 volts direct current (DC), with options for scaling up to 10,000 volts, and with a total expanded uncertainty (k=2) of less than 10uV/V for the 10,000 volt version. This instrument will improve state-of-the-art measurements in high resist ...
SBIR Phase I 2017 Department of CommerceNational Institute of Standards and Technology -
A Model-Based Solution to Improve the Accessibility and Affordability of Manufacturing System Simulations
SBC: MBSE Tools, Inc. Topic: NAThe vision is to provide decision-makers with effective, fast, and inexpensive analysis tools to answer "What-If" and "What-Should" questions about manufacturing systems. Value Stream Mapping (VSM) is a modeling methodology with widespread contemporary use in manufacturing, and our strategy is to start with VSM as a deployment beachhead for the eventual deployment of a more generic manufacturing s ...
SBIR Phase I 2017 Department of CommerceNational Institute of Standards and Technology -
Fiber Pigtailed On-Chip Mid-infrared Difference Frequency Generation in Silicon
SBC: OMEGA OPTICS, INC. Topic: NAWe propose a fiber-pigtailed strained silicon platform for tunable difference frequency generation (DFG) in mid-infrared (MIR) with tunable continuous wave near-infrared (NIR) sources. Stress exerted by silicon nitride induces second-order nonlinear susceptibility c(2) on underlying centro-symmetric silicon. NIR light is coupled into silicon and MIR light is coupled out of silicon using sub-wavele ...
SBIR Phase II 2017 Department of CommerceNational Institute of Standards and Technology -
Gap-Free Model-Based Engineering for Manufacturing and Analysis: Digital Thread without Translation
SBC: Nvariate, Inc. Topic: NoneModern Model-Based Enterprise / Engineering (MBE) systems rely on freeform surfaces built as complex combinations of geometric primitives to define engineered objects. Unfortunately, the intersection of freeform surfaces in MBE applications results in highly approximated solutions, degrading models that cost billions annually by US industry to fix. Current technology limits the abilities of users ...
SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology -
Advanced Manufacturing and Material Measurements Software Tool Weave ™ for the Acceleration and Automation of SEM Image Analysis in the Semiconductor Industry
SBC: Sandbox Semiconductor Incorporated Topic: NoneIn this Phase I SBIR proposal, SandBox Semiconductor™ proposes to develop an Advanced Manufacturing and Material Measurements software tool called Weave ™ for accelerating and automating SEM image analysis for the semiconductor industry. During the development of a new manufacturing process line for a semiconductor device, tens of thousands of scanning electron microscopy (SEM) images are take ...
SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology