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The Award database is continually updated throughout the year. As a result, data for FY24 is not expected to be complete until March, 2025.

Download all SBIR.gov award data either with award abstracts (290MB) or without award abstracts (65MB). A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.

The SBIR.gov award data files now contain the required fields to calculate award timeliness for individual awards or for an agency or branch. Additional information on calculating award timeliness is available on the Data Resource Page.

  1. Fiber Pigtailed On-Chip Mid-infrared Difference Frequency Generation in Silicon

    SBC: OMEGA OPTICS, INC.            Topic: NA

    We propose a fiber-pigtailed strained silicon platform for tunable difference frequency generation (DFG) in mid-infrared (MIR) with tunable continuous wave near-infrared (NIR) sources. Stress exerted by silicon nitride induces second-order nonlinear susceptibility c(2) on underlying centro-symmetric silicon. NIR light is coupled into silicon and MIR light is coupled out of silicon using sub-wavele ...

    SBIR Phase II 2017 Department of CommerceNational Institute of Standards and Technology
  2. Precision 10 kV Programmable Voltage Source

    SBC: Low Thermal Electronics, Inc.            Topic: NA

    Low Thermal Electronics, Inc. proposes to design a stand-alone, programmable voltage source capable of supplying precision voltages in the range of zero to 1,000 volts direct current (DC), with options for scaling up to 10,000 volts, and with a total expanded uncertainty (k=2) of less than 10uV/V for the 10,000 volt version. This instrument will improve state-of-the-art measurements in high resist ...

    SBIR Phase I 2017 Department of CommerceNational Institute of Standards and Technology
  3. 3-D Digital Image Correlation Based Non-Destructive Testing System for Qualification of Additive Manufacturing Parts

    SBC: X-Wave Innovations, Inc.            Topic: NA

    NIST's seeks a high resolution DIC technology for qualification of complex AM parts. To meet this critical need, X-wave Innovations Inc. proposes to develop a 3-Dimentional Digital Image Correlation (3-D DIC) based NDT system. The proposed effort builds upon the success of XII in developing a variety of NDT technologies (including DIC system) for advanced materials evaluation. The success of the p ...

    SBIR Phase I 2017 Department of CommerceNational Institute of Standards and Technology
  4. HLA Development Tools

    SBC: ACUSOFT, INC.            Topic: N/A

    AcuSoft proposes to develop a set of HLA Development Tools to assist simulation software developers in their efforts to implement the HLA. The HLA Development Tools will support the Federation Execution and Development Process (FEDEP) and present an approach to solving the problems associated with the HLA's flexible FOM data definitions. A set of data visualization tools, such as a 2D Plan View ...

    SBIR Phase I 1997 Department of DefenseOffice of the Secretary of Defense
  5. Research and Development of a Synthetic Environment RTI

    SBC: ACUSOFT, INC.            Topic: N/A

    AcuSoft proposes to research and develop a Synthetic Environment RTI (SE-RTI). The SEDRIS initiative has established a new programming paradigm that provides lossless transmission of synthetic environment objects. The HLA has been designed to support interoperability and reuse of DoD simulations, and SEDRIS is a major component of HLA. Currently, the SEDRIS data model, APIs and format are prima ...

    SBIR Phase I 1997 Department of DefenseOffice of the Secretary of Defense
  6. High Throughput Multiple Access Digital Wireless Communications

    SBC: AIMS, INC.            Topic: N/A

    We propose a radically innovative approach to the problem of multiple access communication which promises to revolutionize the modern communication industry by dramatically increasing network throughput. Our approach is based upon two major novel components: (i) hybrid time-frequency allication of communication channel resources, and(ii) non-orthogonal, i.e., overlaping, multiplexed signals. Toge ...

    SBIR Phase I 1996 Department of DefenseOffice of the Secretary of Defense
  7. Development of Visible Diode Lasers by Using I-III-VI2 Semiconductor

    SBC: APPLIED OPTRONICS CORP            Topic: N/A

    The proposed Phase 1 approach utilizes a material system, the I-III-VI2 compounds, for which some early success in the fabrication of laser devices and LEDs has been achieved in Japan. The benefits to this material include: ease in forming p-n junction, greater thermal conductivity, higher bond strength in the crystal, less thermal stresses and ease in making metal contacts. The proposed effort in ...

    SBIR Phase I 1997 Department of Commerce
  8. Adaptive Data Compression for Efficient File Transport Over Wireless Networks

    SBC: Artery Communication            Topic: N/A

    Because of the scarce network bandwidth available on the wireless links, data compression plays a critical role in the wireless system design. We propose to evaluate existing public-domain and commercial lossless data compression packages in the context of wireless networking. The specific criteria used include compression efficiency, compression speed, memory usage, and ease of being incorporat ...

    SBIR Phase I 1996 Department of DefenseOffice of the Secretary of Defense
  9. Advanced Six-Degree-of-Freedom (6-D) Laser Measurement System

    SBC: AUTOMATED PRECISION, INC.            Topic: N/A

    In order to remain competitive in today's global marketplace, U.S. manufacturers are constantly striving to hold tighter and tighter tolerances on the parts that they produce. What this means is that the manufacturer needs to better control the machines that they use, and in order to do that they need an instrument that can quickly and easily characterize the geometric properties of the machines ...

    SBIR Phase II 1997 Department of DefenseOffice of the Secretary of Defense
  10. A 3-D Machine Tool Error Modeling System

    SBC: AUTOMATED PRECISION, INC.            Topic: N/A

    In response to the increasing demand for better understanding of the manufacturing processes and the machining systems, a new testing standard--ASME B5.54 and a family of new testing instruments have been developed for evaluating the performances of a variety of CNC machining centers. Because of the advancement and versatility of the new instruments, test data are being collected at a much higher ...

    SBIR Phase I 1997 Department of Commerce
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