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Award Data
The Award database is continually updated throughout the year. As a result, data for FY24 is not expected to be complete until March, 2025.
Download all SBIR.gov award data either with award abstracts (290MB)
or without award abstracts (65MB).
A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.
The SBIR.gov award data files now contain the required fields to calculate award timeliness for individual awards or for an agency or branch. Additional information on calculating award timeliness is available on the Data Resource Page.
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Ultra-Wideband Voltage Controlled Oscillator with Multi-Mode Operations
SBC: ALPHACORE INC Topic: DMEA231006The U.S. Dept of Defense is seeking a low power (< 30mA @ 3V), US-sourced, ultra-wideband voltage-controlled oscillator (VCO). Fuzing applications that employ Height of Burst (HOB) sensors utilize specialized chipsets that set the operating range and output power for these systems, and different applications require specific parameters given operational environments, input power, form factor, etc. ...
SBIR Phase I 2023 Department of DefenseDefense Microelectronics Activity -
Near Atomic Spatial Resolution Electrical Characterization
SBC: SPM Labs LLC Topic: DMEA19B001The proposal “Down to Atomic Resolution Kelvin Probing of Integrated Circuits (DARK-PICs)” deals with improvement of Kelvin Force Microscopy (KFM) allowing detection/mapping of surface potential and related electric properties of semiconductors and integrated circuits at the atomic scale. This Phase I deals with the feasibility of developing a commercially KFM system with a spatial resolution ...
STTR Phase I 2020 Department of DefenseDefense Microelectronics Activity -
Advanced Predictive Modeling of Radiation Effects in ReRAM Devices based on electrical characterization augmented by imaging data
SBC: Desert Microtechnology Associates, Inc. Topic: 20A001In an effort to improve the design of radiation hardened electronic components, this proposal explores the feasibility of creating predictive modeling techniques for nanoscale material properties in advanced integrated electrical devices. This study encompasses the collaborative usage of high resolution Transmission Electron Microscope (HR-TEM) data, circuit design targeted electrical data, and ma ...
STTR Phase I 2020 Department of DefenseDefense Microelectronics Activity -
Predictive device modeling for radiation effects through machine learning
SBC: ALPHACORE INC Topic: 20A001Alphacore will evaluate and develop a new approach to multi-scale modeling of radiation effects in electronic device technologies based on novel material systems. Our approach aims to directly correlate nano-scale properties of novel materials systems with macro-scale electrical properties of devices constructed with those materials, and their radiation response. Radiation hardness assurance (RHA) ...
STTR Phase I 2020 Department of DefenseDefense Microelectronics Activity -
Backside Inspection Frontside Electrical Stimulation System
SBC: INFRARED LABORATORIES INC Topic: DMEA192D01Infrared Laboratories proposes a direct to phase II program for delivering an electrical stimulation system to be used with DMEA’s existing IREM backside inspection system. Our delivered system will operate using proven technology that we will develop to work with DMEA’s existing tool. The system will be capable of using probe cards as well as individual micro manipulated probe tips to stimula ...
SBIR Phase II 2020 Department of DefenseDefense Microelectronics Activity -
FEOL & BEOL PARTITIONING
SBC: ALPHACORE INC Topic: DMEA182002Alphacore proposes Dr. Yago Gonzalez-Velo as the principal investigator (PI) for this SBIR program. Dr. Gonzalez-Velo has experience ranging from radiation effects, characterization to implementation of novel technologies in the BEOL of CMOS circuits. Dr Gonzalez Velo has gained experience in BEOL layer design, as well as photolithography mask design, and MEMS manufacturing experience through dif ...
SBIR Phase I 2019 Department of DefenseDefense Microelectronics Activity -
Through-Lens Fiducial Marking System
SBC: INFRARED LABORATORIES INC Topic: DMEA172002Through-lens laser fiducial marking systems can greatly increase throughput of semiconductor Failure Analysis (FA) labs, that do not have access to CAD drawings of the devices they are trying to analyze. Creating fiducial marks at points of interest on a semiconductor device allows the device to move and be analyzed by different FA equipment easily and quickly. In Phase I, a suitable laser was ...
SBIR Phase II 2019 Department of DefenseDefense Microelectronics Activity -
Through-Lens Fiducial Marking System
SBC: INFRARED LABORATORIES INC Topic: DMEA172002Infrared emission microscope (IREM) systems are used to image active integrated circuits to analyze circuit function or locate manufacturing and design defects. IREM systems are able to directly image the operation of individual transistors or transistor groups that form logic gates. Depending on lenses used, an IREM system can resolve features smaller than 100 nm. Once an area of interest (AOI) i ...
SBIR Phase I 2018 Department of DefenseDefense Microelectronics Activity -
Machine Diagnostics System on a Chip
SBC: RIDGETOP GROUP INC Topic: DMEA102001Under this SBIR program, Ridgetop Group will introduce the first single-chip, low-cost, low-power, and lightweight data monitoring solution for applications on rotating machinery. To develop this innovative miniature data collection platform, Ridgetop proposes to: Provide a novel data collector using submicron integrated MEMS/CMOS fabrication processes Define a commercialization strategy ...
SBIR Phase I 2010 Department of DefenseDefense Microelectronics Activity