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The Award database is continually updated throughout the year. As a result, data for the given year is not complete until April of the following year. Annual Reports data is a snapshot of agency reported information for that year and hence might look different from the live data in the Awards Information charts.

  1. Terahertz Ellipsometry for Reflection-Mode Material Characterization

    SBC: J. A. Woollam Co., Inc.            Topic: A08T013

    As technologies utilizing THz radiation (light) develop, the optical properties for many materials need to be determined accurately as a function of frequency in a variety of applications including: THz threat detection and security screening applications

    STTR Phase II 2009 Department of DefenseArmy

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