Award Data

In an effort to improve the design of radiation hardened electronic components, this proposal explores the feasibility of creating predictive modeling techniques for nanoscale material properties in advanced integrated electrical devices. This study encompasses the collaborative usage of high resolution Transmission Electron Microscope (HR-TEM) data, circuit design targeted electrical data, and ma ...

High-resolution, transmission electron microscope, electron beam induced current, EBIC, STEM EBIC, temperature, thermometry

Advanced semiconductor devices are the beating heart of 21st Century technology.The mission critical role that these devices play demands exceptional levels of reliability.When a semiconductor device does fails, it is essential that the cause of the failure is identified as quickly as possible.Because a devices chip is encapsulated in a thermoplastic package, a significant amount of intricate mate ...

Advanced semiconductor devices form the heart of 21st Century technologies. The mission-critical role that these devices play demands exceptional levels of reliability. When a semiconductor device does fail, it is essential that the cause of the failure is identified as quickly as possible, Because of the daunting complexity of an integrated circuit, a significant amount of intricate material rem ...

There exists currently a need to non-destructively evaluate the construction of integrated circuits (ICs) that will ensure the trust of ICs used inmilitary systems, but designed and fabricated under untrusted conditions. An X-ray microscope (XRM) equipped with a lab X-ray source will beused to fill this need. The drawbacks to this system are prohibitively long acquisition times due to reduced X-ra ...

Tangent Sciences develops XRadIC as an automated software framework to non-destructively analyze cutting edge microelectronics using photonflux-limited x-ray microscope systems. XRadIC couples on-the-fly sample scanning with online optimized 2D and 3D image analysis algorithms tomaximize overall system throughput by dynamically minimizing the number of viewing angles and exposure times needed to a ...

XRadIC establishes an automated software framework to non-destructively analyze cutting edge microelectronics using photon flux-limited x-ray microscope systems. XRadIC couples on-the-fly sample scanning with online optimized 2D and 3D image analysis algorithms to maximize overall system throughput by dynamically minimizing the number of viewing angles and exposure times needed to analyze a given ...

Alitheon proposes a study of the feasibility of the use of its FeaturePrintTM technology to ensure the authenticity and security of microelectronics parts used in weapons systems.

The transmission electron microscope (TEM) is the standard high resolution tool for imaging microelectronics. Despite its impressive sensitivity to physical structure (the type, number, and arrangement of atoms), TEM is remarkably inept at detecting electronic and thermal signals, even when equipped with expensive spectroscopic attachments. Electronic and thermal structure determines device functi ...

FPGA units in security-sensitive applications need secure manufacturing & configuration methods to combat supply chain interdiction and compromise by adversaries, with robust Third-Party IP provenance traceability. The proposed solution uniquely meets this need with a State of the Art blockchain implementation to build a fit-for-purpose supply chain blockchain (SCBC) optimized for DMEA’s FPGA  ...