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Award Data

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The Award database is continually updated throughout the year. As a result, data for FY21 is not expected to be complete until September, 2022.

Download all SBIR.gov award data either with award abstracts (290MB) or without award abstracts (65MB). A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.

  1. N/A

    SBC: EIC LABORATORIES, INC.            Topic: N/A

    N/A

    SBIR Phase I 2000 Department of DefenseOffice for Chemical and Biological Defense
  2. N/A

    SBC: Entropic Systems, Inc.            Topic: N/A

    N/A

    SBIR Phase I 2000 Department of DefenseOffice for Chemical and Biological Defense
  3. Extrusion Cast Cost Effective Chemical Protective

    SBC: Federal-Fabrics-Fibers, Inc.            Topic: N/A

    N/A

    SBIR Phase II 2000 Department of DefenseOffice for Chemical and Biological Defense
  4. N/A

    SBC: ICET, INC            Topic: N/A

    N/A

    SBIR Phase I 2000 Department of DefenseOffice for Chemical and Biological Defense
  5. N/A

    SBC: Mattek Corporation            Topic: N/A

    N/A

    SBIR Phase I 2000 Department of DefenseOffice for Chemical and Biological Defense
  6. Infrared Standoff Bio-Agent Discrimination

    SBC: Physical Sciences Inc.            Topic: N/A

    N/A

    SBIR Phase II 2000 Department of DefenseOffice for Chemical and Biological Defense
  7. N/A

    SBC: Physical Sciences Inc.            Topic: N/A

    N/A

    SBIR Phase I 2000 Department of Commerce
  8. N/A

    SBC: Q-PEAK INCORPORATED            Topic: N/A

    N/A

    SBIR Phase I 2000 Department of DefenseOffice for Chemical and Biological Defense
  9. N/A

    SBC: Yankee Environmental Systems, Inc.            Topic: N/A

    N/A

    SBIR Phase I 2000 Department of Commerce
  10. NANOMETER-SIZE STEP HEIGHT TEST STRUCTURES

    SBC: Advanced Technologies/Laboratories Intl            Topic: N/A

    MCNC PROPOSES A FEASIBILITY STUDY AND EVALUATION OF THREE PROMISING APPROACHES TO THE FABRICATION OF SURFACE TEST STRUCTURES ON SILICON. SURFACE FEATURES ON THE FIRST STRUCTURE WILL BE PRODUCED BY CONTROLLABLY ETCHING THERMALLYGROWN OXIDES. FEATURES ON THE SECOND WILL BE MADE BY ETCHING PIEZOELECTRIC THIN FILMS. USING THE PIEZOELECTRIC FILM AS PART OF A CAPACITOR, STEP-HEIGHT CAN BE VARIED AND PRO ...

    SBIR Phase I 1992 Department of Commerce
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