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Award Data
The Award database is continually updated throughout the year. As a result, data for FY24 is not expected to be complete until March, 2025.
Download all SBIR.gov award data either with award abstracts (290MB)
or without award abstracts (65MB).
A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.
The SBIR.gov award data files now contain the required fields to calculate award timeliness for individual awards or for an agency or branch. Additional information on calculating award timeliness is available on the Data Resource Page.
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Continuous Monitoring of Natural Gas Infrastructure for Increased Community Resilience using Voltammetric Sensors
SBC: FULLMOON SENSORS, INC. Topic: NoneFullmoon has the first chip-level sensors capable of identifying and quantifying molecules in the air. At the core of our technology are printed voltammetric sensors, which are operated using cyclic voltammetry, an electrochemical technique that probes for the redox potential, a unique signature of molecules. We have demonstrated this sensing principle for the detection of carbon monoxide and meth ...
SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology -
Gap-Free Model-Based Engineering for Manufacturing and Analysis: Digital Thread without Translation
SBC: Nvariate, Inc. Topic: NoneModern Model-Based Enterprise / Engineering (MBE) systems rely on freeform surfaces built as complex combinations of geometric primitives to define engineered objects. Unfortunately, the intersection of freeform surfaces in MBE applications results in highly approximated solutions, degrading models that cost billions annually by US industry to fix. Current technology limits the abilities of users ...
SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology -
Compact Raman Fiber Optic Probe with Inline Spectral Filtering
SBC: NIKIRA LABS INC. Topic: NoneIn this Small Business Innovative Research (SBIR) effort, Nikira Labs Inc. proposes to develop a compact Raman fiber optic probe with inline spectral filtering that improves fiber-coupled Raman measurements by filtering out Raman scattering from the excitation fiber and elastically scattered laser light from the collection fibers. The technology will enable compact fiber probes for Raman studies i ...
SBIR Phase II 2019 Department of CommerceNational Institute of Standards and Technology -
IF Conversion System for High-Bandwidth Multiplexed Sensors Arrays
SBC: ALPHACORE INC Topic: NoneAlphacore will develop an Intermediate Frequency (IF) Conversion System for High-Bandwidth Multiplexed Sensors Arrays for Phase II of NIST's 2018 soliciation for Exploratory Measurement Science Topic 9.04.02.68.The proposing team has already successfully developed and evaluated a prototype board in Phase I.The goal in Phase II is therefore to achieve three primary objectives:1) Optimize the design ...
SBIR Phase II 2019 Department of CommerceNational Institute of Standards and Technology -
Direct Performance Evaluation of Additive Manufacturing Process Plans
SBC: INTACT SOLUTIONS, INC Topic: NoneAdditive manufacturing is steadily advancing towards fulfilling its promise of customized and on-demand production of functional parts. However, performance of as-manufactured parts can differ significantly from the as-designed parts because the as-manufactured geometry differs from the as-designed geometry and the asmanufactured material properties are not known. Attempts to predict performance o ...
SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology -
Advanced Manufacturing and Material Measurements Software Tool Weave ™ for the Acceleration and Automation of SEM Image Analysis in the Semiconductor Industry
SBC: Sandbox Semiconductor Incorporated Topic: NoneIn this Phase I SBIR proposal, SandBox Semiconductor™ proposes to develop an Advanced Manufacturing and Material Measurements software tool called Weave ™ for accelerating and automating SEM image analysis for the semiconductor industry. During the development of a new manufacturing process line for a semiconductor device, tens of thousands of scanning electron microscopy (SEM) images are take ...
SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology -
Multimode Chiroptical Spectrometer for Nanoparticle Characterization
SBC: APPLIED NANOFLUORESCENCE, LLC Topic: NoneThis project will develop a new scientific instrument optimized for the advanced characterization of near-infrared fluorescent nanoparticles that can exist as left- or right-handed structures (enantiomers). Single-walled carbon nanotubes (SWCNTs) are the leading current example of such nanomaterials. Applied NanoFluorescence, LLC (ANF) proposes a novel multi-mode chiroptical spectrometer that can ...
SBIR Phase II 2019 Department of CommerceNational Institute of Standards and Technology -
Development of a High Sensitivity Laser-Induced Incandescence Instrument for Characterizing Soot and Carbanaceous Particles
SBC: ARTIUM TECHNOLOGIES, INC. Topic: N/AA high sensitivity laser-induced incandescence system is proposed for the detailed characterization of environmental soot. Specifically, innovative approaches have been proposed to (1) reduce the lower detection limit of soot volume fraction and increase the overall measurement range by an order of magnitude from what is currently achievable, and (2) provide PM particle size and number density mea ...
SBIR Phase I 2005 Department of CommerceNational Institute of Standards and Technology -
Active Mixing of Polymers in a Dispensing Head
SBC: nScrypt, Inc. Topic: N/AA method to take three polymers with varying viscosities and mixing those polymers together at the point of interest or more specifically through a micro dispensing nozzle, is being proposed. An active mixing scheme to ensure proper mixing at the pen tip is a feasible approach to this problem. The materials being mixed will not only range in viscosity but also in particle loading, which will be ha ...
SBIR Phase I 2005 Department of CommerceNational Institute of Standards and Technology -
Ultra-High Vacuum Compatible Wavelength Dispersive X-ray Spectrometer
SBC: PARALLAX RESEARCH INC Topic: N/AParallax Research, Inc. proposes to build an Ultra-High Vacuum compatible Wavelength Dispersive X-ray Spectrometer (WDS) that can be used on small spot Auger, XPS, TEM and FESEM analytical instruments for elemental analysis. The effort draws upon Parallax's experience in designing WDS systems for Scanning Electron Microscopes (SEM) and for XRF. This new type of x-ray spectrometer will eliminate th ...
SBIR Phase II 2005 Department of CommerceNational Institute of Standards and Technology