Award Data

For best search results, use the search terms first and then apply the filters
Reset

The Award database is continually updated throughout the year. As a result, data for FY19 is not expected to be complete until September, 2020.

  1. Automated pattern recognition methods to identify nuclear explosions

    SBC: Acorn Science & Innovation, Inc.            Topic: DTRA182005

    Reliable automated pattern recognition in the current system is limited by excessive noise and clutter combined with insufficient and/or ambiguous features. Our team consisting of AcornSI and Leidos thus propose a multi-step approach based on the combined effects of improved detection, feature extraction, phase identification, and global association.A key innovation here is creating a new classifi ...

    SBIR Phase I 2019 Department of DefenseDefense Threat Reduction Agency
  2. Advanced Manufacturing and Material Measurements Software Tool Weave ™ for the Acceleration and Automation of SEM Image Analysis in the Semiconductor Industry

    SBC: Sandbox Semiconductor Incorporated            Topic: None

    In this Phase I SBIR proposal, SandBox Semiconductor™ proposes to develop an Advanced Manufacturing and Material Measurements software tool called Weave ™ for accelerating and automating SEM image analysis for the semiconductor industry. During the development of a new manufacturing process line for a semiconductor device, tens of thousands of scanning electron microscopy (SEM) images are take ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
  3. Nanomachine Device for Semiconductor Process Control Monitoring

    SBC: Xallent LLC            Topic: None

    Conventional characterization and test methods are increasingly ineffective when applied to structures less than 100 nanometers, causing challenges across R&D, process control and failure analysis. An increasing number of subtle defects become prominent drivers of failure as device size and operating margins decrease, e.g., processing anomalies in thin gate oxides, substrate problems related to do ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
  4. Gap-Free Model-Based Engineering for Manufacturing and Analysis: Digital Thread without Translation

    SBC: Nvariate, Inc.            Topic: None

    Modern Model-Based Enterprise / Engineering (MBE) systems rely on freeform surfaces built as complex combinations of geometric primitives to define engineered objects. Unfortunately, the intersection of freeform surfaces in MBE applications results in highly approximated solutions, degrading models that cost billions annually by US industry to fix. Current technology limits the abilities of users ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
  5. Easy-to-use, Autonomous Bin-picking and Assembly Operations for the Manufacturing Industry

    SBC: Robotic Materials Inc.            Topic: None

    We will develop a series of object manipulation primitives to pick up and assemble standard mechanical parts such as screws, gears and pulleys that can be configured without any programming skills. Building up on a smart robotic gripper, 3D perception and machine learning algorithms, we will design a graphical user interface for the Universal Robot E-Series that allows an user to label arbitrary 3 ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
  6. Multimode Chiroptical Spectrometer for Nanoparticle Characterization

    SBC: Applied Nanofluorescence LLC            Topic: None

    This project will develop a new scientific instrument optimized for the advanced characterization of near-infrared fluorescent nanoparticles that can exist as left- or right-handed structures (enantiomers). Single-walled carbon nanotubes (SWCNTs) are the leading current example of such nanomaterials. Applied NanoFluorescence, LLC (ANF) proposes a novel multi-mode chiroptical spectrometer that can ...

    SBIR Phase II 2019 Department of CommerceNational Institute of Standards and Technology
  7. ANALYSIS OF HANE 0-10 SECOND MHD EMP

    SBC: AUSTIN RESEARCH ASSOCIATES            Topic: N/A

    MODELING OF THE AMBIENT AND PROMPT IONOSPHERIC REGIONS IN A THIN LAYER APPROXIMATION ALLOWS AN EFFICIENT METHOD OF DETERMINING THE TIME EVOLUTION, PROPAGATION, AND SIGNAL STRENGTH OF THE 0-10 SECOND MHD EMP ASSOCIATED WITH HIGH ALTITUDE NUCLEAR DETONATIONS.

    SBIR Phase II 1987 Department of DefenseDefense Threat Reduction Agency
  8. ANALYSIS OF NUCLEAR WEAPONS EFFECTS ON STRATEGIC STRUCTURES

    SBC: Engineering & Economics Rsrch            Topic: N/A

    SUBSTANTIAL PROGRESS HAS BEEN MADE IN RECENT YEARS TO DEVELOP AND VALIDATE MODELS WHICH CAN PREDICT THE PHYSICAL EFFECTS OF NUCLEAR WEAPONS ON STRATEGIC STRUCTURES. SIGNIFICANT UNCERTAINTIES REMAIN, HOWEVER, IN THE CONFIDENCE LEVELS ATTRIBUTABLE TO THESE PREDICTIVE CAPABILITIES. THIS APPROACH WOULD IDENTIFY AND PRIORITIZE THOSE ACTIVITIES, ALONG WITH THEIR ASSOCIATED BUDGETARY AND SCHEDULING CONSI ...

    SBIR Phase I 1987 Department of DefenseDefense Threat Reduction Agency
  9. RESONANT HOLOGRAPHY TO STUDY PLASMA EROSION OPENING SWITCHES DEVELOPMENT

    SBC: HY-Tech Research Corp.            Topic: N/A

    THE SPATIALLY RESOLVED PLASMA DISTRIBUTION BETWEEN THE ELECTRODES OF A PLASMA EROSION OPENING SWITCH (PEOS) DURING THE CLOSED AND OPENING PHASES OF THE SWITCH IS NEEDED TO UNDERSTAND SWITCH OPERATION. CONVENTIONAL HOLOGRAPHIC TECHNIQUES ARE NOT SUFFICIENTLY SENSITIVE TO STUDY THE 10 TO THE 13TH POWER/3CM PLASMA ENCOUNTERED HERE, AND ARRAYS OF LANGMUIR PROBES ARE REQUIRED TO OBTAIN SPATIALLY RESOLV ...

    SBIR Phase II 1987 Department of DefenseDefense Threat Reduction Agency
  10. LASER INDUCED FLUORESCENCE MEASUREMENTS OF MAGNETIC FIELD CONTOURS IN HIGH CURRENT DEVICES

    SBC: HY-Tech Research Corp.            Topic: N/A

    THE DISTRIBUTION OF THE MAGNETIC FIELD IN A HIGH CURRENT PLASMA DEVICE PROVIDES IMPORTANT INFORMATION ABOUT THE DEVICES OPERATION. TRADITIONAL FARADAY ROTATION, ZEEMAN EMISSION SPECTROSCOPY, AND MAGNETIC PROBE TECHNIQUES SUFFER FROM POOR SPATIAL RESOLUTION BECAUSE THE MAGNETIC FIELD EFFECT IS INTEGRATED ALONG THE LINE OF SIGHT FOR THE OPTICAL TECHNIQUE AND THE PROBES PERTURB THE PLASMAS. A LASER I ...

    SBIR Phase I 1987 Department of DefenseDefense Threat Reduction Agency
US Flag An Official Website of the United States Government