Award Data

For best search results, use the search terms first and then apply the filters
Reset

The Award database is continually updated throughout the year. As a result, data for FY19 is not expected to be complete until September, 2020.

  1. Advanced Manufacturing and Material Measurements Software Tool Weave ™ for the Acceleration and Automation of SEM Image Analysis in the Semiconductor Industry

    SBC: Sandbox Semiconductor Incorporated            Topic: None

    In this Phase I SBIR proposal, SandBox Semiconductor™ proposes to develop an Advanced Manufacturing and Material Measurements software tool called Weave ™ for accelerating and automating SEM image analysis for the semiconductor industry. During the development of a new manufacturing process line for a semiconductor device, tens of thousands of scanning electron microscopy (SEM) images are take ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
  2. Nanomachine Device for Semiconductor Process Control Monitoring

    SBC: Xallent LLC            Topic: None

    Conventional characterization and test methods are increasingly ineffective when applied to structures less than 100 nanometers, causing challenges across R&D, process control and failure analysis. An increasing number of subtle defects become prominent drivers of failure as device size and operating margins decrease, e.g., processing anomalies in thin gate oxides, substrate problems related to do ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
  3. Gap-Free Model-Based Engineering for Manufacturing and Analysis: Digital Thread without Translation

    SBC: Nvariate, Inc.            Topic: None

    Modern Model-Based Enterprise / Engineering (MBE) systems rely on freeform surfaces built as complex combinations of geometric primitives to define engineered objects. Unfortunately, the intersection of freeform surfaces in MBE applications results in highly approximated solutions, degrading models that cost billions annually by US industry to fix. Current technology limits the abilities of users ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
  4. Easy-to-use, Autonomous Bin-picking and Assembly Operations for the Manufacturing Industry

    SBC: Robotic Materials Inc.            Topic: None

    We will develop a series of object manipulation primitives to pick up and assemble standard mechanical parts such as screws, gears and pulleys that can be configured without any programming skills. Building up on a smart robotic gripper, 3D perception and machine learning algorithms, we will design a graphical user interface for the Universal Robot E-Series that allows an user to label arbitrary 3 ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
  5. Multimode Chiroptical Spectrometer for Nanoparticle Characterization

    SBC: Applied Nanofluorescence LLC            Topic: None

    This project will develop a new scientific instrument optimized for the advanced characterization of near-infrared fluorescent nanoparticles that can exist as left- or right-handed structures (enantiomers). Single-walled carbon nanotubes (SWCNTs) are the leading current example of such nanomaterials. Applied NanoFluorescence, LLC (ANF) proposes a novel multi-mode chiroptical spectrometer that can ...

    SBIR Phase II 2019 Department of CommerceNational Institute of Standards and Technology
  6. Vacuum Windows for Third Generation Syschrotron Radiation Beamlines

    SBC: Advanced Design Consulting USA, Inc.            Topic: N/A

    Improving the quality and intensity of the x-ray beam is an important design goal for every synchrotron installation. Although small, the effects of vacuum windows on x-ray absorption and phase contrast cannot be neglected. Synchrotron x-rays have wavelengths on the order of one Angstrom (1 x 10-10m), the same order of magnitude as inter-atomic distances. These x-rays are used to study many differ ...

    SBIR Phase I 2003 Department of CommerceNational Institute of Standards and Technology
  7. Low Damage Ion Beam Etching Technique and Method for Compositional Profiling of Thin Multilayer Films

    SBC: 4WAVE, INC.            Topic: N/A

    Thin film multilayers of nanometer scale thickness are fundamental to the future of electronics and communications technologies. Chemical depth profiling by ion etching techniques are critical to the characterization of these structures. A fundamental problem with current ion etching technologies is that typical ion energies (~1k eV to 20 keV) create extensive damage and intermixing of nanometer t ...

    SBIR Phase I 2003 Department of CommerceNational Institute of Standards and Technology
  8. Development of UltrastableTi:sapphire Lasers for Optical Clock and Spectroscopy Applications

    SBC: Kapteyn-Murnane Laboratories, Inc.            Topic: N/A

    This Small Business Innovation Research Phase 1 project proposes to develop a femtosecond laser system optimized for optical clocks and other precision metrology applications. In principle, atomic optical transitions have the potential to provide radically higher-accuracy timekeeping, because of the very high frequency of an optical transition. The problem of counting, or down-counting, the oscill ...

    SBIR Phase I 2003 Department of CommerceNational Institute of Standards and Technology
  9. Advanced Tools for Process Specification Language

    SBC: KNOWLEDGE BASED SYSTEMS, INC.            Topic: N/A

    This project will (i) extend and harden the PSL Editor and the Ontology-Driven XSLT Generator (ODXG) tools and (ii) extend the process description syntax (PDS) derived from the PSL for both KIF and XML/RDF formats. In addition, we will extend the PSL metatheoretical framework to support the PDS and the PSL tools by providing PSL extensions to support calendars and activity specialization, and by d ...

    SBIR Phase II 2003 Department of CommerceNational Institute of Standards and Technology
  10. PSL-based Process Knowledge Integration and Management Framework

    SBC: KNOWLEDGE BASED SYSTEMS, INC.            Topic: N/A

    We propose to develop a robust framework, called the Process Knowledge Integration and Management Framework (PKIMF), to support the complete lifecycle of enterprise process knowledge that natively use the Process Specification Language (PSL). PKIMF uses a dashboard approach to design, analyze, integrate, exchange, and manage process knowledge. Its features and capabilities include the use of a pro ...

    SBIR Phase I 2003 Department of CommerceNational Institute of Standards and Technology
US Flag An Official Website of the United States Government