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Award Data
The Award database is continually updated throughout the year. As a result, data for FY24 is not expected to be complete until March, 2025.
Download all SBIR.gov award data either with award abstracts (290MB)
or without award abstracts (65MB).
A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.
The SBIR.gov award data files now contain the required fields to calculate award timeliness for individual awards or for an agency or branch. Additional information on calculating award timeliness is available on the Data Resource Page.
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Gap-Free Model-Based Engineering for Manufacturing and Analysis: Digital Thread without Translation
SBC: Nvariate, Inc. Topic: NoneModern Model-Based Enterprise / Engineering (MBE) systems rely on freeform surfaces built as complex combinations of geometric primitives to define engineered objects. Unfortunately, the intersection of freeform surfaces in MBE applications results in highly approximated solutions, degrading models that cost billions annually by US industry to fix. Current technology limits the abilities of users ...
SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology -
Easy-to-use, Autonomous Bin-picking and Assembly Operations for the Manufacturing Industry
SBC: Robotic Materials Inc. Topic: NoneWe will develop a series of object manipulation primitives to pick up and assemble standard mechanical parts such as screws, gears and pulleys that can be configured without any programming skills. Building up on a smart robotic gripper, 3D perception and machine learning algorithms, we will design a graphical user interface for the Universal Robot E-Series that allows an user to label arbitrary 3 ...
SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology -
Advanced Manufacturing and Material Measurements Software Tool Weave ™ for the Acceleration and Automation of SEM Image Analysis in the Semiconductor Industry
SBC: Sandbox Semiconductor Incorporated Topic: NoneIn this Phase I SBIR proposal, SandBox Semiconductor™ proposes to develop an Advanced Manufacturing and Material Measurements software tool called Weave ™ for accelerating and automating SEM image analysis for the semiconductor industry. During the development of a new manufacturing process line for a semiconductor device, tens of thousands of scanning electron microscopy (SEM) images are take ...
SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology -
Nanomachine Device for Semiconductor Process Control Monitoring
SBC: XALLENT INC. Topic: NoneConventional characterization and test methods are increasingly ineffective when applied to structures less than 100 nanometers, causing challenges across R&D, process control and failure analysis. An increasing number of subtle defects become prominent drivers of failure as device size and operating margins decrease, e.g., processing anomalies in thin gate oxides, substrate problems related to do ...
SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology -
Multimode Chiroptical Spectrometer for Nanoparticle Characterization
SBC: APPLIED NANOFLUORESCENCE, LLC Topic: NoneThis project will develop a new scientific instrument optimized for the advanced characterization of near-infrared fluorescent nanoparticles that can exist as left- or right-handed structures (enantiomers). Single-walled carbon nanotubes (SWCNTs) are the leading current example of such nanomaterials. Applied NanoFluorescence, LLC (ANF) proposes a novel multi-mode chiroptical spectrometer that can ...
SBIR Phase II 2019 Department of CommerceNational Institute of Standards and Technology -
Intelligent Agent Toolset for 4D/RCS Architectures
SBC: 21ST CENTURY SYSTEMS, INC. Topic: N/AThere is an increasing demand for systems with more autonomous operations interacting with other autonomous and human-based systems. What is needed is an architecture bundled with developer tools for the creation of intelligent real-time control systems that marry the talents of modern control theory, software technology, sensory processing, and semantic knowledge representations. It would be a st ...
SBIR Phase I 2006 Department of CommerceNational Institute of Standards and Technology -
A Multi-Representation Architecture for STEP AP210-based PCB Stackup Design and Warpage Analysis
SBC: INTERCAX, LLC Topic: N/AThis effort creates foundations for highly automated simulation tools that predict warpage in printed circuit boards and assemblies (PCAs/PCBs) and chip packages. Our technique, MHS, provides core capabilities to automate warpage and other problems that were impractical until now. MHS extends a multi-representation approach the PI first conceived at Georgia Tech for CAD-CAE interoperability. This ...
SBIR Phase II 2006 Department of CommerceNational Institute of Standards and Technology -
Multi-user Collaborative Tools for Immersive Scientific Visualization
SBC: OPEN TECH, INC. Topic: N/AOpen Tech will create an interactive multi-user collaboration product for immersive and desktop scientific visualization. This product will leverage our Virtual Reality Windowing Library to enable an easy to use collaboration interface that includes user lists, radars, maps, avatars, white boards, and virtual presentations. The product will also contain a software framework that enables developers ...
SBIR Phase II 2006 Department of CommerceNational Institute of Standards and Technology -
Distributed Automatic Reconfigurable Transponder (DART)
SBC: WILLIAMSRDM, INC. Topic: N/AWilliams-Pyro, Inc. (WPI) has designed and successfully demonstrated a proof-of-concept of the Distributed Automatic Reconfigurable Transponder (DART) that will be capable of achieving distributed multi-nodal voice/data communication for fire fighters. In Phase 2 we will focus on developing a fully functional system that reduces communication failure while maintaining a robust and flexible system. ...
SBIR Phase II 2006 Department of CommerceNational Institute of Standards and Technology