Award Data

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The Award database is continually updated throughout the year. As a result, data for FY19 is not expected to be complete until September, 2020.

  1. Advanced Manufacturing and Material Measurements Software Tool Weave ™ for the Acceleration and Automation of SEM Image Analysis in the Semiconductor Industry

    SBC: Sandbox Semiconductor Incorporated            Topic: None

    In this Phase I SBIR proposal, SandBox Semiconductor™ proposes to develop an Advanced Manufacturing and Material Measurements software tool called Weave ™ for accelerating and automating SEM image analysis for the semiconductor industry. During the development of a new manufacturing process line for a semiconductor device, tens of thousands of scanning electron microscopy (SEM) images are take ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
  2. Nanomachine Device for Semiconductor Process Control Monitoring

    SBC: Xallent LLC            Topic: None

    Conventional characterization and test methods are increasingly ineffective when applied to structures less than 100 nanometers, causing challenges across R&D, process control and failure analysis. An increasing number of subtle defects become prominent drivers of failure as device size and operating margins decrease, e.g., processing anomalies in thin gate oxides, substrate problems related to do ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
  3. Gap-Free Model-Based Engineering for Manufacturing and Analysis: Digital Thread without Translation

    SBC: Nvariate, Inc.            Topic: None

    Modern Model-Based Enterprise / Engineering (MBE) systems rely on freeform surfaces built as complex combinations of geometric primitives to define engineered objects. Unfortunately, the intersection of freeform surfaces in MBE applications results in highly approximated solutions, degrading models that cost billions annually by US industry to fix. Current technology limits the abilities of users ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
  4. Easy-to-use, Autonomous Bin-picking and Assembly Operations for the Manufacturing Industry

    SBC: Robotic Materials Inc.            Topic: None

    We will develop a series of object manipulation primitives to pick up and assemble standard mechanical parts such as screws, gears and pulleys that can be configured without any programming skills. Building up on a smart robotic gripper, 3D perception and machine learning algorithms, we will design a graphical user interface for the Universal Robot E-Series that allows an user to label arbitrary 3 ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
  5. Multimode Chiroptical Spectrometer for Nanoparticle Characterization

    SBC: Applied Nanofluorescence LLC            Topic: None

    This project will develop a new scientific instrument optimized for the advanced characterization of near-infrared fluorescent nanoparticles that can exist as left- or right-handed structures (enantiomers). Single-walled carbon nanotubes (SWCNTs) are the leading current example of such nanomaterials. Applied NanoFluorescence, LLC (ANF) proposes a novel multi-mode chiroptical spectrometer that can ...

    SBIR Phase II 2019 Department of CommerceNational Institute of Standards and Technology
  6. Silicon Carbide Avalanche Photodiodes for Single-photon Direct Detection of Lyman-alpha Radiation

    SBC: Aymont Technology, Inc.            Topic: N/A

    In the proposed Phase I SBIR program, Aymont Technology and CoolCAD Electronics will design and demonstrate prototype silicon carbide (SiC) avalanche photodiodes (APD) specifically designed for high-efficiency, single-photon counting of 121.6 nm Lyman-alpha photons. This detector will be provided to relevant personnel at NIST for calibration and testing. Both discrete APDs and arrays will be used ...

    SBIR Phase I 2009 Department of CommerceNational Institute of Standards and Technology
  7. Visible Hyperspectral Image Projector Based on Spatial Light Modulators

    SBC: Boulder Nonlinear Systems, Inc.            Topic: N/A

    There are many applications for hyperspectral image detectors, but for the detectors to be widely accepted standardized calibration protocols must be developed. This research aims to bridge this gap through the development of a commercially available hyperspectral image projector (HIP) system. The proposed effort is to build a prototype visible HIP system to generate calibrated, realistic imagery ...

    SBIR Phase II 2009 Department of CommerceNational Institute of Standards and Technology
  8. Refreshable Locking Tactile Image Array for Accessibility

    SBC: E L I A Life Technology Inc            Topic: N/A

    This is an SBIR Phase II proposal to develop a tactile refreshable computer display prototype (TRCD) that will support multiple tactile alphabets (e.g. ELIA, braille, and Roman), multiple lines of text, and graphics to benefit the more than 1.8 million blind Americans. Commercially available TRCDs are expensive (~$12,000, or $19 per actuator), provide only one line of text (with 640 actuators) and ...

    SBIR Phase II 2009 Department of CommerceNational Institute of Standards and Technology
  9. Time Synchronization of Wireless Sensor Networks

    SBC: ESENSORS INC.            Topic: N/A

    A wireless sensor and actuator network capable of providing precision time synchronization between the nodes of the network will be developed. The IEEE 1451.0 smart transducer interface and IEEE 1588 time synchronization standards will be combined, with additional software and hardware to provide synchronization between the clocks on the Wireless Transducer Interface Modules (WTIM) sensors/actuato ...

    SBIR Phase I 2009 Department of CommerceNational Institute of Standards and Technology
  10. Kilopixel Array Cryostat (KPAC) System for Mulit-kilogram Transition Edge Sensor (TES) Arrays

    SBC: High Precision Devices, Inc.            Topic: N/A

    Transition Edge Sensor (TES) detector development at NIST has reached a level where arrays containing several thousand pixels (kilopixels) are practical and , indeed, necessary for fielding systems required for many industrial, research, and homeland security applications. Current easily deployable cryostat technology required to reach the ultra-cold operating temperatures of TES arrays (50 to 100 ...

    SBIR Phase II 2009 Department of CommerceNational Institute of Standards and Technology
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