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The Award database is continually updated throughout the year. As a result, data for FY24 is not expected to be complete until March, 2025.

Download all SBIR.gov award data either with award abstracts (290MB) or without award abstracts (65MB). A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.

The SBIR.gov award data files now contain the required fields to calculate award timeliness for individual awards or for an agency or branch. Additional information on calculating award timeliness is available on the Data Resource Page.

  1. Gap-Free Model-Based Engineering for Manufacturing and Analysis: Digital Thread without Translation

    SBC: Nvariate, Inc.            Topic: None

    Modern Model-Based Enterprise / Engineering (MBE) systems rely on freeform surfaces built as complex combinations of geometric primitives to define engineered objects. Unfortunately, the intersection of freeform surfaces in MBE applications results in highly approximated solutions, degrading models that cost billions annually by US industry to fix. Current technology limits the abilities of users ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
  2. Easy-to-use, Autonomous Bin-picking and Assembly Operations for the Manufacturing Industry

    SBC: Robotic Materials Inc.            Topic: None

    We will develop a series of object manipulation primitives to pick up and assemble standard mechanical parts such as screws, gears and pulleys that can be configured without any programming skills. Building up on a smart robotic gripper, 3D perception and machine learning algorithms, we will design a graphical user interface for the Universal Robot E-Series that allows an user to label arbitrary 3 ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
  3. Advanced Manufacturing and Material Measurements Software Tool Weave ™ for the Acceleration and Automation of SEM Image Analysis in the Semiconductor Industry

    SBC: Sandbox Semiconductor Incorporated            Topic: None

    In this Phase I SBIR proposal, SandBox Semiconductor™ proposes to develop an Advanced Manufacturing and Material Measurements software tool called Weave ™ for accelerating and automating SEM image analysis for the semiconductor industry. During the development of a new manufacturing process line for a semiconductor device, tens of thousands of scanning electron microscopy (SEM) images are take ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
  4. Nanomachine Device for Semiconductor Process Control Monitoring

    SBC: XALLENT INC.            Topic: None

    Conventional characterization and test methods are increasingly ineffective when applied to structures less than 100 nanometers, causing challenges across R&D, process control and failure analysis. An increasing number of subtle defects become prominent drivers of failure as device size and operating margins decrease, e.g., processing anomalies in thin gate oxides, substrate problems related to do ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
  5. Multimode Chiroptical Spectrometer for Nanoparticle Characterization

    SBC: APPLIED NANOFLUORESCENCE, LLC            Topic: None

    This project will develop a new scientific instrument optimized for the advanced characterization of near-infrared fluorescent nanoparticles that can exist as left- or right-handed structures (enantiomers). Single-walled carbon nanotubes (SWCNTs) are the leading current example of such nanomaterials. Applied NanoFluorescence, LLC (ANF) proposes a novel multi-mode chiroptical spectrometer that can ...

    SBIR Phase II 2019 Department of CommerceNational Institute of Standards and Technology
  6. Precision 10 kV Programmable Voltage Source

    SBC: Low Thermal Electronics, Inc.            Topic: NA

    Low Thermal Electronics, Inc. proposes to design a stand-alone, programmable voltage source capable of supplying precision voltages in the range of zero to 1,000 volts direct current (DC), with options for scaling up to 10,000 volts, and with a total expanded uncertainty (k=2) of less than 10uV/V for the 10,000 volt version. This instrument will improve state-of-the-art measurements in high resist ...

    SBIR Phase I 2017 Department of CommerceNational Institute of Standards and Technology
  7. Compact Vapor Cell Technology for Rydberg‐Atom RF Metrology

    SBC: COLDQUANTA, INC.            Topic: NA

    ColdQuanta seeks to develop compact vapor cells designed specifically for high-accuracy RF metrology with Rydberg atoms. Sensors utilizing these vapor cells can take advantage of Rydberg atoms’ exceptional sensitivity to RF, microwave, and millimeter radiation between 1 and 1000 GHz. Featuring resolutions down to the uV/cm level, the accuracy of these devices will be at least ten times better th ...

    SBIR Phase I 2017 Department of CommerceNational Institute of Standards and Technology
  8. High Density Semi-Auto Closed Cycle Cryoprober II

    SBC: MICROXACT INC.            Topic: NA

    High density wafer scale cryogenic probing solution for testing at 4.5K temperatures or below is needed for testing and characterization of devices and circuits employing superconducting electronic components (such as used for quantum processing, high speed classical processing, magnetic field sensors, etc.) as well as for testing of various particle and light detectors for astronomy, aerospace, d ...

    SBIR Phase II 2017 Department of CommerceNational Institute of Standards and Technology
  9. Fiber Pigtailed On-Chip Mid-infrared Difference Frequency Generation in Silicon

    SBC: OMEGA OPTICS, INC.            Topic: NA

    We propose a fiber-pigtailed strained silicon platform for tunable difference frequency generation (DFG) in mid-infrared (MIR) with tunable continuous wave near-infrared (NIR) sources. Stress exerted by silicon nitride induces second-order nonlinear susceptibility c(2) on underlying centro-symmetric silicon. NIR light is coupled into silicon and MIR light is coupled out of silicon using sub-wavele ...

    SBIR Phase II 2017 Department of CommerceNational Institute of Standards and Technology
  10. Bimetallic Zero Valent Iron Composites for In Situ Remediation

    SBC: AXNANO LLC            Topic: NA

    The EPA estimates that one out of every four Americans lives within three miles of a hazardous waste site. Recent advanced materials developments have driven increased use of In Situ Chemical Reduction (ISCR) remediation in the US and globally. Nanoscale Zero Valent Iron (NZVI) holds great potential for ISCR due to its low cost and high capacity for degrading halogenated compounds. However, two ma ...

    SBIR Phase II 2017 Department of CommerceNational Institute of Standards and Technology
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