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Award Data

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The Award database is continually updated throughout the year. As a result, data for FY24 is not expected to be complete until March, 2025.

Download all SBIR.gov award data either with award abstracts (290MB) or without award abstracts (65MB). A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.

The SBIR.gov award data files now contain the required fields to calculate award timeliness for individual awards or for an agency or branch. Additional information on calculating award timeliness is available on the Data Resource Page.

  1. Particle Sizing and Identification Through Advanced Light Scatter Techniques

    SBC: Ade Corp.            Topic: N/A

    Light scatter has been used to map and size particles on silicon wafers for many years, producing accurate maps of particle position and giving an indication of particle size, but do not reveal any information about particle composition. Today's technology is limited by noise, precluding detection of the smallest particles of interest. Present instruments are not adequate for the next generation ...

    SBIR Phase II 1996 Department of Commerce
  2. High Resolution Semiconductor Gamma Ray Detectors for Radionuclide Metrology

    SBC: RADIATION MONITORING DEVICES, INC.            Topic: N/A

    N/A

    SBIR Phase I 1996 Department of Commerce
  3. Prediction of Equivalent System Temperature: A Computer Methodology

    SBC: Applied Data Trends, Inc.            Topic: N/A

    There is a global trend towards utilization of satellite communications for information services. Equivalent system temperature, Ts, is a significant parameter in quantifying the antenna system/link performance, because it represents the noise power spectral density in antenna system figures-of-merit, such as receiver gain/system temperature (G/T), and end-to-end Signal to Noise Ratio (SNR). Unf ...

    SBIR Phase II 1996 Department of Commerce
  4. Software Tools for Static Analysis of Pointer Usage

    SBC: CFD RESEARCH CORPORATION            Topic: N/A

    Mistakes made by programmers in the use of pointer variables and dynamic memory allocation is a significant cource of software errors. The development of a suite of tools to aid in the detection of these errors is addressed. These tools will operate both statically and dynamically in order to provide as wide a range of services as possible. The static tool will guarantee that certain pointer ba ...

    SBIR Phase I 1996 Department of Commerce
  5. A High Temperature Fiber Optic Raman Probe for Corrosion and Process Monitoring

    SBC: EIC LABORATORIES, INC.            Topic: N/A

    N/A

    SBIR Phase I 1996 Department of Commerce
  6. Seismic Detection of Tornados

    SBC: Engineering Analysis Inc            Topic: N/A

    N/A

    SBIR Phase I 1996 Department of Commerce
  7. A Dynamical Instrument for Machining Centers

    SBC: FOSTER-MILLER, INC.            Topic: N/A

    In the program, we will develop a measurement system based on the dynamics of the machining process. This system will use the variation in the forces or accelerations occurring during machining to characterize the mechanisms occurring between the cutter and workpiece. This will provide real time indications of the finish of the surface that is being created, the proximity to the chatter threshol ...

    SBIR Phase I 1996 Department of Commerce
  8. Attaining Logical Connectivity Through Mediators

    SBC: Gupta Consultancy Inc.            Topic: N/A

    With the objective of ultimately providing tools and technologies for facilitating logical connectivity for manufacturing applications in an NII environment, this proposal involves research in the ares of: agent-based mediators, shared ontologies, conversion libraries, scalability, and automated reading of information from paper and other traditional media.

    SBIR Phase I 1996 Department of Commerce
  9. A Virtual Machining and Inspection System (VMIS)

    SBC: Icamp, Inc.            Topic: N/A

    The purpose of the VMIS is to allow manufacturers the luxury of testing and perfecting manufacturing plans long before a single machine tool is turned on and resources are committed. The VMIS will allow the user to select an available machine tool and an available inspection device, specify a proposed inspection plan and a dimensional analysis procedure, and then build and inspect hundreds (or ev ...

    SBIR Phase II 1996 Department of Commerce
  10. Compact Stationary Spectrometer for Wide Spectral Range Applications

    SBC: Optra, Inc.            Topic: N/A

    The development of a Fourier transform spectrometer with a minimum number of moving parts (or more ideally no moving parts - the so-called stationary spectrometer) has been the subject of considerable research and development. Recent work on a birefringence based system has resulted in the introduction of a commercial version of the system. While a significant step toward the goal of a practical ...

    SBIR Phase I 1996 Department of Commerce
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