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Award Data
The Award database is continually updated throughout the year. As a result, data for FY24 is not expected to be complete until March, 2025.
Download all SBIR.gov award data either with award abstracts (290MB)
or without award abstracts (65MB).
A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.
The SBIR.gov award data files now contain the required fields to calculate award timeliness for individual awards or for an agency or branch. Additional information on calculating award timeliness is available on the Data Resource Page.
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Acoustically Intensified Reactor-Driven Mixed-base Hydrogen Peroxide System
SBC: RESODYN CORPORATION Topic: N/AThis Phase I project will develop and demonstrate an advanced process that utilizes a novel, high-intensity, low-frequency acoustic mixing technology in a system to rapidly produce a specialty fuel for use in chemical oxygen iodine lasers. The fuel is ahighly-reactive, mixed-base hydrogen peroxide (MHP). The MHP is used by a chemical oxygen iodine laser (COIL), which is the central element for th ...
SBIR Phase I 2003 Department of DefenseMissile Defense Agency -
Composite Heat Pipe Baseplates for Thermal Management of T/R Modules
SBC: JW COMPOSITES, LC Topic: N/AThermal managment of T/R modules requires new materials to reduce the thermal resistance between the high frequency amplifiers and the module cooling system. We are proposing to construct a heat pipe evaporator as the baseplate of a T/R module using a newcomposite material with low CTE and high thermal conductivity. Aligned fibers both within the composite material as well as within the heat pip ...
SBIR Phase I 2003 Department of DefenseMissile Defense Agency -
Data Driven Prognostics
SBC: Golden Helix, Inc. Topic: N/AWe propose to develop a prototype suite of recursive partitioning (RP) methodologies to provide advanced warning of failure, malfunction and/or performance degradation for Airborne Laser Program subsystems in service. Through better monitoring and analysisof the status of its systems, prediction of equipment life remaining can be made and corrective action taken to enhance the availability of the ...
STTR Phase I 2003 Department of DefenseMissile Defense Agency -
Development of a SiC Micro-Evaporator for Evaporative Cooling of GaN Power Amplifiers
SBC: Technology Holding, LLC Topic: N/AThis Small Business Innovation Research Phase 1 project will develop novel devices capable of actively cooling high power electronics using ceramic micro-channel evaporatos. Microelectronics with demanding thermal management characteristics are usedpredominantly as microprocessors and power electronics (HDTV modules, higher power logic and power transmit/receive). The number of microprocessors so ...
SBIR Phase I 2003 Department of DefenseMissile Defense Agency -
Fiber-Optic Raman Analysis for Health Monitoring of Solid Rocket Motors Used in the GMD Program
SBC: PROCESS INSTRUMENTS, INC. Topic: N/AWe propose developing a compact, optical fiber-based Raman scattering instrument for rapid, in-situ health monitoring and analysis of solid rocket motors and propellants relied on for the Ground-based Midcourse Defense (GMD) program. The instrument willincorporate diode laser-based, full-spectrum Raman scattering for continuous in-situ remote monitoring of the composite and propellant chemistry. ...
SBIR Phase II 2003 Department of DefenseMissile Defense Agency -
High-Efficiency Electro-Optic Modulators in Potassium Titanyl Phosphate Using Advanced Mode-Shaping Structures
SBC: ADVR, INC. Topic: N/AThis SBIR effort will develop advanced mode-matching structures for highly efficient electro-optic amplitude modulators in potassium titanyl phosphate (KTP). The intended application for these modulators is in intra-satellite fiber-optic data buses andother satellite communication and data-handling systems. The overall goal of this effort is the fabrication of electro-optic modulators featuring l ...
SBIR Phase I 2003 Department of DefenseMissile Defense Agency -
High Power III-Nitride Heterojunction Field-Effect Effect Transistor Development
SBC: III-N Technology, Inc Topic: N/AThe research proposed here is built on the recent successful fabrication of metal oxide semiconductor heterjunction field effect transistors (MOS-HFETs) based on AlGaN/GaN heterostructures with very high drain-current-driving and gate-control capabilitiesas well as unprecedented high breakdown voltages by the P.I.s research group at Kansas State University. III-nitride HFETs have great promises i ...
SBIR Phase I 2003 Department of DefenseMissile Defense Agency -
Huntite Crystals for UV Nonlinear Optics and Self_Doubled Lasers
SBC: SCIENTIFIC MATERIALS CORP. Topic: N/ANonlinear Optical (NLO) crystals play a critical role in current solid-state laser systems operating at fixed UV or visible wavelengths, and as tunable frequency converters known as Optical Parametric Oscillators (OPOs). Currently, NLO materials limit theavailable wavelengths, as well as the longevity and efficiency of these laser systems due to low damage thresholds, poor optical quality, and sm ...
SBIR Phase II 2003 Department of DefenseMissile Defense Agency -
SBIR Phase I: ACIM deBonder: Thin Film Integrity Testing using controlled microcavitation
SBC: Uncopiers, Inc. Topic: N/AThis Small Business Innovation Research (SBIR) Phase I project will develop a new method of measuring how strongly a thin film anchors to its substrate. To date no method exists that can truly measure thin film adhesion. The Acoustic Coaxing Induced Microcaviation (ACIM) deBonder uses controlled microcavitation to directly reveal a thin film's adhesion strength by subjecting it to controlled erosi ...
SBIR Phase I 2003 National Science Foundation -
SBIR Phase I: ACIM Wafer Saver: A novel CMP slurry monitor
SBC: Uncopiers, Inc. Topic: N/AThis Small Business Innovation Research Phase I project is targeted to save semiconductor wafers from being deeply scratched by unchecked large errant agglomerates in chemical mechanical planarizing or polishing (CMP) slurries. CMP has become the method of choice for restoring the surface trueness of wafers at all stages of integrated circuit manufacture. No method currently exists that can implem ...
SBIR Phase I 2003 National Science Foundation