You are here
Award Data
The Award database is continually updated throughout the year. As a result, data for FY24 is not expected to be complete until March, 2025.
Download all SBIR.gov award data either with award abstracts (290MB)
or without award abstracts (65MB).
A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.
The SBIR.gov award data files now contain the required fields to calculate award timeliness for individual awards or for an agency or branch. Additional information on calculating award timeliness is available on the Data Resource Page.
-
Multimode Chiroptical Spectrometer for Nanoparticle Characterization
SBC: APPLIED NANOFLUORESCENCE, LLC Topic: NoneThis project will develop a new scientific instrument optimized for the advanced characterization of near-infrared fluorescent nanoparticles that can exist as left- or right-handed structures (enantiomers). Single-walled carbon nanotubes (SWCNTs) are the leading current example of such nanomaterials. Applied NanoFluorescence, LLC (ANF) proposes a novel multi-mode chiroptical spectrometer that can ...
SBIR Phase II 2019 Department of CommerceNational Institute of Standards and Technology -
WS-BD Conformant Handheld Multi-biometric Acquisition System
SBC: Fulcrum Biometrics, LLC Topic: 9010477TTSecure trusted biometric validation of identity has never been more important. The increase in global terrorism, unfettered identity theft and new legislation requiring multi-factor authentication are a few of the driving factors. The biometrics industry has not actively responded to the changing market conditions being driven by the explosion in mobile computing. Millions of new mobile devices ar ...
SBIR Phase II 2013 Department of CommerceNational Institute of Standards and Technology -
Query-Based Interoperability for Simulation of Composite Structures
SBC: INTACT SOLUTIONS, INC Topic: 9020673RWe propose to design and implement a query-based approach to interoperable modeling and simulation of composite material structures, that usually contain the manufacturing recipe within their design. In Phase I, we established the feasibility of the approach using a demonstration scenario of CAD/CAE interoperability for assemblies. In Phase II, we propose to develop a series of use-case scenarios ...
SBIR Phase II 2013 Department of CommerceNational Institute of Standards and Technology -
Direct Performance Evaluation of Additive Manufacturing Process Plans
SBC: INTACT SOLUTIONS, INC Topic: NoneAdditive manufacturing is steadily advancing towards fulfilling its promise of customized and on-demand production of functional parts. However, performance of as-manufactured parts can differ significantly from the as-designed parts because the as-manufactured geometry differs from the as-designed geometry and the asmanufactured material properties are not known. Attempts to predict performance o ...
SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology -
Gap-Free Model-Based Engineering for Manufacturing and Analysis: Digital Thread without Translation
SBC: Nvariate, Inc. Topic: NoneModern Model-Based Enterprise / Engineering (MBE) systems rely on freeform surfaces built as complex combinations of geometric primitives to define engineered objects. Unfortunately, the intersection of freeform surfaces in MBE applications results in highly approximated solutions, degrading models that cost billions annually by US industry to fix. Current technology limits the abilities of users ...
SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology -
Advanced Manufacturing and Material Measurements Software Tool Weave ™ for the Acceleration and Automation of SEM Image Analysis in the Semiconductor Industry
SBC: Sandbox Semiconductor Incorporated Topic: NoneIn this Phase I SBIR proposal, SandBox Semiconductor™ proposes to develop an Advanced Manufacturing and Material Measurements software tool called Weave ™ for accelerating and automating SEM image analysis for the semiconductor industry. During the development of a new manufacturing process line for a semiconductor device, tens of thousands of scanning electron microscopy (SEM) images are take ...
SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology