You are here

Award Data

For best search results, use the search terms first and then apply the filters
Reset

The Award database is continually updated throughout the year. As a result, data for FY24 is not expected to be complete until March, 2025.

Download all SBIR.gov award data either with award abstracts (290MB) or without award abstracts (65MB). A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.

The SBIR.gov award data files now contain the required fields to calculate award timeliness for individual awards or for an agency or branch. Additional information on calculating award timeliness is available on the Data Resource Page.

  1. Low Damage Ion Beam Etching Technique and Method for Compositional Profiling of Thin Multilayer Films

    SBC: 4WAVE, INC.            Topic: N/A

    Thin film multilayers of nanometer scale thickness are fundamental to the future of electronics and communications technologies. Chemical depth profiling by ion etching techniques are critical to the characterization of these structures. A fundamental problem with current ion etching technologies is that typical ion energies (~1k eV to 20 keV) create extensive damage and intermixing of nanometer t ...

    SBIR Phase I 2003 Department of CommerceNational Institute of Standards and Technology
  2. V-PSL and VISI_PSL: A Visual Language and Interactive Tool for PSL Generation

    SBC: Computer Aided Process Improvement, Inc.            Topic: N/A

    We propose developing a prototype of a GUI-based wizard that: ¿ Guides users through the steps that are needed to define their processes using PSL in a visual/textual manner. ¿ Checks for consistency/correctness according to PSL ontology. ¿ Generates the PSL description. We believe that VISI-PSL will facilitate the generation of PSL descriptions to the extent that it will be used by process ...

    SBIR Phase I 2003 Department of CommerceNational Institute of Standards and Technology
  3. PSL-based Process Knowledge Integration and Management Framework

    SBC: KNOWLEDGE BASED SYSTEMS INC            Topic: N/A

    We propose to develop a robust framework, called the Process Knowledge Integration and Management Framework (PKIMF), to support the complete lifecycle of enterprise process knowledge that natively use the Process Specification Language (PSL). PKIMF uses a dashboard approach to design, analyze, integrate, exchange, and manage process knowledge. Its features and capabilities include the use of a pro ...

    SBIR Phase I 2003 Department of CommerceNational Institute of Standards and Technology
  4. Intelligent Tools with Ambient-Powered Wirelss Sensors

    SBC: LUNA INNOVATIONS INCORPORATED            Topic: N/A

    Next-generation smart machine tools are currently under research and development. Critical to the success of these tools will be the inclusion of smart sensors. These sensor suites will need to measure physical parameters such as temperature, vibration, pressure and so on. Luna Innovations has extensive experience in developing solar powered wireless systems to transmit sensor data. Luna proposes ...

    SBIR Phase I 2003 Department of CommerceNational Institute of Standards and Technology
  5. Tool Condition Monitoring and Diagnostics

    SBC: VulcanCraft            Topic: N/A

    A smart machine tool must be able to monitor its condition and report problems. Every CNC machine should provide an alarm for tool condition problems, including tool wear, much as every automobile has a low oil indicator. Tool wear is particularly important for unattended machining as a worn tool can ruin a part. All current tool condition systems operate "blind" without direct information on curr ...

    SBIR Phase I 2003 Department of CommerceNational Institute of Standards and Technology
  6. Development of Multifunctional Open-system Sensor Integration Tool (MOSIT)

    SBC: WILLIAMSRDM, INC.            Topic: N/A

    Williams-Pyro, Inc. proposes to model and develop software to provide an interface allowing a common method of incorporating sensing components within different systems. The proposed software package, called the Multifunctional Open-system Sensor Integration Tool (MOSIT), will provide the circuit designer with a complete sensor interface solution. MOSIT will provide not only the Network Capable Ap ...

    SBIR Phase I 2003 Department of CommerceNational Institute of Standards and Technology
  7. Automated Reconfiguable Intelligent Radio (ARIR)

    SBC: WILLIAMSRDM, INC.            Topic: N/A

    Williams-Pyro, Inc. proposes to develop an Automated Reconfigurable Intelligent Radio (ARIR), which consists of a series of distributed nodes that will relay voice and data to Intelligent Access Points (IAP) located within the building. This system will allow faster, more accurate information transmission, resulting in timely fire detection and safer firefighting. The main goal of ARIR is to ident ...

    SBIR Phase I 2003 Department of CommerceNational Institute of Standards and Technology
  8. Dual-Probe CD-AFM Calibration

    SBC: XIDEX CORPORATION            Topic: N/A

    Xidex proposes to demonstrate the feasibility of calibrating a critical-dimension atomic force microscope (CD-AFM) without the use of a reference artifact in such a way that high-precision critical dimensions can be generated independently of changes in probe tip shape (including the effects of tip wear), presence of the surface force uncertainties, and the stage uncertainties. The proposed calibr ...

    SBIR Phase I 2003 Department of CommerceNational Institute of Standards and Technology
  9. Advanced Manufacturing and Material Measurements Software Tool Weave ™ for the Acceleration and Automation of SEM Image Analysis in the Semiconductor Industry

    SBC: Sandbox Semiconductor Incorporated            Topic: None

    In this Phase I SBIR proposal, SandBox Semiconductor™ proposes to develop an Advanced Manufacturing and Material Measurements software tool called Weave ™ for accelerating and automating SEM image analysis for the semiconductor industry. During the development of a new manufacturing process line for a semiconductor device, tens of thousands of scanning electron microscopy (SEM) images are take ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
  10. Microcapillary Quartz Sensors for Screening Injectability of High Concentration Protein Formulations

    SBC: QATCH TECHNOLOGIES LLC            Topic: None

    The objective of this SBIR Phase I proposal is to determine the feasibility of viscosity characterization of high concentration protein formulations (HCF) by QATCH’s microcapillary quartz technology. HCFs are non-Newtonian fluids with shear-thinning behavior and they are administered to patients by subcutaneous or muscular injections. The injectability of HCFs depends on the viscosity at high-sh ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
US Flag An Official Website of the United States Government