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Award Data
The Award database is continually updated throughout the year. As a result, data for FY23 is not expected to be complete until September, 2024.
Download all SBIR.gov award data either with award abstracts (290MB)
or without award abstracts (65MB).
A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.
The SBIR.gov award data files now contain the required fields to calculate award timeliness for individual awards or for an agency or branch. Additional information on calculating award timeliness is available on the Data Resource Page.
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Base Metal Electrode Capacitor Test Methods
SBC: FUNDO SCIENCE CORPORATION Topic: MDA14T003Miniaturized base metal electrodes (BME) multilayer ceramic capacitors (MLCC) are of great interest for future missile applications as designers are striving to achieve smaller, lighter, cheaper, faster and better electronic assemblies without sacrificing long-term performance. Unfortunately, screening, reliability and qualifications criteria are either not available or not standardized. In the ...
STTR Phase I 2015 Department of DefenseMissile Defense Agency -
Failure Avoidance in Microelectronics through Coefficient of Thermal Expansion (CTE) Mismatch Modeling and Design
SBC: Space Micro Inc. Topic: MDA14T002Space Micro will develop the core of the decision support system, assemble the models and material properties and demonstrate the utility of the program in materials selection on a subset of failures related to a specific test-bed, which will be the attachment of quad-flat no-leads (QFN) and ball grid array (BGA) devices to printed wiring boards using different solders, underfills, QFN or BGA geom ...
STTR Phase I 2015 Department of DefenseMissile Defense Agency -
Microelectronics Component Adhesive Selection and Design Rules for Failure Avoidance
SBC: CFD RESEARCH CORPORATION Topic: MDA14T002Thermally induced fatigue and residual stress introduced during fabrication are sources of stress related failure in microelectronics, which raises concerns about product reliability and specification. CFDRC has teamed with experts in the reliability of microelectronics packaging to develop a testing and physics based modeling protocol to correlate material properties and thermal loading conditio ...
STTR Phase I 2015 Department of DefenseMissile Defense Agency -
System of Systems Control Interactions
SBC: Torch Technologies, Inc. Topic: MDA15T002Control Theory tools and processes for analyzing the interactions of complex System of Systems (SoS) are lacking, specifically when sub-systems are independently designed and/or higher levels of SoS controls are applied. Integrating these sub-systems into the SoS, can result in dynamic interactions between these sub-systems and the SoS controls resulting in unexpectedly large deviations between ex ...
STTR Phase I 2016 Department of DefenseMissile Defense Agency -
Sufficient Statistics for System of Systems Control (S4C)
SBC: Intelligent Automation, Inc. Topic: MDA15T002There is an urgent need to develop and demonstrate innovative control, design and analysis techniques to characterize the stability and performance of a system of systems (SoS) as a function of sub-system dynamics, network structure and control/decision processes. This is particularly true in the missile defense scenario, which involves a coordinated defense against threats. However, there is no e ...
STTR Phase I 2016 Department of DefenseMissile Defense Agency -
System of Systems Control Interactions
SBC: GTD Unlimited LLC Topic: MDA15T002In this research effort, GTD Unlimited will design tools for efficiently specifying, representing, and analyzing the interactions between control systems in System of Systems (SoS). Our approach will be to model the problem as an uncertain system and analyze the resulting models using control methods. Control methods can be related back to the standard Nyquist criterion for stability, ensuring t ...
STTR Phase I 2016 Department of DefenseMissile Defense Agency -
Mechanistic Model Development for Gold Contaminated Solder Joint Reliability
SBC: DFR SOLUTIONS, LLC Topic: MDA15T005DfR Solutions and the Rochester Institute of Technology (RIT) have formed a team of experts in solder joint reliability and gold embrittlement to perform a series of experiments that will provide the data necessary to create mechanistic reliability models. Critical to any application of these models and of interpreting experimental results is the ability to determine solder joint gold contaminatio ...
STTR Phase I 2016 Department of DefenseMissile Defense Agency -
CCA-SAFE: A Model-Assisted NDE Tool for Failure Analysis of Gold Contaminated Solder Joints
SBC: Intelligent Automation, Inc. Topic: MDA15T005Gold contamination in Circuit Card Assembly (CCA) solder joints leads to brittle intermetallic compounds (IMCs), which is one of the major factors in solder joint failure. The conventional rule of thumb considers 3 wt% of gold (Au) as a safety threshold, which is not always reliable due to varieties of package platforms, solder types, reflux settings, operational and environmental conditions, etc. ...
STTR Phase I 2016 Department of DefenseMissile Defense Agency -
Gold-Contaminated Solder-Joint Characterization for Quantifying Risk Associated with Gold Embrittlement
SBC: Enig Associates, Inc. Topic: MDA15T005Circuit card assembly (CCA) reliability is dependent on solder joints, which join components to printed circuit boards (PCBs). Board users strive to mitigate risks associated with gold-embrittled solder joints. Enig Associates, Inc. (ENIG), in collaboration with Sandia National Laboratories, proposes to develop a risk-forecasting tool for quantifying the risks associated with gold-embrittled sold ...
STTR Phase I 2016 Department of DefenseMissile Defense Agency -
Interactive Sensor Fusion for Context-Aware Discrimination
SBC: OPTO-KNOWLEDGE SYSTEMS INC Topic: MDA15T001We propose a novel computational framework for discrimination that incorporates sensor data from observations of the engagement and from kill assessment (KA) that such sensors can provide. The KA information is combined with data from other sensors to improve the discrimination decision and to reduce the probability of correlated shots. Approved for Public Release 16-MDA-8620 (1 April 16)
STTR Phase I 2016 Department of DefenseMissile Defense Agency