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The Award database is continually updated throughout the year. As a result, data for FY21 is not expected to be complete until September, 2022.
The Characterization and Mitigation of Single Event Effects in Ultra-Deep Submicron (< 90nm) MicroelectronicsSBC: Orora Design Technologies, Inc. Topic: DTRA07005
Orora Design Technologies proposes to develop electronic design automation (EDA) tools employing minimally invasive circuit design-based methods to mitigate single event effects (SEEs) for next generation Ultra-DSM CMOS (SBIR Phase II 2008 Department of DefenseDefense Threat Reduction Agency
SBC: Thornton Tomasetti, Inc. Topic: DTRA07011
In Phase I of this effort we analyzed the structural response of a BLU 109 during typical penetration events. Based on these finite element results, we proposed and demsonstrated a simple robust concept for a passive penetrator sensor that identifies the material being penetrated and also correlates strongly with its underground trajectory. Such a sensor would obviously provide valuable informatio ...SBIR Phase II 2008 Department of DefenseDefense Threat Reduction Agency
SBC: Aculight Corporation Topic: N/A
NIST is using a sensitive optical technique called cavity ring-down detection to permit detection of impurities in semiconductor process gases, which cause substantial losses in manufacturing yield. In order to increase the sensitivity and range of application of this technique, improved single frequency laser sources are required. In particular, lasers providing more power, narrower line-width, b ...SBIR Phase II 2004 Department of CommerceNational Institute of Standards and Technology