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20009- ParthaSBC: CFD RESEARCH CORP Topic: 20A001
Radiation effects in microelectronics are a significant concern for DoD systems that operate at high altitudes or in outer space. Typical characterization efforts focus on macroscale degradation signatures from electrical measurements at device terminals. However, a comprehensive analysis of radiation-induced physical defects is not possible based solely on terminal measurements. CFD Research and ...STTR Phase II 2022 Department of DefenseDefense Microelectronics Activity