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Award Data
The Award database is continually updated throughout the year. As a result, data for FY24 is not expected to be complete until March, 2025.
Download all SBIR.gov award data either with award abstracts (290MB)
or without award abstracts (65MB).
A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.
The SBIR.gov award data files now contain the required fields to calculate award timeliness for individual awards or for an agency or branch. Additional information on calculating award timeliness is available on the Data Resource Page.
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Gap-Free Model-Based Engineering for Manufacturing and Analysis: Digital Thread without Translation
SBC: Nvariate, Inc. Topic: NoneModern Model-Based Enterprise / Engineering (MBE) systems rely on freeform surfaces built as complex combinations of geometric primitives to define engineered objects. Unfortunately, the intersection of freeform surfaces in MBE applications results in highly approximated solutions, degrading models that cost billions annually by US industry to fix. Current technology limits the abilities of users ...
SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology -
Advanced Manufacturing and Material Measurements Software Tool Weave ™ for the Acceleration and Automation of SEM Image Analysis in the Semiconductor Industry
SBC: Sandbox Semiconductor Incorporated Topic: NoneIn this Phase I SBIR proposal, SandBox Semiconductor™ proposes to develop an Advanced Manufacturing and Material Measurements software tool called Weave ™ for accelerating and automating SEM image analysis for the semiconductor industry. During the development of a new manufacturing process line for a semiconductor device, tens of thousands of scanning electron microscopy (SEM) images are take ...
SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology -
Nanomachine Device for Semiconductor Process Control Monitoring
SBC: XALLENT INC. Topic: NoneConventional characterization and test methods are increasingly ineffective when applied to structures less than 100 nanometers, causing challenges across R&D, process control and failure analysis. An increasing number of subtle defects become prominent drivers of failure as device size and operating margins decrease, e.g., processing anomalies in thin gate oxides, substrate problems related to do ...
SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology -
Multimode Chiroptical Spectrometer for Nanoparticle Characterization
SBC: APPLIED NANOFLUORESCENCE, LLC Topic: NoneThis project will develop a new scientific instrument optimized for the advanced characterization of near-infrared fluorescent nanoparticles that can exist as left- or right-handed structures (enantiomers). Single-walled carbon nanotubes (SWCNTs) are the leading current example of such nanomaterials. Applied NanoFluorescence, LLC (ANF) proposes a novel multi-mode chiroptical spectrometer that can ...
SBIR Phase II 2019 Department of CommerceNational Institute of Standards and Technology -
Precision 10 kV Programmable Voltage Source
SBC: Low Thermal Electronics, Inc. Topic: NALow Thermal Electronics, Inc. proposes to design a stand-alone, programmable voltage source capable of supplying precision voltages in the range of zero to 1,000 volts direct current (DC), with options for scaling up to 10,000 volts, and with a total expanded uncertainty (k=2) of less than 10uV/V for the 10,000 volt version. This instrument will improve state-of-the-art measurements in high resist ...
SBIR Phase I 2017 Department of CommerceNational Institute of Standards and Technology -
ISABEL- Integrated Secure Automated Bug Extraction List
SBC: SMART INFORMATION FLOW TECHNOLOGIES LLC Topic: NAThe ISABEL program will create symbolic execution signatures to classify bugs in the NIST Bugs Framework. Using the symbolic execution signature ISABEL will find a program input to trigger the bug using fuzz testing. ISABEL will integrate its bug categorization and bug triggering capability with a software development environment using a flexible framework that will allow both open source and comm ...
SBIR Phase I 2017 Department of CommerceNational Institute of Standards and Technology -
Fiber Pigtailed On-Chip Mid-infrared Difference Frequency Generation in Silicon
SBC: OMEGA OPTICS, INC. Topic: NAWe propose a fiber-pigtailed strained silicon platform for tunable difference frequency generation (DFG) in mid-infrared (MIR) with tunable continuous wave near-infrared (NIR) sources. Stress exerted by silicon nitride induces second-order nonlinear susceptibility c(2) on underlying centro-symmetric silicon. NIR light is coupled into silicon and MIR light is coupled out of silicon using sub-wavele ...
SBIR Phase II 2017 Department of CommerceNational Institute of Standards and Technology -
High Temperature High Resolution in-situ Differential Pressure Sensor
SBC: Innoveering, LLC Topic: NAChemical manufacturers require high accuracy/high sensitivity pressure sensors to efficiently monitor the various manufacturing systems and processes in the chemical plant, to ensure any changes proceed in a safe and reliable manner, adhering to expected standards and practices. NIST also has a need for highly accurate pressure measurements, especially determining the thermo-physical properties of ...
SBIR Phase II 2017 Department of CommerceNational Institute of Standards and Technology -
High-Throughput Manufacturing Methods for Engineered MRI Contrast Agents
SBC: ADVANCED RESEARCH CORPORATION Topic: 9010368RThis project focuses on developing a magnetic resonance imaging (MRI) contrast agent that may increase the detection of tagged cells by a factor of 10-100. The ability to noninvasively track specifically labeled (tagged) cells, enables a researcher or medical treatment professional to dynamically monitor the delivery and targeted application of medicinal and bio-reactive agents.
SBIR Phase I 2015 Department of CommerceNational Institute of Standards and Technology -
Large-Area, High-Uniformity Photodiodes for Infrared Trap Detectors
SBC: AMETHYST RESEARCH INC Topic: 9020168Rmethyst Research Inc. will design, fabricate and test a high uniformity, large area, low noise infrared trap-detector detector for the 1- 4.5 μm wavelength range. This state of the art detector will have a large area (e.g., 1-1.8 cm diameter active area) with a spatial variability of internal quantum efficiency of less than 0.1 % between 1 μm and 4.5 μm. In addition, the internal quantum effici ...
SBIR Phase I 2015 Department of CommerceNational Institute of Standards and Technology