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Award Data

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The Award database is continually updated throughout the year. As a result, data for FY24 is not expected to be complete until March, 2025.

Download all SBIR.gov award data either with award abstracts (290MB) or without award abstracts (65MB). A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.

The SBIR.gov award data files now contain the required fields to calculate award timeliness for individual awards or for an agency or branch. Additional information on calculating award timeliness is available on the Data Resource Page.

Displaying 111 - 117 of 117 results
 
  • Record 1 TO 117

  1. DOPED DIAMOND QUANTUM WELLS FOR FIELD EFFECT TRANSISTORS

    SBC: CREARE LLC            Topic: N/A

    N/A

    SBIR Phase I 1990 Department of DefenseMissile Defense Agency

  2. AN OIL FREE REGENERATIVE COMPRESSOR FOR CRYOGENIC REFRIGERATION SYSTEMS

    SBC: CREARE LLC            Topic: N/A

    N/A

    SBIR Phase I 1990 Department of Energy

  3. LOW-POWER OPTICAL BEAMSTEERING WITH SELF-ASSEMBLING MICROSTRUCTURES

    SBC: Rfa Technology            Topic: N/A

    N/A

    SBIR Phase I 1990 Department of DefenseDefense Advanced Research Projects Agency

  4. Title missing

    SBC: Sonetech Corp.            Topic: N/A

    N/A

    SBIR Phase I 1990 Department of DefenseNavy

  5. THERMOGRAPHIC NON-DESTRUCTIVE EVALUATION

    SBC: Stress Photonics, Inc.            Topic: N/A

    THE PROPOSAL IS TO ESTABLISH QUANTITATIVE THERMOGRAPHIC NON-DESTRUCTIVE EVALUATION (QTNDE) FOR NONDESTRUCTIVE INSPECTION AND DEFECT EVALUATION OF FRACTURE-CRITICAL ADVANCED AIRCRAFT MATERIALS. THIS WILL BE BASED ON RECENT THEORETICAL AND EXPERIMENTAL ADVANCES CONCERNING THE ADIABATIC THERMOELASTIC EFFECT AND ADDITIONAL EXPERIMENTS ON TWO DEMONSTRATION MATERIALS. A SCREENING MATRIX WILL BE ESTABLIS ...

    SBIR Phase I 1990 Department of DefenseNavy

  6. NEW METHOD FOR MEASURING TRACE ELEMENTS IN II-VI SEMICONDUCTING MATERIALS

    SBC: Vhg Laboratorys Inc.            Topic: N/A

    MEASUREMENT OF CRITICAL TRACE LEVEL ELEMENTS IN SEMICONDUCTING MATERIALS MAY BE POSSIBLE USING A SPECIAL ATOMIC ABSORPTION SPECTROPHOTOMETRY TECHNIQUE. DIRECT VAPORIZATION OF SOLID SAMPLES COMBINED WITH A HIGHLY EFFICIENT SYSTEM TO CORRECT FOR NON-ANALYTE ABSORPTION WILL BE INVESTIGATED ON CDTE MATERIALS.

    SBIR Phase II 1990 Department of DefenseArmy

  7. PROPERTY ENHANCED COMPOSITES FROM LIGNOCELLULOSIC FIBER

    SBC: Xylan Inc            Topic: N/A

    THERE ARE MANY IDEAS ON WAYS TO UTILIZE BIOMASS MATERIALS. THEY CAN BE CONVERTED INTO A FIBER THAT CAN BE ACETYLATED TOBE USED FOR THE PRODUCTION OF COMPOSITES. THESE COMPOSITES CAN BE USED IN MANY STRUCTURAL AND NONSTRUCTURAL APPLICATIONS. BY UTILIZING THE XYLAN-I U.S. PATENT # 4,842,877, THE THREE-DIMENSIONAL BIOMASS CHANGES ITS LIGNIN-CELLULOSE-HEMICELLULOSE CONFIGURATION TO ONE WHICH ALLOWS FO ...

    SBIR Phase I 1990 Department of Energy
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