Award Data

TO SATISFY AIR FORCE REQUIREMENTS TO IMPROVE AVIATION REACTIVE ATMOSPHERES IN A UNIQUE, CONTRACTOR-OWNED ENTRAINED FLOW REACTOR WITH ON-LINE, IN-SITU ANALYSIS OF VOLATILE SPECIES, TEMPERATURE AND RADIATION ABSORPTION CHARACTERISTICS BY FOURTER TRANSFORM INFRARED (FT-IR) SPECTROSCOPY. THESE DATA WILL BE USED TO EVALUATE THE APPLICATION OF EXISTING CONTRACTOR-DEVELOPED MODELS OF VAPORIZATION, PYROLY ...

SIGNIFICANT SAVINGS IN COST AND DISPLACEMENT OF VALUABLE PETROLEUM FUEL CAN BE ACHIEVED BY BURNING COAL WHEN APPROPRIATE FOR DOD POWER GENERATION REQUIREMENTS. THIS PROPOSAL OFFERS A COST EFFECTIVE, PORTABLE, COMPUTER CONTROLLED AND INTEGRATED COAL ANALYSIS SYSTEM FOR ASSESSING A COAL'S COMBUSTION PERFORMANCE. THE PROPOSED SYSTEM FOR COAL ANALYSES IS AN INTEGRATED THERMOGRAVIMETER ANALYZER (TGA), ...

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THE EXTENSION OF A NON-CONTACT POLISHING TECHNIQUE PREVIOUSLY DEVELOPED FOR IT-VI COMPOUNDS, IS PROPOSED FOR (100) GAAS WAFERS INTEGRATED CIRCUIT APPLICATIONS IN MIND. AN INITIAL TASK WILL BE TO CHARACTERIZE SUCH NON-CONTACT POLISHED SURFACES AND COMPARE THEM WITH CONVENTIONALLY POLISHED SURFACES. FOLLOWING SUCCESSFUL DEVELOPMENT OF THE TECHNIQUE, WE WILL INVESTIGATE THE FEASIBILITY OF SCALE-UP FO ...

FOR THE CLASS OF DNA NUCLEAR WEAPONS EFFECTS SIMULATOR KNOWN AS THE PLASMA RADIATING SOURCE (PRS), HIGH RESOLUTION X-RAY SPECTROSCOPY DIAGNOSTIC MEASUREMENTS PROVIDE CRITICAL INFORMATION BOTH FOR CHARACTERIZATION OF THE TEST-OBJECT RADIATION ENVIRONMENT AND FOR OPTIMIZATION OF THE SOURCE. PRESENT PRS HIGH RESOLUTION X-RAY SPECTROMETERS RECORD DATA ON PHOTOGRAPHIC FILM, THE PROCESSING AND ANALYSIS ...

COMMERCIAL SAPPHIRE SURFACES CONTAIN BURIED DAMAGE WHICH HAS A DELETERIOUS INFLUENCE ON SOS LAYERS GROWN THEREON. THE DEFECTS IN THE SILICON LAYERS RESULT IN A REDUCED YIELD OF DEVICES AND PERFORMANCE LIMITATIONS. MUCH OF THE DAMAGE IN THE SAPPHIRE SURFACE IS PRODUCED BY THE POLISHING STEP, WHICH EMPLOYS AN ABRASIVE PAD IN CONTACT WITH THE SAPPHIRE SURFACE. AN IMPROVED POLISHING PROCESS HAS BEEN E ...

NEAR-SURFACE DEFECTS IN SEMICONDUCTORS HAVE A PRIMARY INFLUENCE UPON DEVICE PROPERTIES, PARTICULARLY THE YIELD. IT WOULD BE VERY USEFUL TO BE ABLE TO MAP SPATIALLY THE DENSITY AND TYPE OF DEFECTS NEAR A SEMICONDUCTOR SURFACE EITHER AS A WAFER QUALITY CONTROL STEP OR TO SUPPORT DEVICE PHYSICAL EXPERIMENTS. CONVENTIONAL TECHNIQUES USED FOR THIS PURPOSE SUFFER FROM ONE OR MORE OF THE FOLLOWING LIMITA ...

ECCM TECHNOLOGY HAS A GROWING NEED FOR IMPROVED HIGH-STABILITY TIME-FREQUENCY STANDARDS. THE MAIN STANDARDS CURRENTLY IN COMMON USE UTILIZE QUARTZ-CRYSTAL OSCILLATORS CUT TO THE AT ORIENTATION. A PRIMARY CANDIDATE FOR MEETING THE REQUIREMENT FOR IMPROVED TIME/FREQUENCY STANDARDS IS SC-CUT QUARTZ, WHICH OFFERS MAJOR IMPROVEMENTS IN STABILITY AND PERFORMANCE OVER AT-CUT QUARTZ OSCILLATORS. UNFORTUNA ...

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