Award Data

In order to meet the Defense Microelectronics Activity (DMEA) need to support the ongoing Department of Defense (DOD) challenge to ensure the authenticity and security of microelectronics parts within its supply chain, ChromoLogic LLC (CLL) proposed, developed and demonstrated a Phase I RAPSTEC system. RAPSTEC is based on a machine vision system designed to capture the surface features of a microe ...

The machine learning for counterfeit detection research program continues the successful Phase 1 feasibility study of applying machine learning to detect FPGA counterfeits. In Phase 1, Graf Research demonstrated the feasibility of implementing a machine learning based counterfeit detection platform for a single FPGA device and representing data characteristic of repackaged counterfeit devices.  T ...

The transmission electron microscope (TEM) is the standard high resolution tool for imaging microelectronics. Despite its impressive sensitivity to physical structure (the type, number, and arrangement of atoms), TEM is remarkably inept at detecting electronic and thermal signals, even when equipped with expensive spectroscopic attachments. Electronic and thermal structure determines device functi ...

In an effort to improve the design of radiation hardened electronic components, this proposal explores the feasibility of creating predictive modeling techniques for nanoscale material properties in advanced integrated electrical devices. This study encompasses the collaborative usage of high resolution Transmission Electron Microscope (HR-TEM) data, circuit design targeted electrical data, and ma ...

Radiation effects in microelectronic components are a significant concern for the reliability of DoD systems that operate at high altitudes or in outer space. Typical characterization efforts focus on macroscale degradation signatures from electrical measurements at device terminals. However, a comprehensive analysis of radiation-induced physical defects is not possible based solely on terminal me ...

Dimensional and compositional metrology of small-scale microelectronics, less than 22 nm, is becoming increasingly difficult as the architecture of these devices is becoming more complex. Key metrological measurements of Fin devices require 3-D metrology at less than 0.5 nm spatial resolution as well as single atom characterization to identify device composition and chemical distributions. This is ...

Alphacore will evaluate and develop a new approach to multi-scale modeling of radiation effects in electronic device technologies based on novel material systems. Our approach aims to directly correlate nano-scale properties of novel materials systems with macro-scale electrical properties of devices constructed with those materials, and their radiation response. Radiation hardness assurance (RHA) ...

Prixarc will develop and commercialize a secure and rapid counterfeit detection system using botanical DNA taggants grafted to NanoCrystal Cellulose (NCC) to safeguard electronic components in supply chains and to protect against counterfeiting and diversion. We will advance the science behind grafting of botanical DNA taggants to NCC, along with its application to semiconductors and microchips. O ...

Counterfeiting of electronics in the supply chain such as discrete electronic components, integrated circuits, and electronic sub-assemblies is a major issue for the DoD. Failures arising from counterfeit parts pose a security risk, affect system integrity, lead to mission delays, and ultimately endanger the lives of the warfighters. Counterfeit components are extremely difficult to detect once th ...

Securing the electronic components of the DOD is a complex challenge. In a global supply chain with thousands of distributed contractors creating high performance systems, it is critically important to ensure counterfeit components are not entering use. Chain of custody of electronic components from the time of manufacture to when the DOD takes delivery of the completed product can involve a multi ...