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The Award database is continually updated throughout the year. As a result, data for FY24 is not expected to be complete until March, 2025.

Download all SBIR.gov award data either with award abstracts (290MB) or without award abstracts (65MB). A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.

The SBIR.gov award data files now contain the required fields to calculate award timeliness for individual awards or for an agency or branch. Additional information on calculating award timeliness is available on the Data Resource Page.

  1. Reliable and Rad-Hard Microelectronics

    SBC: RIDGETOP GROUP INC            Topic: AF083197

    The ability to measure and characterize critical circuit parameters is a necessary requirement to developing reliable microelectronics for military applications. An industry-first capability is provided: a set of radiation-hardened by design (RHBD) test structures to allow design engineers to measure and characterize these critical parameters both before and after irradiation. Upon completion, the ...

    SBIR Phase I 2009 Department of DefenseAir Force
  2. Physics of Failure Based Electronics Reliability Analysis Software

    SBC: RIDGETOP GROUP INC            Topic: OSD08M02

    Expert analysis tools that rapidly and accurately evaluate the reliability of electronics modules, such as printed circuit board assemblies (PCBA) for component health, performance and situational self awareness, are critically important to mission effectiveness of DoD systems. To accomplish this, the interactions between electronic components need to be predicted and monitored within a comprehens ...

    SBIR Phase I 2009 Department of DefenseAir Force
  3. Deep Submicron Radiation Hardened Logic for Communications

    SBC: RIDGETOP GROUP INC            Topic: AF083204

    Ridgetop Group, Inc. is proposing a Phase I Feasibility and Merit study as follows: 1. Conduct a Feasibility study on whether Heterojunction BiPolar Junction Transistor-based (HBT-based) structures can be designed for use as follows: (1) HBT-based Die Level Process Monitor (DLPM) structure to characterize the effect of process variations on base-emitter voltage (VBE); (2) HBT-based Radiation Effec ...

    SBIR Phase I 2009 Department of DefenseAir Force
  4. Enhancing High-Resolution Imagery for Space Situational Awareness with Lucky Imaging and Adaptive Optics

    SBC: HART SCIENTIFIC CONSULTING INTERNATIONAL L.L.C.            Topic: AF083199

    We propose the development and laboratory demonstration of a method that will revolutionize the high resolution satellite imaging capabilities of ground-based optical systems.  Current imaging systems supporting Space Situational Awareness (SSA), even those equipped with state-of-the-art adaptive optics (AO), fail to exploit the intrinsic field of view of the imager at the full resolution of the ...

    SBIR Phase I 2009 Department of DefenseAir Force
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