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The Award database is continually updated throughout the year. As a result, data for FY23 is not expected to be complete until September, 2024.

Download all SBIR.gov award data either with award abstracts (290MB) or without award abstracts (65MB). A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.

The SBIR.gov award data files now contain the required fields to calculate award timeliness for individual awards or for an agency or branch. Additional information on calculating award timeliness is available on the Data Resource Page.

Displaying 31 - 40 of 57 results
 
  • Record 1 TO 57

  1. High Resolution Surface Current Mapping Radar System for Intercoastal Waterways

    SBC: PROSENSING INC            Topic: N/A

    Quadrant Engineering has recently developed a wide bandwidth microwave radar system, named CDKS, capable of processing radar signals using the Delta K technique. Design goals were to develop a ruggedized, compact, and low-cost instrument for operational use as part of NOAA's harbor monitoring system. In this project, the first field experiments are to be carried out using the CDKS system. These ...

    SBIR Phase I 1996 Department of Commerce

  2. An Integrated Multi-Sensor Data Processing System

    SBC: PROSENSING INC            Topic: N/A

    N/A

    SBIR Phase I 1996 Department of Commerce

  3. High Resolution Semiconductor Gamma Ray Detectors for Radionuclide Metrology

    SBC: RADIATION MONITORING DEVICES, INC.            Topic: N/A

    N/A

    SBIR Phase I 1996 Department of Commerce

  4. Particle Sizing and Identification Through Advanced Light Scatter Techniques

    SBC: Ade Corp.            Topic: N/A

    N/A

    SBIR Phase I 1995 Department of Commerce

  5. 3-D Materials Characterization Using Structured Illumination in the SEM

    SBC: Advanced Microscopy Techniques            Topic: N/A

    Microscopic measurement of surface topography is a continuing need in microfabrication technology and materials research. The aim of this research is to adapt the scanning electron microscope (SEM) to the quantitative measurement of a wide range of surface structures. The SEM is a widely used measurement tool in materials science and semiconductor fabrication. The SEM's strength is that it prov ...

    SBIR Phase I 1995 Department of Commerce

  6. Reuse Support Tools for Automated Constructino of Software Systems

    SBC: Advanced Systems Technology, Inc.            Topic: N/A

    Reuse in software engineering is an exciting concept that has yet to be reliably implemented. The number of program subroutines that are truly generic (and therefore applicable across all applications) is limited. However, there are specific applications that are required by many organizations, albeit with a set of constraints specific to each organization. This project proposes to design a too ...

    SBIR Phase I 1995 Department of Commerce

  7. Wavelet Image Compression Workbench

    SBC: Aware, Inc.            Topic: N/A

    Digital imagery is an increasingly prevalent in the computerized workplace; however, the increasing volume of this data is stressing storage and communications systems. One of the most competitive solutions to these stresses is wavelet-based data compression. A wide variety of wavelet image compression methods exists, and given an application, there is a need to compare different methods before ...

    SBIR Phase I 1995 Department of Commerce

  8. Self-Monitoring Surveillance System for Prestressing Tendons

    SBC: Construction Technology            Topic: N/A

    N/A

    SBIR Phase I 1995 Nuclear Regulatory Commission

  9. Laser Polarimetric Apparatus for Rapid Emissivity Measurements on Pulse-Heated Materials

    SBC: Containerless Research, Inc.            Topic: N/A

    N/A

    SBIR Phase I 1995 Department of Commerce

  10. Gulliver Miniature Guarded Hot Plate Apparatus

    SBC: Drf R&d, Inc.            Topic: N/A

    It is proposed to develop a miniature guarded hot plate apparatus that can be used to determine the thermal conductivity or thermal resistance of very small specimens (1 to 3 cm square) of thermal insulation materials over a temperature range from at least -40 degrees Celsius to +65 degrees Celsius, with the apparatus having the capability to carry out measurements under controlled environments of ...

    SBIR Phase I 1995 Department of Commerce
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