You are here
Award Data
The Award database is continually updated throughout the year. As a result, data for FY22 is not expected to be complete until September, 2023.
Download all SBIR.gov award data either with award abstracts (290MB)
or without award abstracts (65MB).
A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.
-
Compact Stationary Spectrometer for Wide Spectral Range Applications
SBC: Optra, Inc. Topic: N/AThe development of a Fourier transform spectrometer with a minimum number of moving parts (or more ideally no moving parts - the so-called stationary spectrometer) has been the subject of considerable research and development. Recent work on a birefringence based system has resulted in the introduction of a commercial version of the system. While a significant step toward the goal of a practical ...
SBIR Phase I 1996 Department of Commerce -
Single-Frequency Tunable IR Laser Development
SBC: Schwartz Electro-Optics, Inc Topic: N/AN/A
SBIR Phase I 1996 Department of Commerce -
Particle Sizing and Identification Through Advanced Light Scatter Techniques
SBC: Ade Corp. Topic: N/AN/A
SBIR Phase I 1995 Department of Commerce -
Automated Structure Determination of Protein-Ligand Complexes
SBC: Molecular Simulations, Inc. Topic: N/ASoaking and co-crystallization experiments for studying the binding of potential drugs with proteins of known structure are a significant research function of crystallographic labs in pharmaceutical companies. Such experiments have two overriding characteristics: (a) the experiments are repetitive, and therefore become routine, and (b) numerous experiments are performed to acquire the desired in ...
SBIR Phase I 1995 Department of Commerce -
A Multi-Trip, Free Drop Buoy for the Measurement of Shallow Physical/Optical Properties
SBC: Webb Research Corp. Topic: N/AN/A
SBIR Phase I 1995 Department of Commerce -
3-D Materials Characterization Using Structured Illumination in the SEM
SBC: Advanced Microscopy Techniques Topic: N/AMicroscopic measurement of surface topography is a continuing need in microfabrication technology and materials research. The aim of this research is to adapt the scanning electron microscope (SEM) to the quantitative measurement of a wide range of surface structures. The SEM is a widely used measurement tool in materials science and semiconductor fabrication. The SEM's strength is that it prov ...
SBIR Phase I 1995 Department of Commerce -
Attaining Logical Connectivity Through Mediators
SBC: Gupta Consultancy Inc. Topic: N/AWith the objective of ultimately providing tools and technologies for facilitating logical connectivity for manufacturing applications in an NII environment, this proposal involves research in the ares of: agent-based mediators, shared ontologies, conversion libraries, scalability, and automated reading of information from paper and other traditional media.
SBIR Phase I 1996 Department of Commerce