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Award Data
The Award database is continually updated throughout the year. As a result, data for FY23 is not expected to be complete until September, 2024.
Download all SBIR.gov award data either with award abstracts (290MB)
or without award abstracts (65MB).
A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.
The SBIR.gov award data files now contain the required fields to calculate award timeliness for individual awards or for an agency or branch. Additional information on calculating award timeliness is available on the Data Resource Page.
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Stable Filterless Solar-Blind UV Photodiodes Based on Silicon
SBC: Spire Corporation Topic: N/AThe proposed program will investigate fabrication of low-cost and stable Si- based filterless solar-blind UV detectors on radiation-hard silicon-on-insulator (SOI) structures. By fabricating detectors on silicon thin films, the active device layer thickness can be chosen so that shortwave photons are detected within the active layer, while the longer wavelengths are absorbed in a substrate which i ...
SBIR Phase I 1997 Department of Commerce -
Development of A1203 Detector Material and OSL Dosimetric Technique for
SBC: Stillwater Sciences, L.L.C. Topic: N/AThis proposal describes a new research program to be established at the small business Still Sciences, LLC, in collaboration with Department of Physics of Oklahoma State University. The overall goal is to develop and commercialize an all-optical dosimetry system for industrial radiation processing based on a novel Pulsed Optically Stimulated Luminescence readout technique and a new Al2O3 material ...
SBIR Phase I 1997 Department of Commerce -
Composing Security Policies
SBC: VDG, INC. Topic: N/AThe research proposed herein in intended to solve two problems, namely (1) to define a specification framework for access control policies that enables policy composition for both centralized and distributed systems in a precise and systematic manner, and (2) to explore the impact of different security architectures on policy composition. Although most commercial systems support applications that ...
SBIR Phase I 1997 Department of Commerce -
Diode Laser-Based Optical Flux Monitor for MBE Control
SBC: SOUTHWEST SCIENCES INC Topic: N/AA diode laser method for the real-time measurement of absolute flux concentrations and spatial profiles of atomic beams used in MBE will be tested. The proposed method uses the doubled output of a near-infrared diode laser to access atomic absorption lines of species such as Ga, Al and In. The detection method will combine high frequency wavelength modulation and noise canceler approaches in order ...
SBIR Phase I 1997 Department of Commerce -
Sensitive Measurement of Water Vapor from Commercial Aviation Platforms
SBC: SOUTHWEST SCIENCES INC Topic: N/ACommercial aviation offers a low cost platform from which to make extensive humidity measurements, provided the instrumentation can run autonomously and endure the rigorous flight schedules. Advances in state of the art diode laser gas sensing technology make possible compact, fully automated, self-calibrating instrumentation with the sensitivity needed to measure humidity levels throughout the tr ...
SBIR Phase I 1997 Department of Commerce -
A 3-D Machine Tool Error Modeling System
SBC: AUTOMATED PRECISION, INC. Topic: N/AIn response to the increasing demand for better understanding of the manufacturing processes and the machining systems, a new testing standard--ASME B5.54 and a family of new testing instruments have been developed for evaluating the performances of a variety of CNC machining centers. Because of the advancement and versatility of the new instruments, test data are being collected at a much higher ...
SBIR Phase I 1997 Department of Commerce -
Characterization of Metastable Beam Sources
SBC: PHYSICAL SCIENCES INC. Topic: N/AWe propose a 6 month program during which we will develop and demonstrate an approach for generating well-characterized atomic and molecular beams of metastable species. Such beam sources are necessary for the microelectronics and plasma processing industries because they would provide a valuable tool required to establish a solid database of plasma-related collision processes. This improved and e ...
SBIR Phase I 1997 Department of Commerce