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Award Data

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The Award database is continually updated throughout the year. As a result, data for FY22 is not expected to be complete until September, 2023.

Download all SBIR.gov award data either with award abstracts (290MB) or without award abstracts (65MB). A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.

  1. SIMULTANEOUS MEASUREMENT OF TWO ARBITRARY ULTRASHORT LASER PULSES USING DOUBLE-BLIND FREQUENCY-RESOLVED OPTICAL GATING

    SBC: SOUTHWEST SCIENCES INC            Topic: N/A

    ULTRAFAST LASERS (LASERS THAT GENERATE PULSES WITH DURATIONS OF ~10 PICOSECONDS OR LESS) HAVE A LARGE NUMBER OF APPLICATIONS IN BIOCHEMISTRY, CHEMISTRY, PHYSICS, AND ELECTRICAL ENGINEERING. UNFORTUNATELY, THESE SYSTEMS ARE DIFFICULT TO USE LARGELY BECAUSE ULTRAFAST LASER PULSES ARE EXTREMELY DIFFICULT TO CHARACTERIZE AND FEW TECHNIQUES ARE CURRENTLY AVAILABLE. THOSE THAT ARE AVAILABLE USUALLY AR ...

    SBIR Phase I 1994 National Science Foundation
  2. SBIR Phase I: An Antimonide Laser-Based Formaldehyde Detector for Combustion Emissions Monitoring

    SBC: SOUTHWEST SCIENCES INC            Topic: N/A

    N/A

    SBIR Phase I 1997 National Science Foundation
  3. SBIR Phase I: A Real Time Analyzer for Chlorinated Hydrocarbons

    SBC: SOUTHWEST SCIENCES INC            Topic: N/A

    N/A

    SBIR Phase I 1996 National Science Foundation
  4. SBIR Phase I: Real Time Spectrogram Inversion for UltrashortLaser Pulse Measurement

    SBC: SOUTHWEST SCIENCES INC            Topic: N/A

    N/A

    SBIR Phase I 1997 National Science Foundation
  5. LASER INTERFEROMETRIC TECHNIQUES FOR TEMPERATURE MEASUREMENT

    SBC: GRATINGS INCORPORATED            Topic: N/A

    LASER APPLICATION FOR NONCONTACT TEMPERATURE MEASUREMENT OF A SEMICONDUCTOR WAFER IS BEING DEVELOPED. THE TECHNIQUE CAN BE APPLIED FOR EITHER CHEMICAL VAPOR DEPOSITION (CVD) OR BY RAPID THERMAL PROCESSING (RTP) SYSTEMS. THE METHOD IS BASED ON THERMAL EXPANSION OF A SEMICONDUCTOR WAFER, AND USES SPECKLE PATTERNS GENERATED FROM THE BACK (ROUGH SURFACE) OF THE WAFER. SPECKLE PATTERNS ARE GENERATED ...

    SBIR Phase I 1994 National Science Foundation
  6. SBIR Phase I: Computerized Algal Identification System (CAIS)

    SBC: Phycotech Inc.            Topic: N/A

    N/A

    SBIR Phase I 1997 National Science Foundation
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