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Bottom Anti-Reflective Coatings (BARCs) for 193 nm Lithography

Award Information
Agency: Department of Defense
Branch: Missile Defense Agency
Contract: N/A
Agency Tracking Number: 41232
Amount: $64,767.00
Phase: Phase I
Program: SBIR
Solicitation Topic Code: N/A
Solicitation Number: N/A
Solicitation Year: N/A
Award Year: 1998
Award Start Date (Proposal Award Date): N/A
Award End Date (Contract End Date): N/A
Small Business Information
2401 Brewer Drive, P.O. Box GG, Rolla, MO, 65401
HUBZone Owned: N
Woman Owned: N
Socially and Economically Disadvantaged: N
Principal Investigator
 Jim D. Meador
 (573) 364-0300
Business Contact
Phone: () -
Research Institution
A long-standing trend in the integrated circuit industry is to reduce pattern geometries on semiconductor substrates. To continue this trend, the next exposure wavelength after on-going deep-ultraviolet (248 nm) will be 193 nm. This SBIR Phase I program will identify and develop thermosetting bottom anti-reflective coatings (BARCs) meeting requirements for use with 193 nm unilayer resists. A series of hydroxy-functional, dye-attached polymers designed specifically for 193 nm BARC usage will be synthesized in virtually rote reactions. Subsequent formulation with a thermal crosslinker and catalyst in safe solvent solutions will provide thermosetting products, thus assuring insolubility of the cured film in photoresist solvents. Comparable work has already provided commercial 248 nm BARCs. BARC properties considered necessary for compatibility with unilayer 193 nm resists will be measured. An Olin/Lucent poly(cyclic olefin/maleic anhydride) 193 nm resist, that has already shown considerable promise with one of our thermoset BARCs, will be used for profile studies. A best-case BARC(s) will be selected from this Phase I study for scale-up and commercialization during the Phase II effort.

* Information listed above is at the time of submission. *

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