REAL-TIME X-RAY TOPOGRAPHY OF GAAS AND HGCDTE EPITAXIAL FILMS AND/ORVARIOUS SUBSTRATES

Award Information
Agency: Department of Defense
Branch: Defense Advanced Research Projects Agency
Contract: N/A
Agency Tracking Number: 918
Amount: $200,000.00
Phase: Phase II
Program: SBIR
Awards Year: 1985
Solicitation Year: N/A
Solicitation Topic Code: N/A
Solicitation Number: N/A
Small Business Information
Brimrose Corp. Of America
7527 Belair Road, Baltimore, MD, 21236
DUNS: N/A
HUBZone Owned: N
Woman Owned: N
Socially and Economically Disadvantaged: N
Principal Investigator
 Dr. Ronald G. Rosemeier
 (301) 668-5800
Business Contact
Phone: () -
Research Institution
N/A
Abstract
WITH THE DOD HGCDTE AND GAAS PROGRAMS MOVING TOWARD EPITAXIAL GROWTH TECHNOLOGY THERE IS A NEED TO DEVELOP REAL-TIME MATERIALS CHARACTERIZATION TECHNIQUES OF BOTH SUBSTRATES AND/OR EPITAXIAL FILMS QUICKLY FOR PRODUCTION ENVIRONMENTS. REAL-TIME X-RAY TOPOGRAPHY OF WHICH BRIMROSE IS A PIONEER IS ONE METHOD OF CHARACTERIZING THESE MATERIALS INSTANTLY BEFORE COSTLY PROCESSING IS PERFORMED ON POOR MATERIALS. INITIAL RESEARCH AND DEVELOPMENT EFFORTS WHICH HAVE BEEN INTERNALLY FUNDED AND NAVY FUNDED HAVE SHOWN THAT X-RAY TOPOGRAPHY IS FEASIBLE FOR INVESTIGATING BOTH BAF2 SUBSTRATES AND PB SALT EPITAXIAL FILMS ON 1 X 1 CM2 AREA DEVICES. HOWEVER, THIS TECHNIQUE IS NOT LIMITED TO SUCH SMALL AREA DEVICES. RECENTLY 6 X 6 IN2 CAST SILICON WAFERS HAVE BEEN INVESTIGATED BY REAL-TIME X-RAY TOPOGRAPHY. ALSO, X-RAY TOPO GRAPHY IS A GOOD METHOD OF LOCATING DEFECT AREAS IN BULK EPITAXIAL FILMS AND/OR SUBSTRATES WHICH CAN BE LATER INVESTIGATED BY HIGH RESOLUTION TEM AND EBIC TECHNIQUES.

* information listed above is at the time of submission.

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