Configurable Dynamic Strain System

Award Information
Agency:
Department of Defense
Branch
Air Force
Amount:
$99,958.00
Award Year:
2007
Program:
SBIR
Phase:
Phase I
Contract:
FA9101-07-M-0016
Award Id:
82321
Agency Tracking Number:
F071-344-0446
Solicitation Year:
n/a
Solicitation Topic Code:
n/a
Solicitation Number:
n/a
Small Business Information
3100 Fresh Way SW, Huntsville, AL, 35805
Hubzone Owned:
N
Minority Owned:
N
Woman Owned:
N
Duns:
124289294
Principal Investigator:
Alton Reich
Project Manager / Partner
(256) 713-1220
Alton.Reich@StreamlineAutomation.biz
Business Contact:
Alton Reich
Project Manager / Partner
(256) 713-1220
Alton.Reich@StreamlineAutomation.biz
Research Institution:
n/a
Abstract
The AEDC Engine Test Facility (ETF) has more than 20 test cells that can be used for testing prototype propulsion systems and components. The testing of propulsion systems requires significant data acquisition capabilities, with one test utilizing more than 4200 channels of instrumentation, including 200 dynamic strain gages. In response to the shear set-up challenge, AEDC has developed the concept of Snap-In/Snap-Out sensors - in which each sensor is close-coupled to electronics sufficient to control the sensor and convert analog output to digital data that is transmitted over a network for recording and processing. This concept closely mirrors that of smart transducers described in IEEE standard 1451 that defines the Smart Transducer Interface Module that interacts with a sensor, contains a Transducer Electronic Data Sheet with information required to convert raw output into engineering units, and that communicates with a Network Capable Application Processor that transmits collected data over a conventional network. This project will focus on demonstrating the feasibility of developing a smart strain gage that will provide plug-and-play functionality, enable strain gages to be mounted on an engine prior to shipping to AEDC, and significantly reduce the amount of wiring required in the test cell with attendant reductions in test preparation time.

* information listed above is at the time of submission.

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