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High Density Semi-Auto Closed Cycle Cryoprober

Award Information
Agency: Department of Commerce
Branch: National Institute of Standards and Technology
Contract: 70NANB16H180
Agency Tracking Number: 048.01.04 (2016)
Amount: $99,978.98
Phase: Phase I
Program: SBIR
Solicitation Topic Code: 9.01.04
Solicitation Number: 2016-NIST-SBIR-01
Solicitation Year: 2016
Award Year: 2016
Award Start Date (Proposal Award Date): 2016-08-01
Award End Date (Contract End Date): 2017-01-31
Small Business Information
1750 Kraft Drive, Suite 1007
Blacksburg, VA 24060-6375
United States
DUNS: 962366758
HUBZone Owned: No
Woman Owned: No
Socially and Economically Disadvantaged: No
Principal Investigator
 Vladimir Kochergin
 (540) 394-4040
Business Contact
 Elena Kochergina
Phone: (540) 394-4040
Research Institution

High density wafer scale cryogenic probing solution for testing at 4.5K temperatures or below is needed for testing and characterization of devices and circuits employing superconducting electronic components (such as used for quantum processing, high speed classical processing, magnetic field sensors, etc.) as well as for testing of various particle and light detectors for astronomy, aerospace, defense and homeland security applications. MicroXact Inc. will develop a semi-automated, closed cycle, wafer scale high density cryogenic probe station for testing at below 4.5K to 300K or higher. In Phase I MicroXact will finalize the performance specifications, will develop mechanical model and design, and will verify system performance via simulations.

* Information listed above is at the time of submission. *

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