High Density Semi-Auto Closed Cycle Cryoprober

High density wafer scale cryogenic probing solution for testing at 4.5K temperatures or below is needed for testing and characterization of devices and circuits employing superconducting electronic components (such as used for quantum processing, high speed classical processing, magnetic field sensors, etc.) as well as for testing of various particle and light detectors for astronomy, aerospace, defense and homeland security applications. MicroXact Inc. will develop a semi-automated, closed cycle, wafer scale high density cryogenic probe station for testing at below 4.5K to 300K or higher. In Phase I MicroXact will finalize the performance specifications, will develop mechanical model and design, and will verify system performance via simulations.